Books in Design manufacturing and testing

21-24 of 24 results in All results

Digital Storage Oscilloscopes

• 1st Edition
• January 9, 1997
• Ian Hickman
• English
• eBook 978-0-08-050451-3

  9 7 8 - 0 - 0 8 - 0 5 0 4 5 1 - 3

Digital storage oscilloscopes have long since completely supplanted analog storage oscilloscopes and have reached a degree of sophistication and performance which enable them to rival the most advanced real time oscilloscopes. In this comprehensive handbook, which provides a practical vade mecum for the engineer, Ian Hickman describes how they work and how to use them to best advantage.A wide range of models is available. This book includes a guide to all makes and models and will be best kept beside the instrument for instant reference. It will also be a most helpful guide to the subject for students and trainees. Ian Hickman is an experienced designer and author of best-selling titles including 'Oscilloscopes: How to Use Them, How They Work', Newnes Practical Radio Frequency Handbook', 'Analog Electronics' and 'Analog Circuits Cookbook'.

Op Amps: Design, Application, and Troubleshooting

• 2nd Edition
• February 27, 1996
• David Terrell
• English
• eBook 978-0-08-051308-9

  9 7 8 - 0 - 0 8 - 0 5 1 3 0 8 - 9

OP Amps deliberately straddles that imaginary line between the technician and engineering worlds. Topics are carefully addressed on three levels: operational overview, numerical analysis, and design procedures. Troubleshooting techniques are presented that rely on the application of fundamental electronics principles. Systematic methods are shown that can be used to diagnose defects in many kinds of circuits that employ operational amplifiers. One of the book's greatest strengths is the easy-to-read conversational writing style. The author speaks directly to the student in a manner that encourages learning. This book explains the technical details of operational amplifier circuits in clear and understandable language without sacrificing technical depth.

Principles of Semiconductor Network Testing

• 1st Edition
• June 5, 1995
• Amir Afshar
• English
• eBook 978-0-08-053956-0

  9 7 8 - 0 - 0 8 - 0 5 3 9 5 6 - 0

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Handbook of VLSI Microlithography

• 1st Edition
• January 1, 1991
• William B. Glendinning + 1 more
• English
• Hardback 978-0-8155-1281-3

  9 7 8 - 0 - 8 1 5 5 - 1 2 8 1 - 3
• eBook 978-1-4377-2822-4

  9 7 8 - 1 - 4 3 7 7 - 2 8 2 2 - 4

This handbook gives readers a close look at the entire technology of printing very high resolution and high density integrated circuit (IC) patterns into thin resist process transfer coatings-- including optical lithography, electron beam, ion beam, and x-ray lithography. The book's main theme is the special printing process needed to achieve volume high density IC chip production, especially in the Dynamic Random Access Memory (DRAM) industry. The book leads off with a comparison of various lithography methods, covering the three major patterning parameters of line/space, resolution, line edge and pattern feature dimension control. The book's explanation of resist and resist process equipment technology may well be the first practical description of the relationship between the resist process and equipment parameters. The basics of resist technology are completely covered -- including an entire chapter on resist process defectivity and the potential yield limiting effect on device production. Each alternative lithographic technique and testing method is considered and evaluated: basic metrology including optical, scanning-electron-microscope (SEM) techniques and electrical test devices, along with explanations of actual printing tools and their design, construction and performance. The editor devotes an entire chapter to today's sophisticated, complex electron-beam printers, and to the emerging x-ray printing technology now used in high-density CMOS devices. Energetic ion particle printing is a controllable, steerable technology that does not rely on resist, and occupies a final section of the handbook.