Journals in Electrical and electronic engineering

Image and Vision Computing

ISSN: 0262-8856
5 Year impact factor: 4.3
Impact factor: 4.2

Image and Vision Computing has as a primary aim the provision of an effective medium of interchange for the results of high quality theoretical and applied research fundamental to all aspects of image interpretation and computer vision. The journal publishes work that proposes new image interpretation and computer vision methodology or addresses the application of such methods to real world scenes. It seeks to strengthen a deeper understanding in the discipline by encouraging the quantitative comparison and performance evaluation of the proposed methodology. The coverage includes: image interpretation, scene modelling, object recognition and tracking, shape analysis, monitoring and surveillance, active vision and robotic systems, SLAM, biologically-inspire... computer vision, motion analysis, stereo vision, document image understanding, character and handwritten text recognition, face and gesture recognition, biometrics, vision-based human-computer interaction, human activity and behavior understanding, data fusion from multiple sensor inputs, image databases.In addition to regular manuscripts, Image and Vision Computing Journal solicits manuscripts for the Opinions Column, aimed at initiating a free forum for vision researchers to express their opinions on past, current, or future successes and challenges in research and the community.An opinion paper should be succinct and focused on a particular topic. Addressing multiple related topics is also possible if this helps making the point. While posing questions helps raising awareness about certain issues, ideally, an opinion paper should also suggest a concrete direction how to address the issues. Topics of interest include, but are not limited to:Comments on success and challenges in a (sub-) field of computer vision,Remarks on new frontiers in computer visionObservations on current practices and trends in research, and suggestions for overcoming unsatisfying aspectsObservations on current practices and trends in the community regarding, e.g., reviewing process, organizing conferences, how journals are run, and suggestions for overcoming unsatisfying aspectsReviews of early seminal work that may have fallen out of fashionSummaries of the evolution of one's line of researchRecommendati... for educating new generations of vision researchers.The format of an opinion paper should comply with the existing formatting guidelines for the Image and Vision Computing Journal submissions, and should not exceed 2 pages.Months of publication: January/February, March, April, May, June, July/August, September, October, November and December.

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Information Sciences

ISSN: 0020-0255

Informatics and Computer Science Intelligent Systems Applications An International JournalInformation Sciences will publish original, innovative and creative research results. A smaller number of timely tutorial and surveying contributions will be published from time to time.The journal is designed to serve researchers, developers, managers, strategic planners, graduate students and others interested in state-of-the art research activities in information, knowledge engineering and intelligent systems. Readers are assumed to have a common interest in information science, but with diverse backgrounds in fields such as engineering, mathematics, statistics, physics, computer science, cell biology, molecular biology, management science, cognitive science, neurobiology, behavioural sciences and biochemistry.The journal publishes high-quality, refereed articles. It emphasizes a balanced coverage of both theory and practice. It fully acknowledges and vividly promotes a breadth of the discipline of Informations Sciences.Topics include:Foundations of Information Science: Information Theory, Mathematical Linguistics, Automata Theory, Cognitive Science, Theories of Qualitative Behaviour, Artificial Intelligence, Computational Intelligence, Soft Computing, Semiotics, Computational Biology and Bio-informatics.Impl... and Information Technology: Intelligent Systems, Genetic Algorithms and Modelling, Fuzzy Logic and Approximate Reasoning, Artificial Neural Networks, Expert and Decision Support Systems, Learning and Evolutionary Computing, Expert and Decision Support Systems, Learning and Evolutionary Computing, Biometrics, Moleculoid Nanocomputing, Self-adaptation and Self-organisational Systems, Data Engineering, Data Fusion, Information and Knowledge, Adaptive ad Supervisory Control, Discrete Event Systems, Symbolic / Numeric and Statistical Techniques, Perceptions and Pattern Recognition, Design of Algorithms, Software Design, Computer Systems and Architecture Evaluations and Tools, Human-Computer Interface, Computer Communication Networks and Modelling and Computing with WordsApplications: Manufacturing, Automation and Mobile Robots, Virtual Reality, Image Processing and Computer Vision Systems, Photonics Networks, Genomics and Bioinformatics, Brain Mapping, Language and Search Engine Design, User-friendly Man Machine Interface, Data Compression and Text Abstraction and Summarization, Virtual Reality, Finance and Economics Modelling and OptimisationExecutiv... Editors-in-Chief can be reached at the following: Prof. Dr. Tofigh TA Allahviranloo- tofigh.allahviranloo... Dr. Radu-Emil R.-E. Precup- [email protected].... Sabrina S. Senatore- [email protected]... Zheng Z. Yan- [email protected]...

