Coulomb Interactions in Particle Beams
- 1st Edition, Volume 230 - October 10, 2024
- Imprint: Academic Press
- Author: Guus Jansen
- Editors: Peter W. Hawkes, Martin Hÿtch
- Language: English
- Hardback ISBN:9 7 8 - 0 - 4 4 3 - 2 9 7 8 4 - 7
- eBook ISBN:9 7 8 - 0 - 4 4 3 - 2 9 7 8 5 - 4
Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in E… Read more
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Request a sales quoteCoulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
Physicists, electrical engineers, applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- Coulomb Interactions in Particle Beams
- Cover image
- Title page
- Table of Contents
- Series Page
- Copyright
- Preface
- Chapter One Introduction
- Abstract
- Keywords
- 1.1 Introduction
- 1.2 Focused particle beam systems
- 1.3 Classification of interaction phenomena
- 1.4 Organization of the chapters
- References☆
- Chapter Two Historical notes
- Abstract
- Keywords
- 2.1 Introduction
- 2.2 Particle optics and particle interactions
- 2.3 Boersch effect
- 2.4 Trajectory displacement effect
- 2.5 Space charge effect in low density particle beams
- 2.6 Monte Carlo simulation
- References☆
- Chapter Three General beam properties
- Abstract
- Keywords
- 3.1 Introduction
- 3.2 Beam parameters
- 3.3 Classification of beams
- 3.4 Hamilton's formalism and Liouville's theorem
- 3.5 Boltzmann equation
- 3.6 Conservation of beam emittance and brightness
- 3.7 Beam temperature
- 3.8 Thermodynamic limits for particle interaction effects
- 3.9 Debeye screening
- 3.10 Potential energy relaxation
- References☆
- Chapter Four The many body problem of particles interacting through an Inverse Square force law
- Abstract
- Keywords
- 4.1 Introduction
- 4.2 Vlasov equation
- 4.3 Fokker–Planck equation
- 4.4 Aspects of the diffusion approximation
- 4.5 Calculation of coefficients of dynamical friction and diffusion
- 4.6 Coulomb logarithm
- 4.7 Discussion of the Fokker–Planck approach
- 4.8 Validity of the Fokker–Planck approach for particle beams
- 4.9 Holtsmark distribution
- 4.10 Conclusions
- References☆
- Chapter Five Concepts of an analytical model for statistical interactions in particle beams
- Abstract
- Keywords
- 5.1 Introduction
- 5.2 General formulation of the problem
- 5.3 Reduction of the N-particle problem
- 5.3.1 First order perturbation approximation
- 5.3.2 Closest encounter approximation
- 5.3.3 Extended two-particle approximation
- 5.3.4 Mean square field fluctuation approximation
- 5.4 Calculation of the displacement distribution
- 5.5 Moments and cumulants of the displacement distribution
- 5.6 On- and off-axis reference trajectories
- 5.7 Models in one, two, and three dimensions
- 5.8 Distribution of the interaction force in cylindrical beams
- 5.9 Representation in the k-domain
- 5.10 Addition of the effects generated in individual beam segments
- 5.11 Slice method
- References☆
- Chapter Six Two-particle dynamics
- Abstract
- Keywords
- 6.1 Introduction
- 6.2 Basic properties
- 6.3 Coordinate representation in the orbital plane
- 6.4 Dynamics of a complete collision
- 6.5 General analysis of the two-particle dynamical problem
- 6.6 Numerical approach to the dynamical problem
- 6.7 Dynamics of a nearly complete collision
- 6.8 First order perturbation dynamics
- 6.9 Collisions with zero initial relative velocity
- 6.10 Expressions for the longitudinal velocity shift Δvz
- 6.11 Expressions for the transverse velocity shift Δv⊥
- 6.12 Expressions for the spatial shift Δr
- 6.13 Coulomb scaling
- Appendix 6.A. Mathematics of nearly complete collision dynamics
- References☆
- Chapter Seven Boersch effect
- Abstract
- Keywords
- 7.1 Introduction
- 7.2 General aspects
- 7.3 Beam segment with a narrow crossover
- 7.4 Homocentric cylindrical beam segment
- 7.5 Beam segment with a crossover of arbitrary dimensions
- 7.6 Results for Gaussian angular and spatial distributions
- 7.7 Thermodynamic limits
- Chapter Eight Statistical angular deflections
- Abstract
- Keywords
- 8.1 Introduction
- 8.2 General aspects
- 8.3 Beam segment with a narrow crossover
- 8.4 Homocentric cylindrical beam segment
- 8.5 Beam segment with a crossover of arbitrary dimensions
- 8.6 Application of the slice method
- 8.7 Results for Gaussian angular and spatial distributions
- Chapter Nine Trajectory displacement effect
- Abstract
- Keywords
- 9.1 Introduction
- 9.2 General aspects
- 9.3 Homocentric beam segment with a crossover
- 9.4 Homocentric cylindrical beam segment
- 9.5 Beam segment with a crossover of arbitrary dimensions
- 9.6 Trajectory displacement and angular deflection distribution
- 9.7 Results for Gaussian angular and spatial distributions
- References☆
- Chapter Ten Further investigations on statistical interactions
- Abstract
- Keywords
- 10.1 Introduction
- 10.2 Exact approach for off-axis reference trajectories
- 10.3 Approximating approach for off-axis reference trajectories
- 10.4 Nonmonochromatic beams
- 10.5 Beams in an external uniform axial electrostatic field
- 10.6 Relativistic beams
- Appendix 10.A. Distributions for the average reference trajectory
- References☆
- Chapter Eleven Space charge effect in low density particle beams
- Abstract
- Keywords
- 11.1 Introduction
- 11.2 General aspects
- 11.3 Beams with laminar flow
- 11.4 First order perturbation theory
- 11.5 First order optical properties of the space charge lens
