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    • Fundamentals of Microwave Electronics

      • 1st Edition
      • June 20, 2014
      • V. N. Shevchik
      • W. A. Gambling
      • English
      • Paperback
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      • eBook
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      Electronics and Instrumentation, Volume 16: Fundamentals of Microwave Electronics provides an understanding of the phenomena that occur in the physics and technology of microwave electron devices. This book presents a systematic examination of the physical processes that take place in microwave electron devices. Organized into three parts encompassing seven chapters, this volume begins with an overview of oscillatory systems used in microwave electron devices. This text then explains the two fundamental methods of producing density modulation of an electron beam. Other chapters consider the energy exchange between an electron beam and an alternating electric field, which is associated with a change in electron kinetic energy. This book discusses as well the basic operational principles of the various microwave electron devices. The final chapter deals with microwave devices with resonator or delay line circuits. This book is a valuable resource for light electrical engineers. Students specializing in the microwave field will also find this book useful.

    • Advances in Imaging and Electron Physics

      • 1st Edition
      • Volume 136
      • June 15, 2005
      • Peter W. Hawkes
      • English
      • eBook
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      Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

    • Advances in Imaging and Electron Physics

      • 1st Edition
      • Volume 127
      • July 31, 2003
      • Peter W. Hawkes
      • English
      • Paperback
        9 7 8 0 1 2 4 1 1 1 8 1 3
      • Hardback
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      • eBook
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      The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

    • Angle-Resolved Photoemission

      • 1st Edition
      • Volume 74
      • May 15, 1992
      • S.D. Kevan
      • English
      • eBook
        9 7 8 0 0 8 0 8 8 7 4 6 3
      Angle-resolved photoemission has become an indispensable tool for solid state and surface physicists and chemists. This book covers the underlying phenomenology of the technique, reviews its application to existing problems, and discusses future applications. The book is particularly timely given the significant improvements in experimental and theoretical methodology which have recently been or soon will be attained, namely, ultrahigh resolution studies using improved sources of synchrotron radiation, quasiparticle interpretation of measured dispersion relations and spectra, in situ growth of novel materials, etc. The technique has been applied predominantly to understand materials for which the one-electron paradigm is a reasonable approximation. Most chapters discuss this type of experiment: 2D and 3D states in metals and semiconductors, extrinsic states induced by adsorption, etc. Applications of the technique to materials where electron correlation plays a comparable role to that of solid state hybridization, ferro- and antiferromagnets, high Tc superconductors, etc. are rapidly growing in popularity. These areas are also discussed and a foundation is laid for further experiments in this direction.Almost all chapters contain comprehensive bibliographies and compendia of systems studied. The book has an extensive index which cross references applications and systems studied.