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Advances in Imaging and Electron Physics
- 1st Edition, Volume 136 - June 29, 2005
- Author: Peter W. Hawkes
- Language: English
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 4 5 8 5 5 - 7
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series… Read more
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Request a sales quoteAdvances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Chapter 1 - Real and Complex PDE Based Schemes for Image Shaprening and Enhancement (GILBOA, SOCHEN and ZEEVI);Chapter 2 - The S - State Model for Electron Channeling in High Resolution Electron Microscopyv(GEUENS and VAN DYCK);Chapter 3 - Measurement of Electric Fields on Object Surface in an Emission Electron Microscope (NEPIJKO, SEDOV and SCHONHENSE)
- No. of pages: 352
- Language: English
- Edition: 1
- Volume: 136
- Published: June 29, 2005
- Imprint: Academic Press
- eBook ISBN: 9780080458557
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France