Journals in Electronic devices and materials

10 results in All results

Cryogenics

• ISSN: 0011-2275
• 5 Year impact factor: 2
• Impact factor: 1.8

The leading international journal of low temperature engineering including applied superconductivity, cryoelectronics and cryophysicsCryogenics is the world's leading journal focusing on all aspects of cryoengineering and cryogenics. Papers published in Cryogenics cover a wide variety of subjects in low temperature engineering and research. Among the areas covered are:• Applications of superconductivity: magnets, electronics, devices • Superconductors and their properties • Properties of materials: metals, alloys, composites, polymers, insulations • Fluid properties • New applications of cryogenic technology to processes, devices, machinery • Refrigeration and liquefaction technology • Thermodynamics, heat transfer, and fluid mechanics • Thermometry and measurement science • Cryogenics in medicine • CryoelectronicsAs well as original research papers, Cryogenics contains commissioned review articles on the latest developments in cryogenics worldwide, research and technical notes describing preliminary results and experimental details, and letters to the Editor on recent areas of discussion and controversy.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

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Displays

• ISSN: 0141-9382
• 5 Year impact factor: 3.4
• Impact factor: 3.7

Displays is a peer reviewed international journal accepting technical, original research papers and tutorial papers dealing with display technologies and applications. The journal welcomes submissions in a wide range of display-related topics, including display technologies, materials, components, methods and systems, display-human interaction, processing and analysis of visual signals, and visual perception. The journal aims to provide a platform for the publication of top quality display-related research works with both academic and industrial appeal.Our dedicated editorial team will try their best to ensure a rapid reviewing process. The journal covers topics include, but not limited to, the following fields:Display-human Interaction• Visual signal processing and computer vision (CV) • Display-human/user interface design and analysis • Image/video quality assessment (IQA/VQA) and quality of experience (QoE) • Visual performance measurement and assessment • Visual perception and its cortical representation • Human factors and ergonomics for displaysDisplay Technology• Emissive/non-emissive displays • Flexible displays and E-papers • Materials/components and drive-electronics for displays • 3D displays and virtual/augmented/mixed reality (VR/AR/MR) • Auditory and tactile displays • Computational displaysBenefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

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Micro and Nanostructures

• ISSN: 0749-6036
• 5 Year impact factor: 2.7
• Impact factor: 2.7

Formerly known as Superlattices and Microstructures, with a 2022 IF of 3.1.Micro and Nanostructures is a journal disseminating the science and technology of micro-structures and nano-structures in materials and their devices, including individual and collective use of semiconductors, metals and insulators for the exploitation of their unique properties. The journal hosts papers dealing with fundamental and applied experimental research as well as theoretical studies. Fields of interest, including emerging ones, cover: • Novel micro and nanostructures • Nanomaterials (nanowires, nanodots, 2D materials ) and devices • Synthetic heterostructures • Plasmonics • Micro and nano-defects in materials (semiconductor, metal and insulators) • Surfaces and interfaces of thin filmsIn addition to Research Papers, the journal aims at publishing Topical Reviews providing insights into rapidly evolving or more mature fields. Written by leading researchers in their respective fields, those articles are commissioned by the Editorial Board.

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Micro and Nanostructures

• ISSN: 2773-0123
• 5 Year impact factor: 2.7
• Impact factor: 2.7

Formerly known as Superlattices and Microstructures, with a 2022 IF of 3.1.Micro and Nanostructures is a journal disseminating the science and technology of micro-structures and nano-structures in materials and their devices, including individual and collective use of semiconductors, metals and insulators for the exploitation of their unique properties. The journal hosts papers dealing with fundamental and applied experimental research as well as theoretical studies. Fields of interest, including emerging ones, cover: • Novel micro and nanostructures • Nanomaterials (nanowires, nanodots, 2D materials ) and devices • Synthetic heterostructures • Plasmonics • Micro and nano-defects in materials (semiconductor, metal and insulators) • Surfaces and interfaces of thin filmsIn addition to Research Papers, the journal aims at publishing Topical Reviews providing insights into rapidly evolving or more mature fields. Written by leading researchers in their respective fields, those articles are commissioned by the Editorial Board.

