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Books in Metrology

  • Photodetectors

    Materials, Devices and Applications
    • 1st Edition
    • English
    Photodetectors: Materials, Devices and Applications discusses the devices that convert light to electrical signals, key components in communication, computation, and imaging systems. In recent years, there has been significant improvement in photodetector performance, and this important book reviews some of the key advances in the field. Part one covers materials, detector types, and devices, and includes discussion of silicon photonics, detectors based on reduced dimensional charge systems, carbon nanotubes, graphene, nanowires, low-temperature grown gallium arsenide, plasmonic, Si photomultiplier tubes, and organic photodetectors, while part two focuses on important applications of photodetectors, including microwave photonics, communications, high-speed single photon detection, THz detection, resonant cavity enhanced photodetection, photo-capacitors and imaging.

  • Fundamental Principles of Engineering Nanometrology

    • 2nd Edition
    • Richard Leach
    • English
    Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology.

  • Newnes Embedded Sensors ebook Collection

    • 1st Edition
    • Dogan Ibrahim + 4 more
    • English
    Most engineers rely on a small core of books that are specifically targeted to their job responsibilities. These dog-eared volumes are used daily and considered essential. But budgets and space commonly limit just how many books can be added to your core library. The Newnes Embedded Sensors Ebook Collection solves this problem. It contains five of our best-selling titles, providing the "next level" of reference you will need for a fraction of the price of the hard-copy books purchased separately. The CD contains the complete PDF versions of the following Newnes titles: Microcontroller-Base... Temperature Monitoring and Control (Ibrahim) 9780750655569Intelli... Sensor Design (Huddleston) 9780750677554Sensor Technology Handbook (Wilson) 9780750677295Hall Effect Sensors (Ramsden) 9780750679343Sensors and Transducers (Sinclair) 9780750649322

  • Handbook of Ellipsometry

    • 1st Edition
    • Harland Tompkins + 1 more
    • Harland Tompkins + 1 more
    • English
    The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale. With the acceleration of new instruments and applications now occurring, this book provides an essential foundation for the current science and technology of ellipsometry for scientists and engineers in industry and academia at the forefront of nanotechnology developments in instrumentation, integrated circuits, biotechnology, and pharmaceuticals. Divided into four parts, this comprehensive handbook covers the theory of ellipsometry, instrumentation, applications, and emerging areas. Experts in the field contributed to its twelve chapters, covering various aspects of ellipsometry.

  • Surfaces and their Measurement

    • 1st Edition
    • David J. Whitehouse
    • English
    The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation.

  • Measurement Science for Engineers

    • 1st Edition
    • Paul Regtien + 3 more
    • English
    This volume, from an international authority on the subject, deals with the physical and instrumentation aspects of measurement science, the availability of major measurement tools, and how to use them. This book not only lays out basic concepts of electronic measurement systems, but also provides numerous examples and exercises for the student.

  • Advanced Techniques for Assessment Surface Topography

    Development of a Basis for 3D Surface Texture Standards "Surfstand"
    • 1st Edition
    • Liam Blunt + 1 more
    • English
    This publication deals with the latest developments in the field of 3D surface metrology and will become a seminal text in this important area. It has been prepared with the support of the European Community’s Directorate General XII and represents the culmination of research conducted by 11 international partners as part of an EU-funded project. The aim of the project is to inform standards bodies of the possibilities that exist for a new international standard covering the field of 3D surface characterisation.The book covers a description of the proposed 3D surface parameters and advanced filtering techniques using wavelet and robust Gaussian methodologies. The next generation areal surface characterisation theories are discussed and their practical implementation is illustrated. It describes techniques for calibration of 3D instrumentation, including stylus instruments as well as scanning probe instrumentation. Practical verification of the 3D parameters and the filtering is illustrated through a series of case studies which cover bio-implant surfaces, automotive cylinder liner and steel sheet. Finally, future developments of the subject are alluded to and implications for future standardisation and development are discussed.

  • Surfaces and their Measurement

    • 1st Edition
    • David J. Whitehouse
    • English
    The importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation.

  • Three Dimensional Surface Topography

    • 1st Edition
    • Ken J Stout + 1 more
    • English
    This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

  • Trends in Optical Non-Destructive Testing and Inspection

    • 1st Edition
    • P.K. Rastogi + 1 more
    • English
    This book covers a wide range of measurement techniques broadly referred to as Optical Metrology, with emphasis on their applications to nondestructive testing. If we look separately at each of the two terms making the generic name Optical Metrology, we find a link to two of the most distinctive aspects of humans: a particularly well developed sense of vision and a desire to classify things using numbers and rules. Of all our five senses, vision is certainly the most developed and the closest to the rational part of our brain. It can be argued that our memory is strongly dependent on images and the brain is particularly good at processing the stimuli received from these images to extract information. Measuring, sizing and counting are, on the other hand, among the fundamental building blocks of modern society. The use of abstract quantities like size, value or intensity has simplified the description of complex enquiry and is the basis of modern science and economy. Hence, it would seem natural that the combination of two such basic aspects should result in the birth of a new field of science. However, it is known that his has not been the case. Optical Metrology remains classified as a group of special techniques used mainly in niche applications. Optical Metrology may be rightly described as an ensemble of techniques in which fields such as physics, electrical and mechanical engineering, and computer science merge and blend in new ways. This book is intended as a tribute to the career of Professor Léopold Pflug. By looking back at his lifelong commitment to the application of optical metrology to the service of engineering sciences, more particularly devoted to the observation of the real behavior of structural components, one can retrace the major revolutions that have taken place in this domain. Starting his activity in 1971 as the head of the Laboratory for Stress Analysis at the EPFL in Switzerland, he first employed photoelasticity as a tool to improve the understanding of the real behavior of complex structures. However he soon recognized the necessity of working with the real materials used to build these structures instead of on replicas made of optically birefringent materials. He then focussed on the use of moiré techniques which sparked his fascination with laser-based holography and speckle-based methods. The advent of information technology led him to open up to the use of ESPI and digital image processing techniques. Finally, in the mid 1990s he became interested in the use of optical fibers as a tool for sensing deformations inside structures, not only on their surfaces as in the case of whole-field methods. It is interesting to note the parallel in the evolution of optical metrology vis à vis developments in other fields: the development of lasers led to holographic interferometry, the availability of frame-grabbers led to ESPI and the emergence of fiber optic communications opened the way to the development of fiber optic sensors. This puts in sharp perspective the strong dependence of optical metrology on the latest technology for its development. Also interesting to note is that all fields in optical metrology touched upon by Professor Pflug are still of great relevance, as shown by the contributions in this volume. This book is, however, not intended as a commemoration, rather as an occasion to review the trends and undercurrents that are driving the field of optical metrology, with emphasis on nondestructive testing. All the authors were asked to summarize the recent achievements in their respective fields and to speculate about the future. As a result it has become apparent that it is difficult although not impossible to spot general trends in these disparate fields. Optical metrology has considerably benefited from some of the most important innovations of the recent past: lasers, computers and fiber optics communication, all of which found their direct inspiration from the developments in the world of electronics. In recent years we have also witnessed a shift of power from states to corporations. This has created the need to produce quick results useful to industry. Optical nondestructive testing has certainly adapted to this evolution, and several contributions in this book show that the researchers in this field understand the importance of developing technology that can be used by the industry to solve specific problems. We should also not forget that optical nondestructive testing is essentially a "service technology" and should as such not only focus on serving its clients in the best possible way, but also should continually emphasize, extend and enhance its services to new users still unaware of its potential. Hopefully this book will help in spreading awareness of the potentials of optical metrology and in focusing on the challenges of the future.