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The Spectroscopy of Semiconductors

  • 1st Edition, Volume 36 - July 7, 1992
  • Editors: Christopher L. Littler, R. K. Willardson, Eicke R. Weber, David G. Seiler, Albert C. Beer
  • Language: English
  • eBook ISBN:
    9 7 8 - 0 - 0 8 - 0 8 6 4 3 3 - 4

Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic… Read more

The Spectroscopy of Semiconductors

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Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures.