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Elsevier

Books in Optics and lasers

  • Tailoring Light Emission with Nanostructured Materials

    • 1st Edition
    • Rehana P. Ummer + 2 more
    • English
    Tailoring Light Emission with Nanostructured Materials provides a comprehensive overview of the latest advances and emerging technologies in the field of nanostructured light emitters, offering insights into potential research directions. It explores the theoretical foundations, experimental techniques, and characterization methods used in the development of novel light emitters in various industries, including electronics, lighting, displays, and medical devices. The book provides up-to-date information on the latest innovations in nanostructured materials for light emitting applications, providing valuable insights into the latest materials, fabrication techniques, and applications that are driving innovation in this sector. It covers a range of applications, from medical devices and environmental sensors to consumer electronics and communication systems, providing practical examples in all cases. Identifying and applying the right light-emitting materials for specific applications across various industries can be challenging, and finding efficient yet cost-effective materials for light emitters is a common concern for researchers and industry professionals. This book addresses both of these challenges in addition to considering the environmental impact of various materials, discussing sustainable alternatives and practices in the development and application of light emitters.

  • Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques

    • 1st Edition
    • Volume 240
    • English
    Sparse-Dirac Super-Resolution (S-Dirac SR) for High-Resolution Transmission Electron Microscopy Techniques, Volume 240 in the Advances in Imaging and Electron Physics series, continues the tradition of this long-standing publication in presenting authoritative reviews and advances in imaging science and electron physics. The series merges two influential serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy—and covers topics spanning electron device physics, particle optics, microlithography, image science, digital image processing, electromagnetic wave propagation, and electron microscopy.This volume focuses on the development and applications of the Sparse-Dirac super-resolution (S-Dirac SR) method for high-resolution transmission electron microscopy (HRTEM). Chapters present the historical context and motivations behind the method, followed by discussions of its physical principles, mathematical framework, and algorithmic implementation. Additional sections compare the S-Dirac approach with other state-of-the-art techniques and explore its practical applications in high-resolution electron microscopy. The volume concludes with perspectives on future developments and potential directions in super-resolution imaging methods.

  • Applied Charged Particle Optics: Part II

    • 1st Edition
    • Volume 239
    • English
    Advances in Imaging and Electron Physics, Volume 239 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 237
    • English
    Advances in Imaging and Electron Physics, Volume 237 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release include Stochastic geometry with applications in materials science, Morphological models of random media, Grain models and application to microstructure simulation, MCMC algorithms for model parameterization, Tessellations models, Tesselation models, Fast simulation of tessellation models using Eikonal equation, Applications to Image Processing, Synthesis of Training Images for Supervised Learning Problems, and Segmentation Methods Based on the Eikonal Equation.

  • Applied Charged Particle Optics: Part I

    • 1st Edition
    • Volume 238
    • English
    Advances in Imaging and Electron Physics, Volume 238 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 236
    • English
    Advances in Imaging and Electron Physics, Volume 236 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 235
    • English
    Advances in Imaging and Electron Physics, Volume 235 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 234
    • English
    Advances in Imaging and Electron Physics, Volume 234 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology, and Artificial Intelligence and Deep Learning in Electron Microscopy.

  • Advances in Optics of Charged Particle Analyzers: Part 1

    • 1st Edition
    • Volume 232
    • English
    Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

  • Nanolithography and Surface Microscopy with Electron Beams

    • 1st Edition
    • Volume 231
    • English
    Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

  • Coulomb Interactions in Particle Beams

    • 1st Edition
    • Volume 230
    • Guus Jansen
    • English
    Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 229
    • English
    Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • The Properties of Ponderomotive Lenses

    • 1st Edition
    • Volume 228
    • Peter W. Hawkes + 1 more
    • English
    The Properties of Ponderomotive Lenses, Volume 228 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

    • 1st Edition
    • Volume 227
    • Peter W. Hawkes + 1 more
    • English
    Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Aberration Theory in Electron and Ion Optics

