Holiday book sale: Save up to 30% on print and eBooks. No promo code needed.
Save up to 30% on print and eBooks.
Relativistic Theory and Calculation of Electrostatic Focusing Systems
1st Edition - June 1, 2024
Editors: Peter W. Hawkes, Martin Hÿtch
9 7 8 - 0 - 4 4 3 - 2 9 7 8 4 - 7
9 7 8 - 0 - 4 4 3 - 2 9 7 8 5 - 4
Advances in Imaging and Electron Physics, Volume 230 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron… Read more
Save 50% on book bundles
Immediately download your ebook while waiting for your print delivery. No promo code is needed.
Advances in Imaging and Electron Physics, Volume 230 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
The contributors in this volume are: Seitkerim Bimurzaev Evgeniy Yakushev
No. of pages: 232
Published: June 1, 2024
Imprint: Academic Press
Hardback ISBN: 9780443297847
eBook ISBN: 9780443297854
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Affiliations and expertise
Senior Scientist, French National Centre for Research (CNRS), Toulouse, France