Books in Optics and lasers

Advances in Imaging and Electron Physics

1st Edition
Volume 236
October 1, 2025
Peter W. Hawkes + 1 more
English

Advances in Imaging and Electron Physics, Volume 236 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

Advances in Imaging and Electron Physics

1st Edition
Volume 235
August 1, 2025
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 4 2 8 3 1 9
eBook
9 7 8 0 4 4 3 4 2 8 3 2 6

Advances in Imaging and Electron Physics, Volume 235 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology.

Advances in Imaging and Electron Physics

1st Edition
Volume 234
April 26, 2025
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 4 2 8 2 9 6
eBook
9 7 8 0 4 4 3 4 2 8 3 0 2

Advances in Imaging and Electron Physics, Volume 234 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Unified formalism of light beam optics and light polarization, Relativistic Theory and Calculation of Electrostatic Focusing Systems, A Nonlinear Representation Theory of Equivariant Deep Learning Using Group Morphology, and Artificial Intelligence and Deep Learning in Electron Microscopy.

Advances in Optics of Charged Particle Analyzers: Part 2

1st Edition
Volume 233
February 10, 2025
Peter W. Hawkes + 1 more
English
eBook
9 7 8 0 4 4 3 3 1 7 2 1 7

Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

Advances in Optics of Charged Particle Analyzers: Part 1

1st Edition
Volume 232
November 20, 2024
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 2 9 7 8 6 1
eBook
9 7 8 0 4 4 3 2 9 7 8 7 8

Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Nanolithography and Surface Microscopy with Electron Beams

1st Edition
Volume 231
October 25, 2024
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 3 1 4 6 2 9
eBook
9 7 8 0 4 4 3 3 1 4 6 3 6

Nanolithography and Surface Microscopy with Electron Beams, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Coulomb Interactions in Particle Beams

1st Edition
Volume 230
October 10, 2024
Guus Jansen
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 2 9 7 8 4 7
eBook
9 7 8 0 4 4 3 2 9 7 8 5 4

Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

1st Edition
Volume 229
March 29, 2024
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 2 9 6 4 8 2
eBook
9 7 8 0 4 4 3 2 9 6 4 9 9

Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

The Properties of Ponderomotive Lenses

1st Edition
Volume 228
October 6, 2023
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 1 9 3 2 2 4
eBook
9 7 8 0 4 4 3 1 9 3 2 3 1

The Properties of Ponderomotive Lenses, Volume 228 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

1st Edition
Volume 227
August 15, 2023
Peter W. Hawkes + 1 more
English
Hardback
9 7 8 0 4 4 3 1 9 3 2 4 8
eBook
9 7 8 0 4 4 3 1 9 3 2 5 5

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

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Books in Optics and lasers

Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Advances in Optics of Charged Particle Analyzers: Part 2

Advances in Optics of Charged Particle Analyzers: Part 1

Nanolithography and Surface Microscopy with Electron Beams

Coulomb Interactions in Particle Beams

Advances in Imaging and Electron Physics

The Properties of Ponderomotive Lenses

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources