Advances in Imaging and Electron Physics
- 1st Edition, Volume 234 - April 26, 2025
- Imprint: Academic Press
- Editors: Peter W. Hawkes, Martin Hÿtch
- Language: English
- Hardback ISBN:9 7 8 - 0 - 4 4 3 - 4 2 8 2 9 - 6
- eBook ISBN:9 7 8 - 0 - 4 4 3 - 4 2 8 3 0 - 2
Advances in Imaging and Electron Physics, Volume 234 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microsc… Read more
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Request a sales quoteAdvances in Imaging and Electron Physics, Volume 234 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology, and Artificial Intelligence and Deep Learning in Electron Microscopy.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy
Physicists, electrical engineers, applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- Cover image
- Title page
- Table of Contents
- Series Page
- Copyright
- Contributors
- Preface
- Chapter One: Artificial intelligence and deep learning in electron microscopy
- Abstract
- 1 Introduction
- 2 Fundamentals
- 3 Applications in the physical sciences
- 4 Applications in the life sciences
- 5 Conclusions and outlook
- References
- Chapter Two: Time-dependent perturbation theory for electron mirrors
- Abstract
- 1 Introduction
- 2 Equation of motion and paraxial rays in the time-dependent formalism for electron mirrors
- 3 Path deviation in the time-dependent theory induced by the perturbation
- 4 The second-rank lateral path deviation and the second-rank aberration coefficients and the chromatic aberrations
- 5 The second-order longitudinal path deviation, the third-order geometrical lateral path deviation, and the third-order geometrical aberration coefficients
- 6 Analytic form and properties of a longitudinal path-deviation of first-rank
- 7 Proof of properties of third-order geometrical off-axis aberration coefficients of time-dependent theory: coma-length and radius, anisotropic part of field curvature, and relation between field curvature and astigmatism
- 8 Transformation of the aberration coefficients, from time-dependent theory to standard electron optics, for a normal lens system
- 9 Aberration coefficients for variation of the voltages and the currents
- 10 Relation among the aberration coefficients for variation of the voltages and the currents and that of chromatic aberration
- 11 Aberration coefficients for an inclined incident beam
- 12 Time-dependent theory in Cartesian coordinate system
- 13 Time-dependent small-angle deflection theory
- 14 Conclusion
- 15 Appendix
- Acknowledgment
- References
- Index
- Edition: 1
- Volume: 234
- Published: April 26, 2025
- No. of pages (Hardback): 296
- No. of pages (eBook): 232
- Imprint: Academic Press
- Language: English
- Hardback ISBN: 9780443428296
- eBook ISBN: 9780443428302
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceMH
Martin Hÿtch
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Affiliations and expertise
Senior Scientist, French National Centre for Research (CNRS), Toulouse, FranceRead Advances in Imaging and Electron Physics on ScienceDirect