    • 1st Edition
    • Volume 226
    • Peter W. Hawkes + 1 more
    • English
    Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 225
    • Peter W. Hawkes + 1 more
    • English
    Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Fundamentals of Optical Waveguides

    • 3rd Edition
    • Katsunari Okamoto
    • English
    Now in its Third Edition, Fundamentals of Optical Waveguides continues to be an essential resource for any researcher, professional or student involved in optics and communications engineering. Any reader interested in designing or actively working with optical devices must have a firm grasp of the principles of lightwave propagation. Katsunari Okamoto continues to present this difficult technology clearly and concisely with several illustrations and equations. Optical theory encompassed in this reference includes coupled mode theory, nonlinear optical effects, finite element method, beam propagation method, staircase concatenation method, along with several central theorems and formulas. Silicon photonics devices such as coupled resonator optical waveguides (CROW), lattice-form filters, and AWGs are also fully described. This new edition gives readers not only a thorough understanding the silicon photonics devices for on-chip photonic network, but also the capability to design various kinds of devices.

  • The Beginnings of Electron Microscopy - Part 1

    • 1st Edition
    • Volume 220
    • Peter W. Hawkes + 1 more
    • English
    The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 219
    • English
    Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 218
    • English
    Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.

  • Quantitative Atomic-Resolution Electron Microscopy

    • 1st Edition
    • Volume 217
    • English
    Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.

  • Morphological Image Operators

    • 1st Edition
    • Volume 216
    • English
    Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 215
    • English
    Advances in Imaging and Electron Physics, Volume 215, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    Computer Techniques for Image Processing in Electron Microscopy
    • 1st Edition
    • Volume 214
    • English
    Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.

  • Nonlinear Optics

    • 4th Edition
    • Robert W. Boyd
    • English
    Nonlinear Optics, Fourth Edition, is a tutorial-based introduction to nonlinear optics that is suitable for graduate-level courses in electrical and electronic engineering, and for electronic and computer engineering departments, physics departments, and as a reference for industry practitioners of nonlinear optics. It will appeal to a wide audience of optics, physics and electrical and electronic engineering students, as well as practitioners in related fields, such as materials science and chemistry.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 213
    • English
    Advances in Imaging and Electron Physics, Volume 213, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Quantum Confined Lasers

    Recent Advances
    • 1st Edition
    • Frederic Grillot
    • English
    Quantum Confined Lasers: Recent Advances provides an overview of the recent advances and current challenges in the field, and features a comprehensive treatment of diode lasers starting from the basics up to the most advanced concepts and technologies. With his 10-year background in optoelectronics and semiconductor physics, Professor Grillot presents a concise overview of the state-of-the-art in semiconductor lasers.The book includes timely challenges in diode lasers, fully related to the birth of future green optical telecommunication networks, the incorporation of photonics in consumer microelectronics, and the development of terahertz solutions for free space communications and sensing. This book serves as a valuable tool for all researchers, scientists, and R&D engineers engaged in design and development of lasers and optoelectronics.

  • Reliability of Photonics Devices

    • 1st Edition
    • Yannick Deshayes
    • English
    Reliability of Photonics Devices discusses the advantages of training computer scientists with a knowledge base that is broad enough to adapt to the context of different companies, administrations and organizations. The book's focus is multidisciplinary, including the inclusion of computer science, information systems, organization and management, communication, professionalization and applied mathematics. The MIAGE sector is offered by 22 French universities, 6 of which offer a joint remote version, also shared by 5 associated foreign institutions.In this sector, students come from scientific or economics-management fields. Their mathematical background, without being elementary, is not that of a student engaged in a long mathematical field. The applied mathematics concepts of the MIAGE program focus on descriptive statistics, probabilities, data analysis, random processes and numerical simulation.

