Books in Electromagnetics signal processing and communications

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Advances in Optics of Charged Particle Analyzers: Part 2

• 1st Edition
• Volume 233
• April 1, 2025
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-31720-0

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• eBook 978-0-443-31721-7

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Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

Magnetoelectric Composites

• 2nd Edition
• March 1, 2025
• Gopalan Srinivasan + 2 more
• English
• Paperback 978-0-443-18606-6

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• eBook 978-0-443-18607-3

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Magnetoelectric Composites: Materials, Structures, and Applications, Second Edition summarizes the theory behind magnetoelectric phenomena and then introduces magnetoelectric materials and structures and the techniques used to fabricate and characterize them. Part two of the book looks at magnetoelectric devices: applications covered include magnetoelectric sensors, magnetoelectric antennas, transducers for energy harvesting, microwave and millimetre wave devices, and miniature magnetoelectric systems for biomedical applications. The final chapter discusses progress toward magnetoelectric memory.This new edition starts with the phenomena and theory of magnetoelectric materials in bulk laminates, thin-film heterostructures, and nanocomposites. On the magnetoelectric devices side, the contents have been significantly expanded to include energy harvesting, sensing, and magnetoelectric antennas. This book is suitable for materials scientists and engineers working on magnetoelectrics in academia and R&D.

Machine Learning

• 3rd Edition
• December 6, 2024
• Sergios Theodoridis
• English
• Paperback 978-0-443-29238-5

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• eBook 978-0-443-29239-2

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Machine Learning: From the Classics to Deep Networks, Transformers and Diffusion Models, Third Edition starts with the basics, including least squares regression and maximum likelihood methods, Bayesian decision theory, logistic regression, and decision trees. It then progresses to more recent techniques, covering sparse modelling methods, learning in reproducing kernel Hilbert spaces and support vector machines. Bayesian learning is treated in detail with emphasis on the EM algorithm and its approximate variational versions with a focus on mixture modelling, regression and classification. Nonparametric Bayesian learning, including Gaussian, Chinese restaurant, and Indian buffet processes are also presented. Monte Carlo methods, particle filtering, probabilistic graphical models with emphasis on Bayesian networks and hidden Markov models are treated in detail. Dimensionality reduction and latent variables modelling are considered in depth. Neural networks and deep learning are thoroughly presented, starting from the perceptron rule and multilayer perceptrons and moving on to convolutional and recurrent neural networks, adversarial learning, capsule networks, deep belief networks, GANs, and VAEs. The book also covers the fundamentals on statistical parameter estimation and optimization algorithms.Focusing on the physical reasoning behind the mathematics, without sacrificing rigor, all methods and techniques are explained in depth, supported by examples and problems, providing an invaluable resource to the student and researcher for understanding and applying machine learning concepts.New to this editionThe new material includes an extended coverage of attention transformers, large language models, self-supervised learning and diffusion models.

Advances in Optics of Charged Particle Analyzers: Part 1

• 1st Edition
• Volume 232
• November 20, 2024
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-29786-1

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• eBook 978-0-443-29787-8

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Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Nanolithography and Surface Microscopy with Electron Beams

• 1st Edition
• Volume 231
• October 25, 2024
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-31462-9

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• eBook 978-0-443-31463-6

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Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Coulomb Interactions in Particle Beams

• 1st Edition
• Volume 230
• October 10, 2024
• Guus Jansen
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-29784-7

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• eBook 978-0-443-29785-4

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Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

• 1st Edition
• Volume 229
• March 29, 2024
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-29648-2

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• eBook 978-0-443-29649-9

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Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Multi-Dimensional Imaging with Synthetic Aperture Radar

• 1st Edition
• January 31, 2024
• Gianfranco Fornaro + 4 more
• English
• Paperback 978-0-12-821655-2

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• eBook 978-0-12-821657-6

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Multi-Dimensional Imaging with Synthetic Aperture Radar: Theory and Applications provides a complete description of principles, models and data processing methods, giving an introduction to the theory that underlies recent applications such as topographic mapping and natural risk situational awareness – seismic-tectonics, active volcano, landslides and subsidence monitoring - security, urban, wide area and infrastructure control. Imaging radars, specifically Synthetic Aperture Radar (SAR), generally mounted onboard satellites or airplanes, are able to provide systematic high-resolution imaging of the Earth's surface. Recent advances in the field has seen applications to natural risk monitoring and security and has driven the development of many operational systems.

The Properties of Ponderomotive Lenses

• 1st Edition
• Volume 228
• October 6, 2023
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-19322-4

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• eBook 978-0-443-19323-1

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The Properties of Ponderomotive Lenses, Volume 228 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

• 1st Edition
• Volume 227
• August 15, 2023
• Peter W. Hawkes + 1 more
• English
• Hardback 978-0-443-19324-8

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• eBook 978-0-443-19325-5

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Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.