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Books in Optics and lasers

  • Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques

    • 1st Edition
    • Volume 240
    • English
    Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques, Volume 240 in the Advances in Imaging and Electron Physics series, continues the tradition of this long-standing publication in presenting authoritative reviews and advances in imaging science and electron physics. The series merges two influential serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy—and covers topics spanning electron device physics, particle optics, microlithography, image science, digital image processing, electromagnetic wave propagation, and electron microscopy.This volume focuses on the development and applications of the Sparse-Dirac super-resolution (S-Dirac SR) method for high-resolution transmission electron microscopy (HRTEM). Chapters present the historical context and motivations behind the method, followed by discussions of its physical principles, mathematical framework, and algorithmic implementation. Additional sections compare the S-Dirac approach with other state-of-the-art techniques and explore its practical applications in high-resolution electron microscopy. The volume concludes with perspectives on future developments and potential directions in super-resolution imaging methods.

  • Applied charged particle optics

    • 1st Edition
    • Volume 239
    • English
    Advances in Imaging and Electron Physics, Volume 239 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging & Electron Physics

    • 1st Edition
    • Volume 238
    • English
    Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 237
    • English
    Advances in Imaging and Electron Physics, Volume 237 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release include Stochastic geometry with applications in materials science, Morphological models of random media, Grain models and application to microstructure simulation, MCMC algorithms for model parameterization, Tessellations models, Tesselation models, Fast simulation of tessellation models using Eikonal equation, Applications to Image Processing, Synthesis of Training Images for Supervised Learning Problems, and Segmentation Methods Based on the Eikonal Equation.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 236
    • English
    Advances in Imaging and Electron Physics, Volume 236 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 235
    • English
    Advances in Imaging and Electron Physics, Volume 235 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 234
    • English
    Advances in Imaging and Electron Physics, Volume 234 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology, and Artificial Intelligence and Deep Learning in Electron Microscopy.

  • Advances in Optics of Charged Particle Analyzers: Part 1

    • 1st Edition
    • Volume 232
    • English
    Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

  • Nanolithography and Surface Microscopy with Electron Beams

    • 1st Edition
    • Volume 231
    • English
    Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

  • Coulomb Interactions in Particle Beams

    • 1st Edition
    • Volume 230
    • Guus Jansen
    • English
    Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.