  • Advances in Imaging and Electron Physics Including Proceedings CPO-10

    • 1st Edition
    • Volume 212
    • English
    Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 211
    • English
    Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 210
    • Peter W. Hawkes
    • English
    Advances in Imaging and Electron Physics, Volume 210, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at high energy losses, Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for use in Electronic Transport Devices, and more.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 209
    • English
    Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 208
    • English
    Advances in Imaging and Electron Physics, Volume 208, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 207
    • English
    Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 206
    • English
    Advances in Imaging and Electron Physics, Volume 206, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 205
    • English
    Advances in Imaging and Electron Physics, Volume 205 is the latest release in this series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Smart Sensors and MEMS

    Intelligent Sensing Devices and Microsystems for Industrial Applications
    • 2nd Edition
    • S Nihtianov + 1 more
    • English
    Smart Sensors and MEMS: Intelligent Devices and Microsystems for Industrial Applications, Second Edition highlights new, important developments in the field, including the latest on magnetic sensors, temperature sensors and microreaction chambers. The book outlines the industrial applications for smart sensors, covering direct interface circuits for sensors, capacitive sensors for displacement measurement in the sub-nanometer range, integrated inductive displacement sensors for harsh industrial environments, advanced silicon radiation detectors in the vacuum ultraviolet (VUV) and extreme ultraviolet (EUV) spectral range, among other topics. New sections include discussions on magnetic and temperature sensors and the industrial applications of smart micro-electro-mechan... systems (MEMS). The book is an invaluable reference for academics, materials scientists and electrical engineers working in the microelectronics, sensors and micromechanics industry. In addition, engineers looking for industrial sensing, monitoring and automation solutions will find this a comprehensive source of information.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 204
    • English
    Advances in Imaging and Electron Physics, Volume 204, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 203
    • English
    Advances in Imaging and Electron Physics, Volume 203, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 202
    • English
    Advances in Imaging and Electron Physics, Volume 202, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Advances in Imaging and Electron Physics

    • 1st Edition
    • Volume 201
    • English
    Advances in Imaging and Electron Physics, Volume 201, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • An Introduction to Organic Lasers

    • 1st Edition
    • Azzedine Boudrioua + 2 more
    • English
    One of the biggest challenges of organic optoelectronics is the realization of the first organic laser diode (electrically pumped) which has a very strong potential for many applications. Similar to what happened in the field of inorganic optoelectronics when transforming LEDs into LDs, the race is on to transform an OLED into an OLD. This involves the development of innovative solutions to overcome the difficulties inherent in organic materials and the electric pump. This book presents the elements of physics, materials and technologies that allow us to understand the basics of organic lasers and to capture the progress made. It also provides guidance for future developments towards the organic laser diode.

  • Reliability Investigation of LED Devices for Public Light Applications

    • 1st Edition
    • Raphael Baillot + 1 more
    • English
    Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved.

  • Physics of Semiconductor Lasers

    • 1st Edition
    • B. Mroziewicz + 2 more
    • English
    Written for readers who have some background in solid state physics but do not necessarily possess any knowledge of semiconductor lasers, this book provides a comprehensive and concise account of fundamental semiconductor laser physics, technology and properties. The principles of operation of these lasers are therefore discussed in detail with the interrelations between their design and optical, electrical and thermal properties. The relative merits of a large number of laser structures and their parameters are described to acquaint the reader with the various aspects of the semiconductor lasers and the trends in their development.

  • Reliability, Robustness and Failure Mechanisms of LED Devices

    Methodology and Evaluation
    • 1st Edition
    • Yannick Deshayes + 1 more
    • English
    The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

  • Laser Additive Manufacturing

    Materials, Design, Technologies, and Applications
    • 1st Edition
    • Milan Brandt
    • English
    Laser Additive Manufacturing: Materials, Design, Technologies, and Applications provides the latest information on this highly efficient method of layer-based manufacturing using metals, plastics, or composite materials. The technology is particularly suitable for the production of complex components with high precision for a range of industries, including aerospace, automotive, and medical engineering. This book provides a comprehensive review of the technology and its range of applications. Part One looks at materials suitable for laser AM processes, with Part Two discussing design strategies for AM. Parts Three and Four review the most widely-used AM technique, powder bed fusion (PBF) and discuss other AM techniques, such as directed energy deposition, sheet lamination, jetting techniques, extrusion techniques, and vat photopolymerization. The final section explores the range of applications of laser AM.

