Skip to main content

Save up to 30% on Elsevier print and eBooks with free shipping. No promo code needed.

Save up to 30% on print and eBooks.

Quantitative Atomic-Resolution Electron Microscopy

1st Edition, Volume 217 - March 31, 2021

Editors: Martin Hÿtch, Peter W. Hawkes

Language: English
Hardback ISBN:
9 7 8 - 0 - 1 2 - 8 2 4 6 0 7 - 8
eBook ISBN:
9 7 8 - 0 - 3 2 3 - 8 5 0 9 3 - 3

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Adva… Read more

Quantitative Atomic-Resolution Electron Microscopy

Purchase options

LIMITED OFFER

Save 50% on book bundles

Immediately download your ebook while waiting for your print delivery. No promo code is needed.

Institutional subscription on ScienceDirect

Request a sales quote
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.