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Integration

  • Annual issues: 6 volumes, 6 issues

  • ISSN: 0167-9260

the VLSI JournalIntegration's aim is to cover every aspects of the VLSI (very large-scale integration) area, with an emphasis on the design, verification, test, and ele… Read more

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the VLSI Journal

Integration's aim is to cover every aspects of the VLSI (very large-scale integration) area, with an emphasis on the design, verification, test, and electronic design automation (EDA) technologies of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed technical articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:

Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous and reconfigurable systems; Emerging device and interconnect technologies; Emerging architectures, systems and models of computation; EDA for quantum computing systems.