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Elsevier

VLSI Test Principles and Architectures

Design for Testability

  • 1st Edition - July 7, 2006
  • Latest edition
  • Authors: Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
  • Language: English

Product details

  • Edition: 1
  • Latest edition
  • Published: December 6, 2014
  • Language: English

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