Journals in Instrumentation

Flow Measurement and Instrumentation

ISSN: 0955-5986
5 Year impact factor: 2.2
Impact factor: 2.3

Flow Measurement and Instrumentation is dedicated to disseminating the latest research results on all aspects of flow measurement, in both closed conduits and open channels. The design of flow measurement systems involves a wide variety of multidisciplinary activities including modelling the flow sensor, the fluid flow and the sensor/fluid interactions through the use of computation techniques; the development of advanced transducer systems and their associated signal processing and the laboratory and field assessment of the overall system under ideal and disturbed conditions.FMI is the essential forum for critical information exchange, and contributions are particularly encouraged in the following areas of interest:Modelling: the application of mathematical and computational modelling to the interaction of fluid dynamics with flowmeters, including flowmeter behaviour, improved flowmeter design and installation problems. Application of CAD/CAE techniques to flowmeter modelling are eligible.Design and development: the detailed design of the flowmeter head and/or signal processing aspects of novel flowmeters. Emphasis is given to papers identifying new sensor configurations, multisensor flow measurement systems, non-intrusive flow metering techniques and the application of microelectronic techniques in smart or intelligent systems.Calibration techniques: including descriptions of new or existing calibration facilities and techniques, calibration data from different flowmeter types, and calibration intercomparison data from different laboratories.Installation effect data: dealing with the effects of non-ideal flow conditions on flowmeters. Papers combining a theoretical understanding of flowmeter behaviour with experimental work are particularly welcome.Multiphase behaviour: whether purpose-designed, or adapted from single-phase operation, coverage of systems for single-phase liquid and gas flows, multiphase flows having solid, liquid and gas phases, and slurries and pastes is equally welcome.Associated measurements and secondary instrumentation: for example, density, viscosity and secondary instrumentation effects.All contributions are subject to peer review, and additional features include: Review articles Case studies Letters to the editor Patent surveys Book reviews Calendar of events and conference reportsFlow Measurement and Instrumentation is essential reading for instrumentation engineers in the oil, gas, power, chemical, food, water and waste treatment industries, manufacturers of flowmeters, and academics involved in research in this area.

ISA Transactions

ISSN: 0019-0578
5 Year impact factor: 5.9
Impact factor: 6.3

Published by the ISAISA Transactions is a journal of advances and state-of-the-art in the science and engineering of measurement and automation, of value to leading-edge industrial practitioners and applied researchers.The topics of measurement include: sensors, perception systems, analyzers, signal processing, filtering, data compression, data rectification, fault detection, inferential measurement, soft sensors, hardware interfacing, etc.; and any of the techniques that support them such as artificial intelligence, fuzzy logic, communication systems, and process analysis. The topics of automation include: statistical and deterministic strategies for discrete event and continuous process control, modelling and simulation, event triggers, scheduling and sequencing, system reliability, quality, maintenance, management, loss prevention, etc.; and any equipment, techniques and best practices that support them such as optimization, learning systems, strategy development, security, and human interfacing and training.The intended audience is research and development personnel from academe and industry in the fields of control systems, process instrumentation, systems, and automation.The journal seeks to bridge the theory and practice gap. This balance of interests requires simplicity of technique, credible demonstration, fundamental grounding, and connectivity to the state of the art in both theory and practice.If you would like more information please visit the ISA Transactions society homepageBenefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

International Journal of Mass Spectrometry

ISSN: 1387-3806
5 Year impact factor: 1.6
Impact factor: 1.6

The journal invites papers that advance the field of mass spectrometry by exploring fundamental aspects of ion processes using both the experimental and theoretical approaches, developing new instrumentation and experimental strategies for chemical analysis using mass spectrometry, developing new computational strategies for data interpretation and integration, reporting new applications of mass spectrometry and hyphenated techniques in biology, chemistry, environmental sciences, geology, and physics. Papers, in which standard mass spectrometry techniques are used for analysis will not be considered. IJMS publishes full-length articles, short communications, reviews, and feature articles including young scientist features.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