- 11.6 Third order geometrical aberrations of the space charge lens
- 11.7 Beam segment with a narrow crossover
- 11.8 Homocentric cylindrical beam segment
- 11.9 Addition of the effects generated in individual beam segments
- References☆
- Chapter Twelve Calculation of different spot- and edge-width measures
- Abstract
- Keywords
- 12.1 Introduction
- 12.2 Spot-width obtained by knife-edge scans
- 12.3 Edge-width of a shaped spot
- 12.4 Trajectory displacement effect
- 12.5 Chromatic aberration
- 12.6 Spherical aberration
- 12.7 Space charge effect
- 12.8 Results for a truncated Gaussian angular distribution
- References☆
- Chapter Thirteen Monte Carlo simulation of particle beams
- Abstract
- Keywords
- 13.1 Introduction
- 13.2 Source routine
- 13.3 Optical elements
- 13.4 Numerical ray tracing
- 13.5 Analytical ray tracing
- 13.6 Simulation of large currents near the source
- 13.7 Correction of finite-size effects
- 13.8 Data analysis
- 13.9 Accuracy limitations of the MC program
- 13.10 MC simulation vs analytical modeling
- 13.11 Program organization and examples
- Appendix 13. A. Random number routine
- Appendix 13. B. Polynomial fit algorithm
- References☆
- Chapter Fourteen Comparison of analytical theory with Monte Carlo simulations
- Abstract
- Keywords
- 14.1 Introduction
- 14.2 General aspects
- 14.3 Voltage and current dependencies for a fixed geometry
- 14.4 Geometry and current dependencies for a fixed beam voltage
- 14.5 Discussion of the results
- References☆
- Chapter Fifteen Comparison of recent theories on statistical interactions
- Abstract
- Keywords
- 15.1 Introduction
- 15.2 Boersch effect
- 15.2.1 Zimmermann and Knauer
- 15.2.2 Loeffler
- 15.2.3 Crewe
- 15.2.4 Rose and Spehr
- 15.2.5 De Chambost and Hennion
- 15.2.6 Sasaki
- 15.2.7 Massey, Jones and Plummer
- 15.2.8 Comparison of theories for a beam segment with a crossover
- 15.3 Statistical angular deflections
- 15.3.1 Loeffler and Hudgin
- 15.3.2 Weidenhausen, Spehr and Rose
- 15.3.3 Massey, Jones and Plummer
- 15.3.4 Comparison of theories for a beam segment with a crossover
- 15.4 Trajectory displacement effect
- 15.4.1 Loeffler and Hudgin
- 15.4.2 De Chambost
- 15.4.3 Spehr
- 15.4.4 Comparison of theories
- 15.5 Conclusions
- References☆
- Chapter Sixteen Summary for the one-minute designer
- Abstract
- Keywords
- 16.1 Introduction
- 16.2 Physical aspects
- 16.3 Parameter dependencies
- 16.4 Equations for the Boersch effect
- 16.5 Equations for the trajectory displacement effect
- 16.6 Equations for the space charge effect
- 16.7 Addition of the effects generated in individual beam segments
- References☆
- References
- Index
- Edition: 1
- Volume: 230
- Published: October 10, 2024
- No. of pages (Hardback): 550
- No. of pages (eBook): 232
- Imprint: Academic Press
- Language: English
- Hardback ISBN: 9780443297847
- eBook ISBN: 9780443297854
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceMH
Martin Hÿtch
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Affiliations and expertise
Senior Scientist, French National Centre for Research (CNRS), Toulouse, FranceGJ
Guus Jansen
Guus Jansen earned both his MSc (1983) and PhD (1988) in Physics from Delft University of Technology, graduating Cum Laude for both degrees. His PhD thesis on "Coulomb Interactions in Particle Beams" won the prestigious Shell Award for the best research project at Delft in 1988. This work was first published by Academic Press in 1990 in the series Advances in Electronics and Electron Physics and is being republished in 2024 in Advances in Electronics and Imaging Physics.
From 1983 to 1985, his first role after earning his MSc was as a postdoctoral researcher at IBM's General Technology Division in New York, focusing on variable-shaped beam electron lithography. After his PhD, he served as a research physicist at the Royal Dutch/Shell Laboratories in Amsterdam (1989–1992), where he led the development and modeling of refinery equipment and chemical processes.
In 1992, he transitioned into strategic consulting as a Senior Management Consultant at Monitor Company (1992–1996), advising top-tier corporations across a range of industries. In 1996, he joined Telfort, a joint venture between British Telecom and Dutch Railways (NS), as Director of Marketing & Business Development. As a member of the board, he oversaw corporate strategy, business planning and development, product development, and management.
Since 2000, Guus has operated as a serial entrepreneur through Caneval Ventures, his business development and investment company. Caneval Ventures has initiated, supported, and led multiple startups and scale-ups in the ICT and renewable energy sectors, with Guus serving as CEO, CCO, and CFO of various companies.
In 2002, Caneval Ventures acquired the IP rights for MonTec and Interac software, both of which were initially developed as part of Guus' PhD research. These software packages have been adopted by leading companies like IBM, Toshiba, Philips, and several universities and research institutions globally. Over the years, Caneval Ventures has provided consultancy to various institutions and companies, specializing in quantifying and mitigating the effects of Coulomb interactions in charged particle systems.
Affiliations and expertise
Caneval Ventures, The NetherlandsRead Coulomb Interactions in Particle Beams on ScienceDirect