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Books in Microelectronics

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Microprocessor Interfacing

  • 1st Edition
  • March 26, 1990
  • R E Vears
  • English
  • eBook
    9 7 8 - 1 - 4 8 3 1 - 4 2 1 2 - 8
Microprocessor Interfacing provides the coverage of the Business and Technician Education Council level NIII unit in Microprocessor Interfacing (syllabus U86/335). Composed of seven chapters, the book explains the foundation in microprocessor interfacing techniques in hardware and software that can be used for problem identification and solving. The book focuses on the 6502, Z80, and 6800/02 microprocessor families. The technique starts with signal conditioning, filtering, and cleaning before the signal can be processed. The signal conversion, from analog to digital or vice versa, is explained to answer why conversion is necessary for the microcomputer or processor. The types of analogue to digital converter, voltage measurements, scaling, and interfacing with ADC to a microcomputer are all taken into account. After the signal has been converted into readable data, the date transfer techniques are described. For data between systems and subsystems to be efficient, the timing, electrical, I/O lines, serial data, and bus structure should be considered. A more detailed explanation of parallel I/O controllers as applied to Z80 PIO and the 6821 PIA follows. For serial I/O controllers, the serial data transfers, speed in baud rate, software routines, and ASCII codes are all examined. Finally, the dedicated I/O controllers involving keyboard encoding, the ASCII (QWERTY) keyboard interface, the visual display unit, cathode ray tube controller devices, and the drive controllers are discussed, as each of these requires one specific application. This book is useful for computer engineers, software engineers, computer technicians, teachers, and instructors in the field of computing learning. This text can also be an informative reading for those have great interest in computer hardware.

Science and Technology of Defects in Silicon

  • 1st Edition
  • Volume 9
  • February 1, 1990
  • C.A.J. Ammerlaan + 2 more
  • English
  • eBook
    9 7 8 - 0 - 0 8 - 0 9 8 3 6 4 - 6
This volume reviews recent developments in the materials science of silicon. The topics discussed range from the fundamental characterization of the physical properties to the assessment of materials for device applications, and include: crystal growth; process-induced defects; topography; hydrogenation of silicon; impurities; and complexes and interactions between impurities.In view of its key position within the conference scope, several papers examine process induced defects: defects due to ion implantation, silicidation and dry etching, with emphasis being placed on the device aspects. Special attention is also paid to recent developments in characterization techniques on epitaxially grown silicon, and silicon-on-insulators.

SEM Microcharacterization of Semiconductors

  • 1st Edition
  • Volume 12
  • January 28, 1989
  • D. B. Holt + 1 more
  • English
  • eBook
    9 7 8 - 1 - 4 8 3 2 - 8 8 6 7 - 3
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.

Dry Etching for Microelectronics

  • 1st Edition
  • January 1, 1984
  • R.A. Powell
  • English
  • eBook
    9 7 8 - 0 - 0 8 - 0 9 8 3 5 8 - 5
This volume collects together for the first time a series of in-depth, critical reviews of important topics in dry etching, such as dry processing of III-V compound semiconductors, dry etching of refractory metal silicides and dry etching aluminium and aluminium alloys. This topical format provides the reader with more specialised information and references than found in a general review article. In addition, it presents a broad perspective which would otherwise have to be gained by reading a large number of individual research papers. An additional important and unique feature of this book is the inclusion of an extensive literature review of dry processing, compiled by search of computerized data bases. A subject index allows ready access to the key points raised in each of the chapters.