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Integration

ISSN: 0167-9260
5 Year impact factor: 1.6
Impact factor: 2.2

the VLSI JournalIntegration's aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

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Journal of Electrostatics

ISSN: 0304-3886
5 Year impact factor: 1.9
Impact factor: 1.9

Fundamentals, Applications and HazardsThe Journal of Electrostatics is the leading forum for publishing research findings that advance knowledge in the fundamental science and engineering of electrostatics. We invite submissions in the following areas:Electrostatic charge separation processes: Fundamental science and engineering behind how materials (solid or liquid) accumulate electrostatic charge, by triboelectric, induction, conduction, corona and electrical double layer charging, or other mechanisms. Electrostatic charge dissipation and neutralization. Electrets. Methods to control charging and electrostatic hazards. Static measurement techniques (charge, surface potential, electric field). Triboelectric nanogenerators and energy harvesters.Electrost... manipulation of particles, droplets, and biological cells: Electrostatic forces on particles, including electrophoresis, dielectrophoresis and electrorotation. Applications, including electrostatic precipitators, separators, coating processes, and electrophotography. Electrostatic issues in fluidized beds and other solids handling processes. Biological/medical applications including control of biological cells and pharmaceutical powders. Coupled problems (thermal, flow, stress) with essential contribution of electrostatic phenomena.Electrosta... driven or controlled fluid flow: Corona generated secondary electrohydrodynamic flow. Boundary layer control. Electrohydrodynamic pumping. Electro-rheology. Electrospinning and electrospraying. DC and AC Electroosmosis. Electrowetting. Applications including materials processing, thermal management, and flow control.Electrostati... in the gas phase: Fundamental science of plasmas. Corona and dielectric barrier discharges. Electrical breakdown. Applications of plasma technologies, including environmental remediation of gas and liquid streams. Electrostatic discharges from charged surfaces - fundamentals, prevention, safety issues. Electrostatic phenomena in atmospheres.

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Measurement

ISSN: 0263-2241
5 Year impact factor: 4.8
Impact factor: 5.2

Journal of the International Measurement Confederation (IMEKO)Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material representing achievements in the field, whose ultimate goal is an enhancement of the state-of-the-art of subjects such as: measurement and metrology fundamentals, measurement science, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures for performance analysis of measurement systems, processes and algorithms, mathematical models for measurement-oriented purposes, and distributed measurement systems in a connected world.Notes:Papers including measurement results that, although important to validate any given scientific study but which offer no new insights in an area different from measurement science or technology, do not fall within the scope of this journal;The disciplined usage of well-known metrological terms is strongly required. Authors can access information on all relevant terms such as measurement accuracy, uncertainty, the law of propagation of uncertainty and other, similar terms: these are defined in internationally approved guidelines such as the International Vocabulary of Metrology (VIM) and Guide to the Expression of Uncertainty in Measurement (GUM), which are freely available on https://www.bipm.org... paper must clearly describe the measurement context in which the research was carried out by undertaking a critical review of the state-of-the-art of the relevant body of knowledge in instrumentation and measurement and by showing how the research presented advances it;The letter accompanying the submission must describe clearly how the paper satisfies the above requirements.Papers that focus on image processing or fault diagnosis with little or no elements of measurement science or technology will not be considered within the journal scope.Authors please note: The journal Measurement is receiving an increasing number of papers in the area of machine learning/neural networks and other techniques based on artificial intelligence. These submissions will be desk rejected unless they:prove that the described research advances the state-of-the-art in measurement science and is not just an application of an available tool to known or novel problems, that is used without an appreciation of measurement-related aspects;show that the usage of these tools is put into the correct measurement-related context and not just in the context of machine-learning/neu... network applications;contain enough information about the used tools, data, and results to allow, in principle, anyone to replicate the described results;display the use of specific metrics to strengthen the results of research activities.It must be recalled that Measurement is interested in publishing new methods, techniques, procedures, algorithms, and alike that show how to better measure in nature and in the world. Thus, the capability to describe metrological-related details of the proposed research represents a major difference between papers published by this journal and by other journals publishing papers on similar topics. This major difference must be evident also in papers covering applications of machine learning and soft computing techniques. Failing to adhere to these guidelines will result in a paper desk-reject decision.Authors whose manuscripts focus on the research, development and application of the science, engineering and technology of sensors and sensor systems, are welcome to submit to the journal's open access companion title, Measurement: Sensors .Authors whose manuscripts focus on food and nutrition measurements may also wish to submit to the journal's second open access companion title, Measurement: Food.Authors whose manuscripts focus on energy sources, heat and power generation and all other relevant fields may be interested to submit to the journal's third open access companion title, Measurement: Energy.

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Micro and Nanostructures

ISSN: 0749-6036
5 Year impact factor: 2.7
Impact factor: 2.7

Formerly known as Superlattices and Microstructures, with a 2022 IF of 3.1.Micro and Nanostructures is a journal disseminating the science and technology of micro-structures and nano-structures in materials and their devices, including individual and collective use of semiconductors, metals and insulators for the exploitation of their unique properties. The journal hosts papers dealing with fundamental and applied experimental research as well as theoretical studies. Fields of interest, including emerging ones, cover: • Novel micro and nanostructures • Nanomaterials (nanowires, nanodots, 2D materials ) and devices • Synthetic heterostructures • Plasmonics • Micro and nano-defects in materials (semiconductor, metal and insulators) • Surfaces and interfaces of thin filmsIn addition to Research Papers, the journal aims at publishing Topical Reviews providing insights into rapidly evolving or more mature fields. Written by leading researchers in their respective fields, those articles are commissioned by the Editorial Board.