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Microelectronic Engineering

• ISSN: 0167-9317
• 5 Year impact factor: 2.5
• Impact factor: 2.6

Nanotechnology and Processing — Electronics, photonics, MEMS and Life Sciences Affiliated with iMNEsMicroelectronic Engineering is the premier journal focused on the fabrication and characterization of micro/nano-electronic materials, devices and circuits (including novel electronic nanomaterials), as well as the understanding of their working mechanisms, performance, yield, variability, stability, and reliability. The journal also focuses on the techniques that make possible the fabrication and characterization of such devices and circuits, and on the materials involved in them. Occasionally, outstanding papers on simulation of materials properties, device figures-of-merit or compact modeling of circuits and systems may be accepted. The following topics are of special interest:DevicesPhotonic and optoelectronic devices (including, sensors, actuators, phototransistors)Transistors (including ultra-scaled, thin film, organic, ferroelectric)Resistive switching devices (memristors, RRAM, PCRAM, FeRAM, MRAM)Magnetic and spintronic devicesMEMS and NEMS (including power, RF, magnetic, organic)Flexible electronic devices (including wearable, printed, paper)Devices for energy harvesting (piezoelectric, flexoelectric, photovoltaic, solar cells)Bioelectronic devices (molecular detection, biomimetic, diagnosis)Device-level simulations (including variability and reliability)MaterialsWide bandgap semiconductorsDielectrics (low K and high K)Two-dimensional (2D) Materials and related transferring techniquesNanotubes, nanowires, and other nanomaterials and nanostrctures for device fabricationInterconnects, metallization and barrier materialsNew Resist MaterialsSilicon on insulatorsPolymers and flexible substrates, including biocompatible materialsAtomistic simulations of materials propertiesFabrication and characterization processesThin films deposition techniques (CVD, ALD, evaporation, sputtering, MBE, plasma)Lithography (including optical, EUV, electron beam, nanoimpring, particle-assisted, mask less, X-ray optical methods, emerging methods and limits, as well as resists)Pattern transfer (including ion, plasma and wet transfer, as well as transfer of 2D materials)Integration processes (including inkjet printing, 3D printing, 3D integration)Top-down and bottom-up self-assembly processesAnnealing and its effect in the materials (including crystallization, wrinkling, de-wetting)Nanometrology (TEM, SEM, EDX, EELS, STM, AFM and related setups)Circuits and applicationsSensing and actuation, including bio-compatible applicationsSignal souring and transferLogic operations and data processingElectronic memories and information storageArtificial neural networks and neuromorphic computingCompact modeling of electronic circuitsQuantum computingFive different types of articles are considered:Research articles that report regular original research that produces significant advancement.Accelerated Publications (Letters) that feature exciting research breakthroughs.Review Articles that inform readers of the latest research and advances in a topic within the broad field of microelectronic engineering. This includes roadmaps and guides proposing the recommended methods in a specific field.Short / Technical notes intended for original limited investigations or short description of original industrial or industrially-related research and development workNews and Opinions that comment on topical issues or express views on the developments in related fields, or comment on previously published work

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Microelectronics Journal

• ISSN: 0026-2692
• 5 Year impact factor: 1.7
• Impact factor: 1.9

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers microelectronics device, circuits and systems. This topic includes but is not limited to• Analog, digital, mixed, and RF integrated circuits and related design methodologies • Semiconductor memory, such as RRAM, MRAM, FLASH, PCRAM , etc • Microelectronic devices , modeling and device physics • Semiconductor optoelectronic devices and integrated technology • Wide band gap semiconductor materials, devices and circuits • TSV, TGV, 3D-ICs, SIP and related technology • Integrated circuit design automation technology ( EDA ) • SOC, NoC design, analysis and test • Artificial intelligence integrated circuits and design methodology • Testing, design for testability (DFT), built-in self-test for integrated circuits • Integrated circuit hardware security • Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, TFET, NC-FET ,etc.Benefits to authors We provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications, and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or assistance, see our support pages at https://service.elsevier.com

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Microelectronics Reliability

• ISSN: 0026-2714
• 5 Year impact factor: 1.6
• Impact factor: 1.6

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. All contributions are subject to peer review by leading experts in the field. Special issues are devoted to significant international conferences, or to important developing topics.Microelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.

