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Scanning Nonlinear Dielectric Microscopy

Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

1st Edition - May 20, 2020

Author: Yasuo Cho

Language: English
Paperback ISBN:
9 7 8 - 0 - 1 2 - 8 1 7 2 4 6 - 9
eBook ISBN:
9 7 8 - 0 - 0 8 - 1 0 2 8 0 3 - 2

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to c… Read more

Scanning Nonlinear Dielectric Microscopy

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Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials.

The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.