Journals in Physics of beams
Journals in Physics of beams
- ISSN: 0921-5107
Materials Science and Engineering: B
Materials Science and Engineering B (MSEB) is a long-standing peer-reviewed journal, providing a leading international platform for research across diverse disciplines in the materials’ world. We encourage high-quality original research and timely review submissions that offer insights into the synthesis, processing, characterisation, modelling, predictions, and understanding of functional materials and their respective applications. Topics of interest include, but not limited to:Nano materials and nanotechnologyVan der Waals materials and heterostructuresTopo... materialsMeta-materi... and moiré materialsMagnetic and correlated materialsCeramic materials Membranes and filmsEnergy and catalysis applicationsEnvironm... applicationsCharacte... techniquesSynthesis and processingTheoretica... modelling and predictionsMachine learning materials With its interdisciplinary approach, our journal offers a unique opportunity to publish outstanding research, connecting scientists, fostering collaboration, and advancing our knowledge in materials science and engineering.
- ISSN: 0168-583X
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
NIM-B accepts original manuscripts on the fundamental interactions between energetic particle beams and matter, along with related technologies and applications.Relevan... manuscripts will address one or more of the following areas:Interactions between matter and beams of charged or neutral particles: Atoms, molecules, atomic clusters, neutrons, photons, electrons, and ions.Experimental, theoretical and modelling work concerning fundamental interaction cross sections and derived information such as stopping powers, defect formation, thermodynamics and kinetics data.Beam-enhanced synthesis and modification of classical and quantum materials as well as surfaces treated with laser-, electron- and high intensity ion beams. This includes radiation-induced amorphization, crystallization, and other microstructural developments resulting from defect production and annealing, controlled modification of physical and chemical properties by ion implantation, micro and nano-structuring of surfaces as well as creation of structures far from thermal equilibrium, such as supersaturated solid solutions and ion tracks.The behaviour of materials subjected to ionising radiation of all kinds as well as the stability of materials exposed to various high radiation environments, including space, fission and fusion reactors, together with basic studies of initial defect generation, defect diffusion and annihilation, phase transformations, atomic clustering and bubble formation, and radiation damage in general.The fundamental physics and technical development of materials analysis using energetic beams - including all forms of ion beam analysis, accelerator mass spectrometry, positron annihilation spectroscopy, neutron scattering and diffraction, as well as synchrotron-based methods.Applications show-casing analytical capabilities or introducing novel possibilities across the whole range from analysis of biological tissues, materials of relevance to earth and planetary sciences, environmental science, materials science, cultural heritage materials, and thin films.Developments in ion beam instrumentation such as sources, optics, small accelerators, charged particle, neutron, X-ray and gamma-ray detectors, data acquisition, simulations, and computer programs enabling new capabilities relevant to the scientific scope of the journal.If this journal seems like a good fit for your research, you can find more information on submission in the Guide for Authors Guide for Authors.Special issues publication: The journal NIM-B offers interested parties the option of publication in topical special issues (including selected works from conferences). For more information please contact our special content specialist or the relevant editor.If you require any further information or help, please visit our Support Center.