VLSI Electronics: Microstructure
- 1st Edition, Volume 22 - March 28, 1990
- Latest edition
- Author: Anant G. Sabnis
- Language: English
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad… Read more
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Description
Description
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Key features
Key features
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
Readership
Readership
Industrial and university researchers and graduate students in electrical engineering.
Table of contents
Table of contents
Introduction. Reliability Concepts and Modeling. Electrostatic Discharge Damage. Metal Electromigration. Dielectric Breakdown. Instabilities in ICs. Packaging Related Reliability Issues. Reliability Assurance and Qualification. Each chapter includes references. Index.
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 22
- Published: July 10, 2014
- Language: English
View book on ScienceDirect
View book on ScienceDirect
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