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Micro and Nanostructures

ISSN: 2773-0123
5 Year impact factor: 2.7
Impact factor: 2.7

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Microelectronic Engineering

ISSN: 0167-9317
5 Year impact factor: 2.5
Impact factor: 2.6

Nanotechnology and Processing — Electronics, photonics, MEMS and Life Sciences Affiliated with iMNEsMicroelectronic Engineering is the premier journal focused on the fabrication and characterization of micro/nano-electroni... materials, devices and circuits (including novel electronic nanomaterials), as well as the understanding of their working mechanisms, performance, yield, variability, stability, and reliability. The journal also focuses on the techniques that make possible the fabrication and characterization of such devices and circuits, and on the materials involved in them. Occasionally, outstanding papers on simulation of materials properties, device figures-of-merit or compact modeling of circuits and systems may be accepted. The following topics are of special interest:DevicesPhot... and optoelectronic devices (including, sensors, actuators, phototransistors)Tra... (including ultra-scaled, thin film, organic, ferroelectric)Resist... switching devices (memristors, RRAM, PCRAM, FeRAM, MRAM)Magnetic and spintronic devicesMEMS and NEMS (including power, RF, magnetic, organic)Flexible electronic devices (including wearable, printed, paper)Devices for energy harvesting (piezoelectric, flexoelectric, photovoltaic, solar cells)Bioelectronic devices (molecular detection, biomimetic, diagnosis)Device-lev... simulations (including variability and reliability)Material... bandgap semiconductorsDielec... (low K and high K)Two-dimensional (2D) Materials and related transferring techniquesNanotubes, nanowires, and other nanomaterials and nanostrctures for device fabricationInterconn... metallization and barrier materialsNew Resist MaterialsSilicon on insulatorsPolymers and flexible substrates, including biocompatible materialsAtomistic simulations of materials propertiesFabricatio... and characterization processesThin films deposition techniques (CVD, ALD, evaporation, sputtering, MBE, plasma)Lithography (including optical, EUV, electron beam, nanoimpring, particle-assisted, mask less, X-ray optical methods, emerging methods and limits, as well as resists)Pattern transfer (including ion, plasma and wet transfer, as well as transfer of 2D materials)Integratio... processes (including inkjet printing, 3D printing, 3D integration)Top-down and bottom-up self-assembly processesAnnealing and its effect in the materials (including crystallization, wrinkling, de-wetting)Nanometro... (TEM, SEM, EDX, EELS, STM, AFM and related setups)Circuits and applicationsSensing and actuation, including bio-compatible applicationsSignal souring and transferLogic operations and data processingElectronic memories and information storageArtificial neural networks and neuromorphic computingCompact modeling of electronic circuitsQuantum computingFive different types of articles are considered:Research articles that report regular original research that produces significant advancement.Accelera... Publications (Letters) that feature exciting research breakthroughs.Review Articles that inform readers of the latest research and advances in a topic within the broad field of microelectronic engineering. This includes roadmaps and guides proposing the recommended methods in a specific field.Short / Technical notes intended for original limited investigations or short description of original industrial or industrially-related research and development workNews and Opinions that comment on topical issues or express views on the developments in related fields, or comment on previously published work

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Microelectronics Journal

ISSN: 0026-2692
5 Year impact factor: 1.7
Impact factor: 1.9

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers microelectronics device, circuits and systems. This topic includes but is not limited to• Analog, digital, mixed, and RF integrated circuits and related design methodologies • Semiconductor memory, such as RRAM, MRAM, FLASH, PCRAM , etc • Microelectronic devices , modeling and device physics • Semiconductor optoelectronic devices and integrated technology • Wide band gap semiconductor materials, devices and circuits • TSV, TGV, 3D-ICs, SIP and related technology • Integrated circuit design automation technology ( EDA ) • SOC, NoC design, analysis and test • Artificial intelligence integrated circuits and design methodology • Testing, design for testability (DFT), built-in self-test for integrated circuits • Integrated circuit hardware security • Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, TFET, NC-FET ,etc.Benefits to authors We provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications, and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or assistance, see our support pages at https://service.else...

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Microelectronics Journal

ISSN: 1879-2391
5 Year impact factor: 1.7
Impact factor: 1.9

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Journals in Electrical and electronic engineering

Image and Vision Computing

Information Sciences

Integration

Journal of Electrostatics

Measurement

Micro and Nanostructures

Micro and Nanostructures

Microelectronic Engineering

Microelectronics Journal

Microelectronics Journal

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