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Books in Optics and lasers

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    • Optics and Photonics

      • 1st Edition
      • January 1, 2026
      • Andrew Zhou
      • English
      • Paperback
        9 7 8 0 4 4 3 3 2 9 1 4 2
      • eBook
        9 7 8 0 4 4 3 3 2 9 1 5 9
      Optics and Photonics is a valuable and easy-to-read text on both the fundamentals and applications, including sections on geometrical optics, wave optics, photonics and lasers, optical materials, and real-world photonics applications. Emerging trends and future directions are also discussed. A structured progression is adopted, starting with basic concepts, and building up to more advanced topics involving components and systems. This book also keeps a balance between depth and breadth for such a diversified and large field. This framework is designed to meet the needs of undergraduate and graduate students, while also providing technicians and researchers with a deeper understanding of the principles and application relevant to their work. The solutions to multiple choice reading questions, end of chapter problems and projects are provided for instructors, as well as the PowerPoint presentations, a test bank and a separate lab manual, reinforcing understanding and application.

    • Advances in Imaging and Electron Physics

      • 1st Edition
      • Volume 237
      • April 1, 2026
      • English
      • Hardback
        9 7 8 0 4 4 3 4 7 1 0 8 7
      • eBook
        9 7 8 0 4 4 3 4 7 1 0 9 4
      Advances in Imaging and Electron Physics, Volume 237 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

    • Advances in Optics of Charged Particle Analyzers: Part 2

      • 1st Edition
      • Volume 233
      • February 10, 2025
      • English
      • Hardback
        9 7 8 0 4 4 3 3 1 7 2 0 0
      • eBook
        9 7 8 0 4 4 3 3 1 7 2 1 7
      Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

    • Advances in Imaging and Electron Physics

      • 1st Edition
      • Volume 235
      • August 5, 2025
      • English
      • Hardback
        9 7 8 0 4 4 3 4 2 8 3 1 9
      • eBook
        9 7 8 0 4 4 3 4 2 8 3 2 6
      Advances in Imaging and Electron Physics, Volume 235 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology.

    • Advances in Imaging and Electron Physics

      • 1st Edition
      • Volume 234
      • April 26, 2025
      • English
      • Hardback
        9 7 8 0 4 4 3 4 2 8 2 9 6
      • eBook
        9 7 8 0 4 4 3 4 2 8 3 0 2
      Advances in Imaging and Electron Physics, Volume 234 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology, and Artificial Intelligence and Deep Learning in Electron Microscopy.

    • Advances in Imaging and Electron Physics

      • 1st Edition
      • Volume 236
      • October 1, 2025
      • English
      • Hardback
        9 7 8 0 4 4 3 4 2 8 3 3 3
      • eBook
        9 7 8 0 4 4 3 4 2 8 3 4 0
      Advances in Imaging and Electron Physics, Volume 236 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

    • Advances in Imaging and Electron Physics

      • 1st Edition
      • Volume 229
      • March 29, 2024
      • English
      • Hardback
        9 7 8 0 4 4 3 2 9 6 4 8 2
      • eBook
        9 7 8 0 4 4 3 2 9 6 4 9 9
      Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

    • Nanolithography and Surface Microscopy with Electron Beams

      • 1st Edition
      • Volume 231
      • October 25, 2024
      • English
      • Hardback
        9 7 8 0 4 4 3 3 1 4 6 2 9
      • eBook
        9 7 8 0 4 4 3 3 1 4 6 3 6
      Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

    • Coulomb Interactions in Particle Beams

      • 1st Edition
      • Volume 230
      • October 10, 2024
      • Guus Jansen
      • English
      • Hardback
        9 7 8 0 4 4 3 2 9 7 8 4 7
      • eBook
        9 7 8 0 4 4 3 2 9 7 8 5 4
      Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

    • Advances in Optics of Charged Particle Analyzers: Part 1

      • 1st Edition
      • Volume 232
      • November 20, 2024
      • English
      • Hardback
        9 7 8 0 4 4 3 2 9 7 8 6 1
      • eBook
        9 7 8 0 4 4 3 2 9 7 8 7 8
      Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.