International Journal of Mass Spectrometry

Measurement

ISSN: 0263-2241
5 Year impact factor: 4.8
Impact factor: 5.2

Journal of the International Measurement Confederation (IMEKO)Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material representing achievements in the field, whose ultimate goal is an enhancement of the state-of-the-art of subjects such as: measurement and metrology fundamentals, measurement science, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures for performance analysis of measurement systems, processes and algorithms, mathematical models for measurement-oriented purposes, and distributed measurement systems in a connected world.Notes:Papers including measurement results that, although important to validate any given scientific study but which offer no new insights in an area different from measurement science or technology, do not fall within the scope of this journal;The disciplined usage of well-known metrological terms is strongly required. Authors can access information on all relevant terms such as measurement accuracy, uncertainty, the law of propagation of uncertainty and other, similar terms: these are defined in internationally approved guidelines such as the International Vocabulary of Metrology (VIM) and Guide to the Expression of Uncertainty in Measurement (GUM), which are freely available on https://www.bipm.org/en/publications/guides/;The paper must clearly describe the measurement context in which the research was carried out by undertaking a critical review of the state-of-the-art of the relevant body of knowledge in instrumentation and measurement and by showing how the research presented advances it;The letter accompanying the submission must describe clearly how the paper satisfies the above requirements.Papers that focus on image processing or fault diagnosis with little or no elements of measurement science or technology will not be considered within the journal scope.Authors please note: The journal Measurement is receiving an increasing number of papers in the area of machine learning/neural networks and other techniques based on artificial intelligence. These submissions will be desk rejected unless they:prove that the described research advances the state-of-the-art in measurement science and is not just an application of an available tool to known or novel problems, that is used without an appreciation of measurement-related aspects;show that the usage of these tools is put into the correct measurement-related context and not just in the context of machine-learning/neural network applications;contain enough information about the used tools, data, and results to allow, in principle, anyone to replicate the described results;display the use of specific metrics to strengthen the results of research activities.It must be recalled that Measurement is interested in publishing new methods, techniques, procedures, algorithms, and alike that show how to better measure in nature and in the world. Thus, the capability to describe metrological-related details of the proposed research represents a major difference between papers published by this journal and by other journals publishing papers on similar topics. This major difference must be evident also in papers covering applications of machine learning and soft computing techniques. Failing to adhere to these guidelines will result in a paper desk-reject decision.Authors whose manuscripts focus on the research, development and application of the science, engineering and technology of sensors and sensor systems, are welcome to submit to the journal's open access companion title, Measurement: Sensors .Authors whose manuscripts focus on food and nutrition measurements may also wish to submit to the journal's second open access companion title, Measurement: Food.Authors whose manuscripts focus on energy sources, heat and power generation and all other relevant fields may be interested to submit to the journal's third open access companion title, Measurement: Energy.

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ISSN: 0168-9002
5 Year impact factor: 1.4
Impact factor: 1.5

Nuclear Instruments and Methods in Physics Research - section A (NIM-A) publishes papers on design, development and performance of scientific instruments including complex detector systems and large-scale facilities which utilize or study ionizing radiation. This scope includes the development of particle accelerators, particle beam sources, beam transport systems and target arrangements as well as the use of secondary phenomena and their enabling instruments such as neutron sources, synchrotron radiation sources and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as innovative instrumentation for nuclear reactors, nuclear security, nuclear medical diagnoses and therapy, astrophysics, planetary science, and environmental protection. Specialized electronics for these instruments as well as computerization of measurements and control systems in this area also find their place in NIM-A, as do new simulation codes and analysis tools*). Theoretical as well as experimental papers are accepted. *) We receive an increasing number of submissions that are based exclusively on simulated data generated by standard codes such as ANSYS, Geant4, MAFIA, to name a few. Often the codes are used in a black-box manner to simulate relatively simple concepts and geometries without any validation of the results. Such submissions if found to fall short of our thresholds for originality and innovation may be rejected. We face a similar situation related to the use of standard neural networks (deep learning) that are used to analyse all kinds of data (experimental or Monte-Carlo generated). Unless there is a clear motivation and a significant performance increase compared to a conventional analysis, such submissions may be rejected without starting the review process. Sponsored issues publication: The journal Nuclear Instruments and Methods in Physics Research offers authors the option of rapid publication in (thematic) special issues. For more information please click here. Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services. Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Centre.

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

ISSN: 0168-583X
5 Year impact factor: 1.3
Impact factor: 1.4

NIM-B accepts original manuscripts on the fundamental interactions between energetic particle beams and matter, along with related technologies and applications.Relevant manuscripts will address one or more of the following areas:Interactions between matter and beams of charged or neutral particles: Atoms, molecules, atomic clusters, neutrons, photons, electrons, and ions.Experimental, theoretical and modelling work concerning fundamental interaction cross sections and derived information such as stopping powers, defect formation, thermodynamics and kinetics data.Beam-enhanced synthesis and modification of classical and quantum materials as well as surfaces treated with laser-, electron- and high intensity ion beams. This includes radiation-induced amorphization, crystallization, and other microstructural developments resulting from defect production and annealing, controlled modification of physical and chemical properties by ion implantation, micro and nano-structuring of surfaces as well as creation of structures far from thermal equilibrium, such as supersaturated solid solutions and ion tracks.The behaviour of materials subjected to ionising radiation of all kinds as well as the stability of materials exposed to various high radiation environments, including space, fission and fusion reactors, together with basic studies of initial defect generation, defect diffusion and annihilation, phase transformations, atomic clustering and bubble formation, and radiation damage in general.The fundamental physics and technical development of materials analysis using energetic beams - including all forms of ion beam analysis, accelerator mass spectrometry, positron annihilation spectroscopy, neutron scattering and diffraction, as well as synchrotron-based methods.Applications show-casing analytical capabilities or introducing novel possibilities across the whole range from analysis of biological tissues, materials of relevance to earth and planetary sciences, environmental science, materials science, cultural heritage materials, and thin films.Developments in ion beam instrumentation such as sources, optics, small accelerators, charged particle, neutron, X-ray and gamma-ray detectors, data acquisition, simulations, and computer programs enabling new capabilities relevant to the scientific scope of the journal.If this journal seems like a good fit for your research, you can find more information on submission in the Guide for Authors Guide for Authors.Special issues publication: The journal NIM-B offers interested parties the option of publication in topical special issues (including selected works from conferences). For more information please contact our special content specialist or the relevant editor.If you require any further information or help, please visit our Support Center.