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Organic Electronics

• ISSN: 1566-1199
• 5 Year impact factor: 2.5
• Impact factor: 2.7

Materials, Physics, Chemistry and ApplicationsOrganic Electronics is a journal whose primary interdisciplinary focus is on materials and phenomena related to organic and hybrid organic-inorganic devices such as light emitting diodes, thin film transistors, photovoltaic cells, sensors, memories, etc.Papers suitable for publication in this journal cover such topics as photoconductive and electronic properties of organic and hybrid organic-inorganic semiconductors, thin film structures and characterization in the context of materials processing, charge and exciton transport, and electronic and optoelectronic devices.Organic Electronics provides the forum for applied, fundamental and interdisciplinary contributions spanning the wide range of electronic properties and applications of organic and hybrid organic-inorganic materials. A Letters section is included for rapid publication of short articles announcing significant and highly original results.Keywords: organic electronics, light-emitting diodes, solar cells, thin film transistors, sensors, memories, organic semiconductors, hybrid organic-inorganic semiconductors, halide perovskites, colloidal quantum dots, optoelectronics, charge transport.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

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Physica E: Low-Dimensional Systems and Nanostructures

• ISSN: 1386-9477
• 5 Year impact factor: 2.7
• Impact factor: 2.9

Physica E: Low-dimensional systems and Nanostructures contains papers and invited review articles on the fundamental and applied aspects of physics in low-dimensional electron systems, in semiconductor heterostructures, oxide interfaces, quantum wells and superlattices, quantum wires and dots, novel quantum states of matter such as topological insulators, and Weyl semimetals.Both theoretical and experimental contributions are invited. The journal publishes articles on spin related phenomena, optical and transport properties, many-body effects, integer and fractional quantum Hall effects, quantum spin Hall effect, single electron effects and devices, Majorana fermions, and other novel phenomena.The journal publishes topics including: topological insulators/superconductors, majorana fermions, Wyel semimetals;quantum and neuromorphic computing/quantum information physics and devices based on low dimensional systems;layered superconductivity, low dimensional systems with superconducting proximity effect;2D materials such as transition metal dichalcogenides;oxide heterostructures including ZnO, SrTiO3 etc;carbon nanostructures (graphene, carbon nanotubes, diamond NV center, etc.)quantum wells and superlattices;quantum Hall effect, quantum spin Hall effect, quantum anomalous Hall effect;optical- and phonons-related phenomena;magnetic-semiconductor structures;charge/spin-, magnon-, skyrmion-, Cooper pair- and majorana fermion- transport and tunneling;ultra-fast nonlinear optical phenomena;novel devices and applications (such as high performance sensor, solar cell, etc);novel growth and fabrication techniques for nanostructuresNote Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center.

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Solid-State Electronics

• ISSN: 0038-1101
• 5 Year impact factor: 1.4
• Impact factor: 1.4

It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design with appropriate experimental backup; (2) optical, electrical, morphological characterization techniques and parameter extraction with experimental application to real devices; (3) device fabrication and synthesis, including device-related new materials growth, electro-optical characterization and performance evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) modeling and simulation of solid-state devices and processes with appropriate experimental backup; (6) nanoscale electronic and optoelectronic devices for various applications, including photovoltaics, sensing, micro- and nano-mechanical (MEMS/NEMS) systems, quantum computation and communication.Important: Given the wide availability of TCAD simulation packages (Synopsys, Silvaco, etc.) device simulation papers should be coupled with experiment, revolutionary concepts or novel analytical approaches. Pure simulation papers are not considered. Papers on materials growth and characterization should be relevant to a current or future device technology.Types of contributions: Original research papers, letters (intended for high-impact and high-quality short papers) and invited review papers (please contact the editors prior to submission). Solid-State Electronics does not publish notes or brief communications.Keywords: solid state electronics, field effect transistor, semiconductor (Si, SOI, Ge, III-V, 2D, etc.), nano-devices, new device concepts, fabrication, characterization, modeling, memories, high-voltage devices, photovoltaics, MEMS/NEMS

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