Books in Electromagnetics signal processing and communications

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Magnetoelectric Composites

• 2nd Edition
• March 1, 2025
• Gopalan Srinivasan + 2 more
• English
• Paperback 978-0-443-18606-6

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• eBook 978-0-443-18607-3

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Magnetoelectric Composites: Materials, Devices and Applications, Second Edition gives readers a summary of the theory behind magnetoelectric phenomena, later introducing magnetoelectric materials and structures and the techniques used to fabricate and characterize them. Part two of the book looks at magnetoelectric devices. Applications include magnetoelectric sensors, magnetoelectric antennas, transducers for energy harvesting, microwave and millimeter wave devices, miniature magnetoelectric systems for biomedical applications. Final sections discuss progress towards magnetoelectric memory.This second edition is updated on the first edition published in 2015, with a timely and significant update and expansion on the contents from the first edition. This new edition starts with the phenomenon and theory of magnetoelectrics, materials in bulk laminates, thin film heterostructures, and nanocomposites.

Nanolithography and Surface Microscopy with Electron Beams

• 1st Edition
• Volume 231
• November 1, 2024
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-31462-9

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• eBook 978-0-443-31463-6

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Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Coulomb Interactions in Particle Beams

• 1st Edition
• Volume 230
• October 5, 2024
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-29784-7

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• eBook 978-0-443-29785-4

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Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Optics of Charged Particle Analyzers: Part 1

• 1st Edition
• Volume 232
• October 1, 2024
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-29786-1

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• eBook 978-0-443-29787-8

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Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Advances in Imaging and Electron Physics

• 1st Edition
• Volume 229
• March 29, 2024
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-29648-2

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• eBook 978-0-443-29649-9

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Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Multi-Dimensional Imaging with Synthetic Aperture Radar

• 1st Edition
• January 31, 2024
• Gianfranco Fornaro + 4 more
• English
• Paperback 978-0-12-821655-2

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• eBook 978-0-12-821657-6

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Multi-Dimensional Imaging with Synthetic Aperture Radar: Theory and Applications provides a complete description of principles, models and data processing methods, giving an introduction to the theory that underlies recent applications such as topographic mapping and natural risk situational awareness – seismic-tectonics, active volcano, landslides and subsidence monitoring - security, urban, wide area and infrastructure control. Imaging radars, specifically Synthetic Aperture Radar (SAR), generally mounted onboard satellites or airplanes, are able to provide systematic high-resolution imaging of the Earth's surface. Recent advances in the field has seen applications to natural risk monitoring and security and has driven the development of many operational systems.

The Properties of Ponderomotive Lenses

• 1st Edition
• Volume 228
• October 6, 2023
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-19322-4

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• eBook 978-0-443-19323-1

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The Properties of Ponderomotive Lenses, Volume 228 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

• 1st Edition
• Volume 227
• August 15, 2023
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-19324-8

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• eBook 978-0-443-19325-5

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Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Aberration Theory in Electron and Ion Optics

• 1st Edition
• Volume 226
• June 2, 2023
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-19320-0

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• eBook 978-0-443-19321-7

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Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

• 1st Edition
• Volume 225
• March 27, 2023
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-19326-2

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• eBook 978-0-443-19327-9

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Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.