Micron

The International Research and Review Journal for Microscopy

Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal publishes research papers on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on light optical, electron-beam, X-ray microtomography, ion microscopy and scanning-probe imaging.

It also carries review papers, short communications, thematic issues on contemporary developments in microscopy & microanalysis, as well as tutorial papers describing microscopy techniques for current practitioners or newcomers in the field. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.

Authors are encouraged to contact one of the Editors directly to discuss Review or Tutorial proposals.