Journals in Design manufacturing and testing

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Microelectronics Journal

• ISSN: 0026-2692
• 5 Year impact factor: 1.7
• Impact factor: 1.9

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers microelectronics device, circuits and systems. This topic includes but is not limited to• Analog, digital, mixed, and RF integrated circuits and related design methodologies • Semiconductor memory, such as RRAM, MRAM, FLASH, PCRAM , etc • Microelectronic devices , modeling and device physics • Semiconductor optoelectronic devices and integrated technology • Wide band gap semiconductor materials, devices and circuits • TSV, TGV, 3D-ICs, SIP and related technology • Integrated circuit design automation technology ( EDA ) • SOC, NoC design, analysis and test • Artificial intelligence integrated circuits and design methodology • Testing, design for testability (DFT), built-in self-test for integrated circuits • Integrated circuit hardware security • Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, TFET, NC-FET ,etc.Benefits to authors We provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications, and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or assistance, see our support pages at https://service.elsevier.com

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Microelectronics Reliability

• ISSN: 0026-2714
• 5 Year impact factor: 1.6
• Impact factor: 1.6

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. All contributions are subject to peer review by leading experts in the field. Special issues are devoted to significant international conferences, or to important developing topics.Microelectronics Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.

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