Nuclear Instruments and Methods in Physics Research - section A (NIM-A) publishes papers on design, development and performance of scientific instruments including complex detector systems and large-scale facilities which utilize or study ionizing radiation. This scope includes the development of particle accelerators, particle beam sources, beam transport systems and target arrangements as well as the use of secondary phenomena and their enabling instruments such as neutron sources, synchrotron radiation sources and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as innovative instrumentation for nuclear reactors, nuclear security, nuclear medical diagnoses and therapy, astrophysics, planetary science, and environmental protection. Specialized electronics for these instruments as well as computerization of measurements and control systems in this area also find their place in NIM-A, as do new simulation codes and analysis tools*). Theoretical as well as experimental papers are accepted.
*) We receive an increasing number of submissions that are based exclusively on simulated data generated by standard codes such as ANSYS, Geant4, MAFIA, to name a few. Often the codes are used in a black-box manner to simulate relatively simple concepts and geometries without any validation of the results. Such submissions if found to fall short of our thresholds for originality and innovation may be rejected.
We face a similar situation related to the use of standard neural networks (deep learning) that are used to analyse all kinds of data (experimental or Monte-Carlo generated). Unless there is a clear motivation and a significant performance increase compared to a conventional analysis, such submissions may be rejected without starting the review process.
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NIM-B accepts original manuscripts on the fundamental interactions between energetic particle beams and matter, along with related technologies and applications.Relevant manuscripts will address one or more of the following areas:Interactions between matter and beams of charged or neutral particles: Atoms, molecules, atomic clusters, neutrons, photons, electrons, and ions.Experimental, theoretical and modelling work concerning fundamental interaction cross sections and derived information such as stopping powers, defect formation, thermodynamics and kinetics data.Beam-enhanced synthesis and modification of classical and quantum materials as well as surfaces treated with laser-, electron- and high intensity ion beams. This includes radiation-induced amorphization, crystallization, and other microstructural developments resulting from defect production and annealing, controlled modification of physical and chemical properties by ion implantation, micro and nano-structuring of surfaces as well as creation of structures far from thermal equilibrium, such as supersaturated solid solutions and ion tracks.The behaviour of materials subjected to ionising radiation of all kinds as well as the stability of materials exposed to various high radiation environments, including space, fission and fusion reactors, together with basic studies of initial defect generation, defect diffusion and annihilation, phase transformations, atomic clustering and bubble formation, and radiation damage in general.The fundamental physics and technical development of materials analysis using energetic beams - including all forms of ion beam analysis, accelerator mass spectrometry, positron annihilation spectroscopy, neutron scattering and diffraction, as well as synchrotron-based methods.Applications show-casing analytical capabilities or introducing novel possibilities across the whole range from analysis of biological tissues, materials of relevance to earth and planetary sciences, environmental science, materials science, cultural heritage materials, and thin films.Developments in ion beam instrumentation such as sources, optics, small accelerators, charged particle, neutron, X-ray and gamma-ray detectors, data acquisition, simulations, and computer programs enabling new capabilities relevant to the scientific scope of the journal.If this journal seems like a good fit for your research, you can find more information on submission in the Guide for Authors Guide for Authors.Special issues publication: The journal NIM-B offers interested parties the option of publication in topical special issues (including selected works from conferences). For more information please contact our special content specialist or the relevant editor.If you require any further information or help, please visit our Support Center.
International Journal on the Science and Technology of Condensed Matter Films Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin film synthesis, characterization, modelling, and applications. The topical scope of Thin Solid Films reflects a wide range of thin film related themes: Thin film synthesis, with particular emphasis on the control of growth for desired physical propertiesSurfaces and interfacesSolar energy conversionCatalysisBatteries and other electrochemical devicesMetallurgical, protective, and hard coatingsElectronics, optics, and opto-electronicsMagnetics and magneto-opticsSuperconductivityNote to authors Contributions to Thin Solid Films should concern thin films and their potential applications. Details of film synthesis are required, together with the reproducibility of achieved results. Simulations should always be compared with corresponding original or published experimental data.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center
An international journal affiliated with MSA, ISEM, SCANDEM, NVEM, SGOEM, SIME-SM, DGE, MSC, ASEM and MSSA, committed to the advancement of new methods, tools and theories in microscopyUltramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.Electron MicroscopyInstrumentationMethod developmentImaging and scattering theoryComputational methodsImage processing and analysisAuthors are encouraged to contact the Editor in Chief directly at [email protected] to discuss Review proposals in the first instance possible, as these are by invitation only.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center
Vacuum is an international rapid publications journal with a focus on short communication. All papers are peer-reviewed, with the review process for short communication geared towards very fast turnaround times. The journal also published full research papers, thematic issues and selected papers from leading conferences.A report in Vacuum should represent a major advance in an area that involves a controlled environment at pressures of one atmosphere or below.The scope of the journal includes: 1. Vacuum; original developments in vacuum pumping and instrumentation, vacuum measurement, vacuum gas dynamics, gas-surface interactions, surface treatment for UHV applications and low outgassing, vacuum melting, sintering, and vacuum metrology. Technology and solutions for large-scale facilities (e.g., particle accelerators and fusion devices). New instrumentation ( e.g., detectors and electron microscopes). 2. Plasma science; advances in PVD, CVD, plasma-assisted CVD, ion sources, deposition processes and analysis. 3. Surface science; surface engineering, surface chemistry, surface analysis, crystal growth, ion-surface interactions and etching, nanometer-scale processing, surface modification. 4. Materials science; novel functional or structural materials. Metals, ceramics, and polymers. Experiments, simulations, and modelling for understanding structure-property relationships. Thin films and coatings. Nanostructures and ion implantation.The aim of the short communications is to enable researchers to rapidly share their most exciting work with their colleagues. The expected time from submission to final decision is approximately 6.4 weeks.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center