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Sensors and Actuators A: Physical

ISSN: 0924-4247
5 Year impact factor: 4
Impact factor: 4.1

An international journal devoted to research and development of physical transducersSensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas:• Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results.• Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon.• Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays.• Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers.• Thermal sensors, such as: platinum resistors, thermistors, diode temperature sensors, silicon transistor thermometers, integrated temperature transducers, PTAT circuits, thermocouples, thermopiles, pyroelectric thermometers, quartz thermometers, power transistors and thick-film thermal print heads.• Magnetic sensors, such as: magnetoresistors, Corbino disks, magnetodiodes, Hall-effect devices, integrated Hall devices, silicon depletion-layer magnetometers, magneto-injection transistors, magnistors, lateral magnetotransistors, carrier-domain magnetometers, MOS magnetic-field sensors, solid-state read and write heads.• Micromechanics, such as: research papers on actuators, structures, integrated sensors-actuators, microsystems, and other devices or subdevices ranging in size from millimetres to sub-microns; micromechatronics; microelectromechanical systems; microoptomechanical systems; microchemomechanical systems; microrobots; silicon and non-silicon fabrication techniques; basic studies of physical phenomena of interest to micromechanics; analysis of microsystems; exploration of new topics and materials related to micromechanics; microsystem-related problems like power supplies and signal transmission, microsystem-related simulation tools; other topics of interest to micromechanics.• Interface electronics: electronic circuits which are designed to interface directly with the above transducers and which are used for improving or complementing the characteristics of these devices, such as linearization, A/D conversion, temperature compensation, light-intensity compensation, current/frequency conversion and microcomputer interfacing.• Sensor Systems and Applications, such as: sensor buses, multiple-sensor systems, sensor networks, voting systems, telemetering, sensor arrays, and automotive, environmental, monitoring and control, consumer, medical, alarm and security, robotic, nautical, aeronautical and space measurement systems.

Thin Solid Films

ISSN: 0040-6090
5 Year impact factor: 1.9
Impact factor: 2

International Journal on the Science and Technology of Condensed Matter Films Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin film synthesis, characterization, modelling, and applications. The topical scope of Thin Solid Films reflects a wide range of thin film related themes: Thin film synthesis, with particular emphasis on the control of growth for desired physical propertiesSurfaces and interfacesSolar energy conversionCatalysisBatteries and other electrochemical devicesMetallurgical, protective, and hard coatingsElectronics, optics, and opto-electronicsMagnetics and magneto-opticsSuperconductivityNote to authors Contributions to Thin Solid Films should concern thin films and their potential applications. Details of film synthesis are required, together with the reproducibility of achieved results. Simulations should always be compared with corresponding original or published experimental data.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

Ultramicroscopy

ISSN: 0304-3991
5 Year impact factor: 2.3
Impact factor: 2.1

An international journal affiliated with MSA, ISEM, SCANDEM, NVEM, SGOEM, SIME-SM, DGE, MSC, ASEM and MSSA, committed to the advancement of new methods, tools and theories in microscopyUltramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.Electron MicroscopyInstrumentationMethod developmentImaging and scattering theoryComputational methodsImage processing and analysisAuthors are encouraged to contact the Editor in Chief directly at [email protected] to discuss Review proposals in the first instance possible, as these are by invitation only.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

Vacuum

ISSN: 0042-207X
5 Year impact factor: 3.5
Impact factor: 3.8

Vacuum is an international rapid publications journal with a focus on short communication. All papers are peer-reviewed, with the review process for short communication geared towards very fast turnaround times. The journal also published full research papers, thematic issues and selected papers from leading conferences.A report in Vacuum should represent a major advance in an area that involves a controlled environment at pressures of one atmosphere or below.The scope of the journal includes: 1. Vacuum; original developments in vacuum pumping and instrumentation, vacuum measurement, vacuum gas dynamics, gas-surface interactions, surface treatment for UHV applications and low outgassing, vacuum melting, sintering, and vacuum metrology. Technology and solutions for large-scale facilities (e.g., particle accelerators and fusion devices). New instrumentation ( e.g., detectors and electron microscopes). 2. Plasma science; advances in PVD, CVD, plasma-assisted CVD, ion sources, deposition processes and analysis. 3. Surface science; surface engineering, surface chemistry, surface analysis, crystal growth, ion-surface interactions and etching, nanometer-scale processing, surface modification. 4. Materials science; novel functional or structural materials. Metals, ceramics, and polymers. Experiments, simulations, and modelling for understanding structure-property relationships. Thin films and coatings. Nanostructures and ion implantation.The aim of the short communications is to enable researchers to rapidly share their most exciting work with their colleagues. The expected time from submission to final decision is approximately 6.4 weeks.Benefits to authors We also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center

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