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North Holland

  • Boundary Value Problems For Second Order Elliptic Equations

    • 1st Edition
    • A.V. Bitsadze
    • English
    Applied Mathematics and Mechanics, Volume 5: Boundary Value Problems: For Second Order Elliptic Equations is a revised and augmented version of a lecture course on non-Fredholm elliptic boundary value problems, delivered at the Novosibirsk State University in the academic year 1964-1965. This seven-chapter text is devoted to a study of the basic linear boundary value problems for linear second order partial differential equations, which satisfy the condition of uniform ellipticity. The opening chapter deals with the fundamental aspects of the linear equations theory in normed linear spaces. This topic is followed by discussions on solutions of elliptic equations and the formulation of Dirichlet problem for a second order elliptic equation. A chapter focuses on the solution equation for the directional derivative problem. Another chapter surveys the formulation of the Poincaré problem for second order elliptic systems in two independent variables. This chapter also examines the theory of one-dimensional singular integral equations that allow the investigation of highly important classes of boundary value problems. The final chapter looks into other classes of multidimensional singular integral equations and related boundary value problems.
  • Computed Electron Micrographs And Defect Identification

    • 1st Edition
    • A.K. Head
    • English
    Computed Electron Micrographs and Defect Identification illustrates a technique for identifying defects in crystalline solids by the comparison of their images, which are produced in the electron microscope, with corresponding theoretical images. This book discusses the diffraction of electrons by a crystal; the two-beam dynamical equations; the absorption parameters; the deviation of the crystal from the Bragg reflecting position; the extinction distance; the displacement vector; and the foil normal. Chapter three presents the experimental techniques for determination of beam direction, defect line normal, foil normal, foil thickness, and extinction distance. Chapters four to seven explore ONEDIS and TWODIS and their principles. Chapters eight and nine focus on the application and limitations of the technique, while the last chapter explores the different computer programs related to the technique. Post-graduate students, as well as researchers using transmission electron microscopy for studying defects in crystalline solids, will find this book invaluable.
  • Pattern Recognition in Practice II

    • 1st Edition
    • L.N. Kanal + 1 more
    • English
    The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D reconstruction methods, and application oriented papers. Part II deals with aspects of statistical pattern recognition, the problem of population classification, and topics common to both pattern recognition and artificial intelligence.
  • CP Violation

    • 1st Edition
    • Volume 3
    • L. Wolfenstein
    • English
    The articles collected in this volume are mainly concerned with the phenomenological description of the 1964 discovery on K° decay that CP invariance was violated in nature. The variety of models developed to explain this CP violation are described together with reprints of more recent definitive experiments, and CP violation in the B° system and the electric dipole moment of the neutron is also covered.
  • Fusion Technology 1996

    • 1st Edition
    • C. Varandas + 1 more
    • English
    The objective of these proceedings was to provide a platform for the exchange of information on the design, construction and operation of fusion experiments. The technology which is being developed for the next step devices and fusion reactors was also covered.
  • Fusion Technology 1988

    • 1st Edition
    • A.M. van Ingen + 2 more
    • English
    Invited Papers Repr. from Fusion Engineering and Design, Vol. 11, Nos. 1 &
  • Defect Control in Semiconductors

    • 1st Edition
    • K. Sumino
    • English
    Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc.The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below.
  • Few Particle Problems

    in the Nuclear Interaction
    • 1st Edition
    • Ivo Slaus
    • English
    Few Particle Problems in the Nuclear Interaction emerged from the International Conference on Few Particle Problems in the Nuclear Interaction held in Los Angeles, from August 28-September 1, 1972. The aim of the conference was to discuss recent developments in low and medium energy few-particle problems. This included the fields of the nuclear three-body problem; nuclear forces (in particular, three-body forces); symmetries; and the interaction of mesons, leptons, and photons with few-nucleon systems. Special sessions were also devoted to the application of the results and techniques of the few-particle research to the problems of other fields, in particular nuclear structure and astrophysics. The conference was organized into nine plenary sessions and 13 parallel sessions. This volume contains 184 papers presented during the nine sessions on the following topics: the nucleon-nucleon interaction; three-body forces; hypernuclear systems; symmetries; three-body problems; multiparticle reactions; proposed studies of few-nucleon systems with meson factories; few-nucleon systems and leptons, mesons, and photons; and applications.
  • The Dielectric Function of Condensed Systems

    • 1st Edition
    • L.V. Keldysh + 2 more
    • English
    Much progress has been made in the understanding of the general properties of the dielectric function and in the calculation of this quantity for many classes of media. This volume gathers together the considerable information available and presents a detailed overview of the present status of the theory of electromagnetic response functions, whilst simultaneously covering a wide range of problems in its application to condensed matter physics.The following subjects are covered:- the dielectric function of the homogeneous electron gas, of crystalline systems, and of inhomogeneous matter; - electromagnetic fluctuations and molecular forces in condensed matter; - electrodynamics of superlattices.
  • Fusion Technology 1990

    • 1st Edition
    • B.E. Keen + 2 more
    • English
    The aim of the biennial series of symposia on Fusion Technology, organized by the European Fusion Laboratories, is the exchange of information on the design, construction and operation of fusion experiments. The coverage of the volume includes the technology aspects of fusion reactors to provide a link to the technology of new developments and form a guideline for the definition of future work. These proceedings comprise two volumes and contain both the invited lectures and contributed papers presented at the Symposium, which was attended by 556 participants from around the globe. The 312 papers in this volume, including 17 invited papers, give a broad and current overview of the progress and trends fusion technology is experiencing now, and the future for fusion devices.