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Elsevier

Books in Electromagnetics signal processing and communications

  • Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques

    • 1st Edition
    • Volume 240
    • English
    Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques, Volume 240 in the Advances in Imaging and Electron Physics series, continues the tradition of this long-standing publication in presenting authoritative reviews and advances in imaging science and electron physics. The series merges two influential serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy—and covers topics spanning electron device physics, particle optics, microlithography, image science, digital image processing, electromagnetic wave propagation, and electron microscopy.This volume focuses on the development and applications of the Sparse-Dirac super-resolution (S-Dirac SR) method for high-resolution transmission electron microscopy (HRTEM). Chapters present the historical context and motivations behind the method, followed by discussions of its physical principles, mathematical framework, and algorithmic implementation. Additional sections compare the S-Dirac approach with other state-of-the-art techniques and explore its practical applications in high-resolution electron microscopy. The volume concludes with perspectives on future developments and potential directions in super-resolution imaging methods.

  • Photonics

    An Electromagnetic Approach
    • 1st Edition
    • Chang-Hee Lee
    • English
    Photonics: An Electromagnetic Approach introduces students to the field by means of a comprehensive integration of diverse explanations within a unified framework rooted in electromagnetic theory. This framework is designed to meet the needs of undergraduate (junior or senior) and graduate students while also providing researchers with a moderately detailed description. The book strives to cover underlying physical photonics principles rather than focusing on actual devices and systems. It starts with the underlying physics in Maxwell’s equations. Many important features in photonics are covered as solutions of linear Maxwell’s equations, including reflection, refraction, interference, radiation, diffraction, optical waveguide, optical resonator, etc.Ray optics are introduced by considering the dimensionality of the interesting region. Resonant interactions between electromagnetic fields and media, including semiconductors, are explained classically or semi classically. Various dynamic characteristics of lasers are also discussed, and noise mechanisms in the detection and generation processes of optical radiation are explained in detail. Finally, fundamentals for nonlinear optical phenomena are explained by solving nonlinear wave equations, both for elastic and inelastic nonlinearities.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 237
    • English
    Advances in Imaging and Electron Physics, Volume 237 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release include Stochastic geometry with applications in materials science, Morphological models of random media, Grain models and application to microstructure simulation, MCMC algorithms for model parameterization, Tessellations models, Tesselation models, Fast simulation of tessellation models using Eikonal equation, Applications to Image Processing, Synthesis of Training Images for Supervised Learning Problems, and Segmentation Methods Based on the Eikonal Equation.

  • Applied Charged Particle Optics: Part I

    • 1st Edition
    • Volume 238
    • English
    Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 236
    • English
    Advances in Imaging and Electron Physics, Volume 236 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 235
    • English
    Advances in Imaging and Electron Physics, Volume 235 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology.

  • Magnetoelectric Composites

    Materials, Structures, and Applications
    • 2nd Edition
    • Gopalan Srinivasan + 2 more
    • English
    Magnetoelectric Composites: Materials, Structures, and Applications, Second Edition summarizes the theory behind magnetoelectric phenomena and then introduces magnetoelectric materials and structures and the techniques used to fabricate and characterize them. Part two of the book looks at magnetoelectric devices: applications covered include magnetoelectric sensors, magnetoelectric antennas, transducers for energy harvesting, microwave and millimetre wave devices, and miniature magnetoelectric systems for biomedical applications. The final chapter discusses progress toward magnetoelectric memory.This new edition starts with the phenomena and theory of magnetoelectric materials in bulk laminates, thin-film heterostructures, and nanocomposites. On the magnetoelectric devices side, the contents have been significantly expanded to include energy harvesting, sensing, and magnetoelectric antennas. This book is suitable for materials scientists and engineers working on magnetoelectrics in academia and R&D.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 234
    • English
    Advances in Imaging and Electron Physics, Volume 234 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology, and Artificial Intelligence and Deep Learning in Electron Microscopy.

  • Machine Learning

    From the Classics to Deep Networks, Transformers, and Diffusion Models
    • 3rd Edition
    • Sergios Theodoridis
    • English
    Machine Learning: From the Classics to Deep Networks, Transformers and Diffusion Models, Third Edition starts with the basics, including least squares regression and maximum likelihood methods, Bayesian decision theory, logistic regression, and decision trees. It then progresses to more recent techniques, covering sparse modelling methods, learning in reproducing kernel Hilbert spaces and support vector machines. Bayesian learning is treated in detail with emphasis on the EM algorithm and its approximate variational versions with a focus on mixture modelling, regression and classification. Nonparametric Bayesian learning, including Gaussian, Chinese restaurant, and Indian buffet processes are also presented. Monte Carlo methods, particle filtering, probabilistic graphical models with emphasis on Bayesian networks and hidden Markov models are treated in detail. Dimensionality reduction and latent variables modelling are considered in depth. Neural networks and deep learning are thoroughly presented, starting from the perceptron rule and multilayer perceptrons and moving on to convolutional and recurrent neural networks, adversarial learning, capsule networks, deep belief networks, GANs, and VAEs. The book also covers the fundamentals on statistical parameter estimation and optimization algorithms.Focusing on the physical reasoning behind the mathematics, without sacrificing rigor, all methods and techniques are explained in depth, supported by examples and problems, providing an invaluable resource to the student and researcher for understanding and applying machine learning concepts.

  • Advances in Optics of Charged Particle Analyzers: Part 1

    • 1st Edition
    • Volume 232
    • English
    Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

  • Nanolithography and Surface Microscopy with Electron Beams

    • 1st Edition
    • Volume 231
    • English
    Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

  • Coulomb Interactions in Particle Beams

    • 1st Edition
    • Volume 230
    • Guus Jansen
    • English
    Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 229
    • English
    Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Multi-Dimensional Imaging with Synthetic Aperture Radar

    • 1st Edition
    • Gianfranco Fornaro + 4 more
    • English
    Multi-Dimensional Imaging with Synthetic Aperture Radar: Theory and Applications provides a complete description of principles, models and data processing methods, giving an introduction to the theory that underlies recent applications such as topographic mapping and natural risk situational awareness – seismic-tectonics, active volcano, landslides and subsidence monitoring - security, urban, wide area and infrastructure control. Imaging radars, specifically Synthetic Aperture Radar (SAR), generally mounted onboard satellites or airplanes, are able to provide systematic high-resolution imaging of the Earth's surface. Recent advances in the field has seen applications to natural risk monitoring and security and has driven the development of many operational systems.

  • The Properties of Ponderomotive Lenses

    • 1st Edition
    • Volume 228
    • Peter W. Hawkes + 1 more
    • English
    The Properties of Ponderomotive Lenses, Volume 228 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Aberration Theory in Electron and Ion Optics

    • 1st Edition
    • Volume 226
    • Peter W. Hawkes + 1 more
    • English
    Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Acoustic Emission Signal Analysis and Damage Mode Identification of Composite Wind Turbine Blades

    • 1st Edition
    • Pengfei Liu
    • English
    Acoustic Emission Signal Analysis and Damage Mode Identification of Composite Wind Turbine Blades covers both the underlying theory and various techniques for effective structural monitoring of composite wind turbine blades via acoustic emission signal analysis, helping readers solve critical problems such as noise elimination, defect detection, damage mode identification, and more. Author Pengfei Liu introduces techniques for identifying and analyzing progressive failure under tension, delamination, damage localization, adhesive composite joint failure, and other degradation phenomena, outlining methods such as time-difference, wavelet, machine learning, and more including combined methods. The disadvantages and advantages of using each method are covered as are techniques for different blade-lengths and various blade substructures. Piezoelectric sensors are discussed as is experimental analysis of damage source localization. The book also takes great lengths to let readers know when techniques and concepts discussed can be applied to composite materials and structures beyond just wind turbine blades.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 225
    • Peter W. Hawkes + 1 more
    • English
    Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Quadrupoles in Electron Lens Design

    • 1st Edition
    • Volume 224
    • Martin Hÿtch + 1 more
    • English
    Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 223
    • Martin Hÿtch + 1 more
    • English
    Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

  • Dimensions of Uncertainty in Communication Engineering

    • 1st Edition
    • Ezio Biglieri
    • English
    Dimensions of Uncertainty in Communication Engineering is a comprehensive and self-contained introduction to the problems of nonaleatory uncertainty and the mathematical tools needed to solve them. The book gathers together tools derived from statistics, information theory, moment theory, interval analysis and probability boxes, dependence bounds, nonadditive measures, and Dempster–Shafer theory. While the book is mainly devoted to communication engineering, the techniques described are also of interest to other application areas, and commonalities to these are often alluded to through a number of references to books and research papers. This is an ideal supplementary book for courses in wireless communications, providing techniques for addressing epistemic uncertainty, as well as an important resource for researchers and industry engineers. Students and researchers in other fields such as statistics, financial mathematics, and transport theory will gain an overview and understanding on these methods relevant to their field.

  • Plasmon Coupling Physics

    • 1st Edition
    • Volume 222
    • Martin Hÿtch + 1 more
    • English
    Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies, Volume 222 in the Advances in Imaging and Electron Physics serial, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.

  • The Beginnings of Electron Microscopy - Part 2

    • 1st Edition
    • Volume 221
    • Peter W. Hawkes + 1 more
    • English
    The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917–1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.

