Skip to main content

Journals in Electrostatics

Journal of Electrostatics

  • ISSN: 0304-3886
  • 5 Year impact factor: 1.9
  • Impact factor: 1.9
Fundamentals, Applications and HazardsThe Journal of Electrostatics is the leading forum for publishing research findings that advance knowledge in the fundamental science and engineering of electrostatics. We invite submissions in the following areas:Electrostatic charge separation processes: Fundamental science and engineering behind how materials (solid or liquid) accumulate electrostatic charge, by triboelectric, induction, conduction, corona and electrical double layer charging, or other mechanisms. Electrostatic charge dissipation and neutralization. Electrets. Methods to control charging and electrostatic hazards. Static measurement techniques (charge, surface potential, electric field). Triboelectric nanogenerators and energy harvesters.Electrostatic manipulation of particles, droplets, and biological cells: Electrostatic forces on particles, including electrophoresis, dielectrophoresis and electrorotation. Applications, including electrostatic precipitators, separators, coating processes, and electrophotography. Electrostatic issues in fluidized beds and other solids handling processes. Biological/medical applications including control of biological cells and pharmaceutical powders. Coupled problems (thermal, flow, stress) with essential contribution of electrostatic phenomena.Electrostatically driven or controlled fluid flow: Corona generated secondary electrohydrodynamic flow. Boundary layer control. Electrohydrodynamic pumping. Electro-rheology. Electrospinning and electrospraying. DC and AC Electroosmosis. Electrowetting. Applications including materials processing, thermal management, and flow control.Electrostatics in the gas phase: Fundamental science of plasmas. Corona and dielectric barrier discharges. Electrical breakdown. Applications of plasma technologies, including environmental remediation of gas and liquid streams. Electrostatic discharges from charged surfaces - fundamentals, prevention, safety issues. Electrostatic phenomena in atmospheres.
Journal of Electrostatics

Microelectronics Journal

  • ISSN: 0026-2692
  • 5 Year impact factor: 1.7
  • Impact factor: 1.9
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers microelectronics device, circuits and systems. This topic includes but is not limited to• Analog, digital, mixed, and RF integrated circuits and related design methodologies • Semiconductor memory, such as RRAM, MRAM, FLASH, PCRAM , etc • Microelectronic devices , modeling and device physics • Semiconductor optoelectronic devices and integrated technology • Wide band gap semiconductor materials, devices and circuits • TSV, TGV, 3D-ICs, SIP and related technology • Integrated circuit design automation technology ( EDA ) • SOC, NoC design, analysis and test • Artificial intelligence integrated circuits and design methodology • Testing, design for testability (DFT), built-in self-test for integrated circuits • Integrated circuit hardware security • Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, TFET, NC-FET ,etc.Benefits to authors We provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications, and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or assistance, see our support pages at https://service.elsevier.com
Microelectronics Journal