Skip to main content
Elsevier
View Cart
Your Account

Books in Electron states

BooksJournals

Fundamentals of Microwave Electronics

  • 1st Edition
  • June 20, 2014
  • V. N. Shevchik
  • W. A. Gambling
  • English
  • eBook
    9 7 8 - 1 - 4 8 3 1 - 9 4 7 6 - 9
Electronics and Instrumentation, Volume 16: Fundamentals of Microwave Electronics provides an understanding of the phenomena that occur in the physics and technology of microwave electron devices. This book presents a systematic examination of the physical processes that take place in microwave electron devices. Organized into three parts encompassing seven chapters, this volume begins with an overview of oscillatory systems used in microwave electron devices. This text then explains the two fundamental methods of producing density modulation of an electron beam. Other chapters consider the energy exchange between an electron beam and an alternating electric field, which is associated with a change in electron kinetic energy. This book discusses as well the basic operational principles of the various microwave electron devices. The final chapter deals with microwave devices with resonator or delay line circuits. This book is a valuable resource for light electrical engineers. Students specializing in the microwave field will also find this book useful.

Advances in Imaging and Electron Physics

  • 1st Edition
  • Volume 136
  • June 29, 2005
  • Peter W. Hawkes
  • English
  • eBook
    9 7 8 - 0 - 0 8 - 0 4 5 8 5 5 - 7
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

  • 1st Edition
  • Volume 132
  • September 28, 2004
  • Peter W. Hawkes
  • English
  • eBook
    9 7 8 - 0 - 0 8 - 0 4 9 3 2 7 - 5
The series bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes it essential reading.This volume looks at theory and it’s application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and electron physics and apply them to realistic practical situations.

Advances in Imaging and Electron Physics

  • 1st Edition
  • Volume 130
  • May 4, 2004
  • Peter W. Hawkes
  • English
  • eBook
    9 7 8 - 0 - 0 8 - 0 4 9 3 2 6 - 8
The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

Advances in Imaging and Electron Physics

  • 1st Edition
  • Volume 127
  • July 31, 2003
  • Peter W. Hawkes
  • English
  • Hardback
    9 7 8 - 0 - 1 2 - 0 1 4 7 6 9 - 4
  • eBook
    9 7 8 - 0 - 0 8 - 0 4 9 0 0 7 - 6
The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

Angle-Resolved Photoemission

  • 1st Edition
  • Volume 74
  • May 15, 1992
  • S.D. Kevan
  • English
  • eBook
    9 7 8 - 0 - 0 8 - 0 8 8 7 4 6 - 3
Angle-resolved photoemission has become an indispensable tool for solid state and surface physicists and chemists. This book covers the underlying phenomenology of the technique, reviews its application to existing problems, and discusses future applications. The book is particularly timely given the significant improvements in experimental and theoretical methodology which have recently been or soon will be attained, namely, ultrahigh resolution studies using improved sources of synchrotron radiation, quasiparticle interpretation of measured dispersion relations and spectra, in situ growth of novel materials, etc. The technique has been applied predominantly to understand materials for which the one-electron paradigm is a reasonable approximation. Most chapters discuss this type of experiment: 2D and 3D states in metals and semiconductors, extrinsic states induced by adsorption, etc. Applications of the technique to materials where electron correlation plays a comparable role to that of solid state hybridization, ferro- and antiferromagnets, high Tc superconductors, etc. are rapidly growing in popularity. These areas are also discussed and a foundation is laid for further experiments in this direction.Almost all chapters contain comprehensive bibliographies and compendia of systems studied. The book has an extensive index which cross references applications and systems studied.