  • Transformation Optics-based Antennas

    • 1st Edition
    • Shah Nawaz Burokur + 3 more
    • English
    Transformation Optics-based Antennas is organized into two chapters that follow an introduction that presents the basic principles of the transformation optics concept. Two types of transformation are presented, coordinate transformation and space transformation. Implementations using metamaterials are also discussed. Chapter One focuses on coordinate transformation in the design of devices capable of modifying the electromagnetic appearance of a radiating source. Transformation of a directive radiation pattern into an isotropic one (and vice-versa) through space stretching and compression, respectively, and the possibility of creating multiple beams are also studied. Chapter Two deals with devices designed using space transformation concepts. Quasi-conformal transformation optics (QCTO) are applied for the design of lenses, either to compensate for the phase shift created by the conformation of an array of sources or to steer a beam to an off-normal direction.

  • An Introduction to Fiber Optics System Design

    • 1st Edition
    • B.E. Briley
    • English
    A thorough account on the basics of fiber optics system design is contained in this volume. Introducing the topics from the vantage point of the student and professional electrical engineer, the aim of the text is to teach rather than merely present facts. The overall view of the text is toward practical engineering considerations including costs, and a discussion of radiation effects is associated with each appropriate chapter.The volume begins with a history of optical communications, leading to the now widely practiced field of fiber optics. Comparisons are made to conventional media and techniques: wire-line, coaxial cable, and radio. The nature and properties of optical fiber are examined, including manufacturing techniques, and fiber types and capabilities. The theory of light guidance is introduced in steps, beginning with a slab waveguide. Solutions of Maxwell's equations are derived and explained in view of the peculiar nature of the medium. Electro-optic devices are examined, including launching and detecting devices. The properties and varieties of these devices are explored. In particular, light-emitting diodes, injection laser diodes, p-i-n diodes, and avalanche photo diodes are covered. The electronic circuits necessary to adequately serve the electro-optic devices are examined and contrasted with more conventional types.Modulation techniques appropriate to optical fiber transmission systems are enumerated and compared. Overall system considerations are addressed, and examples are given of various systems that have been deployed, or are planned for deployment. Expectations for future developments and trends in the field are enumerated, with indications of their significance. Topics such as ultra-low-loss fiber and coherent detections techniques are discussed.Appendices comprising an accounting of useful laboratory equipment, mathematical relations employed in the body of the text, and complete exercise solutions are included.

  • Fundamentals and Applications of Nanophotonics

    • 1st Edition
    • Joseph W. Haus
    • English
    Fundamentals and Applications of Nanophotonics includes a comprehensive discussion of the field of nanophotonics, including key enabling technologies that have the potential to drive economic growth and impact numerous application domains such as ICT, the environment, healthcare, military, transport, manufacturing, and energy. This book gives readers the theoretical underpinnings needed to understand the latest advances in the field. After an introduction to the area, chapters two and three cover the essential topics of electrodynamics, quantum mechanics, and computation as they relate to nanophotonics. Subsequent chapters explore materials for nanophotonics, including nanoparticles, photonic crystals, nanosilicon, nanocarbon, III-V, and II-VI semiconductors. In addition, fabrication and characterization techniques are addressed, along with the importance of plasmonics, and the applications of nanophotonics in devices such as lasers, LEDs, and photodetectors.

  • Laser Surface Engineering

    Processes and Applications
    • 1st Edition
    • Jonathan R. Lawrence + 1 more
    • English
    Lasers can alter the surface composition and properties of materials in a highly controllable way, which makes them efficient and cost-effective tools for surface engineering. This book provides an overview of the different techniques, the laser-material interactions and the advantages and disadvantages for different applications. Part one looks at laser heat treatment, part two covers laser additive manufacturing such as laser-enhanced electroplating, and part three discusses laser micromachining, structuring and surface modification. Chemical and biological applications of laser surface engineering are explored in part four, including ways to improve the surface corrosion properties of metals.