  • Intelligent Sensing and Communications for Internet of Everything

    • 1st Edition
    • Zhengyu Zhu + 2 more
    • English
    Intelligent Sensing and Communications for Internet of Everything introduces three application scenarios of enhanced mobile broadband (eMBB), large-scale machine connection (mMTC) and ultra reliable low latency communication (URLLC). A new communication model, namely backscatter communication (BackCom), intelligent reflector surface (IRS) and unmanned aerial vehicle (UAV) technology in Internet of Everything (IoE), is described in detail. Also focusing on millimeter wave, the book discusses the potential application of terahertz 6G network spectrum in the Internet of Things (IoT). Finally, the applications of IoE network in big data, artificial intelligence (AI) technology and fog/edge computing technology are proposed.

  • Optical Communications in the 5G Era

    • 1st Edition
    • Xiang Liu
    • English
    Optical Communications in the 5G Era provides an up-to-date overview of the emerging optical communication technologies for 5G next-generation wireless networks. It outlines the emerging applications of optical networks in future wireless networks, state-of-the-art optical communication technologies, and explores new R&D opportunities in the field of converged fixed-mobile networks.Optical Communications in the 5G Era is an ideal reference for university researchers, graduate students, and industry R&D engineers in optical communications, photonics, and mobile and wireless communications who need a broad and deep understanding of modern optical communication technologies, systems, and networks that are fundamental to 5G and beyond.

  • The Beginnings of Electron Microscopy - Part 1

    • 1st Edition
    • Volume 220
    • Peter W. Hawkes + 1 more
    • English
    The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 219
    • English
    Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 218
    • English
    Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.

  • Quantitative Atomic-Resolution Electron Microscopy

    • 1st Edition
    • Volume 217
    • English
    Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.

  • Morphological Image Operators

    • 1st Edition
    • Volume 216
    • English
    Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 215
    • English
    Advances in Imaging and Electron Physics, Volume 215, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    Computer Techniques for Image Processing in Electron Microscopy
    • 1st Edition
    • Volume 214
    • English
    Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 213
    • English
    Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • LPWAN Technologies for IoT and M2M Applications

    • 1st Edition
    • Bharat S Chaudhari + 1 more
    • English
    Low power wide area network (LPWAN) is a promising solution for long range and low power Internet of Things (IoT) and machine to machine (M2M) communication applications. The LPWANs are resource-constrained networks and have critical requirements for long battery life, extended coverage, high scalability, and low device and deployment costs. There are several design and deployment challenges such as media access control, spectrum management, link optimization and adaptability, energy harvesting, duty cycle restrictions, coexistence and interference, interoperability and heterogeneity, security and privacy, and others.LPWAN Technologies for IoT and M2M Applications is intended to provide a one-stop solution for study of LPWAN technologies as it covers a broad range of topics and multidisciplinary aspects of LPWAN and IoT. Primarily, the book focuses on design requirements and constraints, channel access, spectrum management, coexistence and interference issues, energy efficiency, technology candidates, use cases of different applications in smart city, healthcare, and transportation systems, security issues, hardware/software platforms, challenges, and future directions.

  • Electronics and Communications for Scientists and Engineers

    • 2nd Edition
    • Martin Plonus
    • English
    Electronics and Communications for Scientists and Engineers, Second Edition, offers a valuable and unique overview on the basics of electronic technology and the internet. Class-tested over many years with students at Northwestern University, this useful text covers the essential electronics and communications topics for students and practitioners in engineering, physics, chemistry, and other applied sciences. It describes the electronic underpinnings of the World Wide Web and explains the basics of digital technology, including computing and communications, circuits, analog and digital electronics, as well as special topics such as operational amplifiers, data compression, ultra high definition TV, artificial intelligence, and quantum computers.

