VLSI Electronics: Microstructure
- 1st Edition, Volume 22 - December 5, 2014
- Author: Anant G. Sabnis
- Language: English
- Paperback ISBN:9 7 8 - 1 - 4 9 3 3 - 0 6 9 8 - 5
- eBook ISBN:9 7 8 - 1 - 4 8 3 2 - 9 6 5 8 - 6
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad… Read more
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
Industrial and university researchers and graduate students in electrical engineering.
Introduction. Reliability Concepts and Modeling. Electrostatic Discharge Damage. Metal Electromigration. Dielectric Breakdown. Instabilities in ICs. Packaging Related Reliability Issues. Reliability Assurance and Qualification. Each chapter includes references. Index.
- Edition: 1
- Volume: 22
- Published: December 5, 2014
- Language: English
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