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VLSI Test Principles and Architectures

Design for Testability

1st Edition - July 7, 2006

Authors: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

Hardback ISBN:
9 7 8 - 0 - 1 2 - 3 7 0 5 9 7 - 6
eBook ISBN:
9 7 8 - 0 - 0 8 - 0 4 7 4 7 9 - 3

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and… Read more

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.