  • Machine Learning

    A Bayesian and Optimization Perspective
    • 2nd Edition
    • Sergios Theodoridis
    • English
    Machine Learning: A Bayesian and Optimization Perspective, 2nd edition, gives a unified perspective on machine learning by covering both pillars of supervised learning, namely regression and classification. The book starts with the basics, including mean square, least squares and maximum likelihood methods, ridge regression, Bayesian decision theory classification, logistic regression, and decision trees. It then progresses to more recent techniques, covering sparse modelling methods, learning in reproducing kernel Hilbert spaces and support vector machines, Bayesian inference with a focus on the EM algorithm and its approximate inference variational versions, Monte Carlo methods, probabilistic graphical models focusing on Bayesian networks, hidden Markov models and particle filtering. Dimensionality reduction and latent variables modelling are also considered in depth. This palette of techniques concludes with an extended chapter on neural networks and deep learning architectures. The book also covers the fundamentals of statistical parameter estimation, Wiener and Kalman filtering, convexity and convex optimization, including a chapter on stochastic approximation and the gradient descent family of algorithms, presenting related online learning techniques as well as concepts and algorithmic versions for distributed optimization. Focusing on the physical reasoning behind the mathematics, without sacrificing rigor, all the various methods and techniques are explained in depth, supported by examples and problems, giving an invaluable resource to the student and researcher for understanding and applying machine learning concepts. Most of the chapters include typical case studies and computer exercises, both in MATLAB and Python. The chapters are written to be as self-contained as possible, making the text suitable for different courses: pattern recognition, statistical/adaptive signal processing, statistical/Bayesian learning, as well as courses on sparse modeling, deep learning, and probabilistic graphical models. New to this edition: Complete re-write of the chapter on Neural Networks and Deep Learning to reflect the latest advances since the 1st edition. The chapter, starting from the basic perceptron and feed-forward neural networks concepts, now presents an in depth treatment of deep networks, including recent optimization algorithms, batch normalization, regularization techniques such as the dropout method, convolutional neural networks, recurrent neural networks, attention mechanisms, adversarial examples and training, capsule networks and generative architectures, such as restricted Boltzman machines (RBMs), variational autoencoders and generative adversarial networks (GANs). Expanded treatment of Bayesian learning to include nonparametric Bayesian methods, with a focus on the Chinese restaurant and the Indian buffet processes.

  • Probabilistic Graphical Models for Computer Vision.

    • 1st Edition
    • Qiang Ji
    • English
    Probabilistic Graphical Models for Computer Vision introduces probabilistic graphical models (PGMs) for computer vision problems and teaches how to develop the PGM model from training data. This book discusses PGMs and their significance in the context of solving computer vision problems, giving the basic concepts, definitions and properties. It also provides a comprehensive introduction to well-established theories for different types of PGMs, including both directed and undirected PGMs, such as Bayesian Networks, Markov Networks and their variants.

  • Advances in Imaging and Electron Physics Including Proceedings CPO-10

    • 1st Edition
    • Volume 212
    • English
    Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 211
    • English
    Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Human Interaction with Electromagnetic Fields

    Computational Models in Dosimetry
    • 1st Edition
    • Dragan Poljak + 1 more
    • English
    Human Interaction with Electromagnetic Fields: Computational Models in Dosimetry presents some highly rigorous and sophisticated integral equation techniques from computational electromagnetics (CEM), along with practical techniques for the calculation and measurement of internal dosimetry. Theory is accompanied by numerical modeling algorithms and illustrative computational examples that range from academic to full real-world scenarios.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 210
    • Peter W. Hawkes
    • English
    Advances in Imaging and Electron Physics, Volume 210, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at high energy losses, Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for use in Electronic Transport Devices, and more.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 209
    • English
    Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Developments and Applications for ECG Signal Processing

    Modeling, Segmentation, and Pattern Recognition
    • 1st Edition
    • Joao Paulo do Vale Madeiro + 3 more
    • English
    Developments and Applications for ECG Signal Processing: Modeling, Segmentation, and Pattern Recognition covers reliable techniques for ECG signal processing and their potential to significantly increase the applicability of ECG use in diagnosis. This book details a wide range of challenges in the processes of acquisition, preprocessing, segmentation, mathematical modelling and pattern recognition in ECG signals, presenting practical and robust solutions based on digital signal processing techniques. Users will find this to be a comprehensive resource that contributes to research on the automatic analysis of ECG signals and extends resources relating to rapid and accurate diagnoses, particularly for long-term signals. Chapters cover classical and modern features surrounding f ECG signals, ECG signal acquisition systems, techniques for noise suppression for ECG signal processing, a delineation of the QRS complex, mathematical modelling of T- and P-waves, and the automatic classification of heartbeats.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 208
    • English
    Advances in Imaging and Electron Physics, Volume 208, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 206
    • English
    Advances in Imaging and Electron Physics, Volume 206, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 205
    • English
    Advances in Imaging and Electron Physics, Volume 205 is the latest release in this series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • TV White Space Communications and Networks

    • 1st Edition
    • Robert Stewart + 2 more
    • English
    TV White Space Communications and Networks summarizes the current state-of-the-art in this important aspect of wireless communication. Part One covers related technologies, while Part Two looks at policy, regulation and standardization issues. Part Three discusses the commercialization and potential applications of white space networks, rounding out a comprehensive book that provides a standard reference for those researching and commercializing white space networks.

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    • 1st Edition
    • Volume 203
    • English
    Advances in Imaging and Electron Physics, Volume 203, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 202
    • English
    Advances in Imaging and Electron Physics, Volume 202, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 201
    • English
    Advances in Imaging and Electron Physics, Volume 201, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.