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Principles of Electron Optics, Volume 4
Advanced Wave Optics
- 2nd Edition - May 10, 2022
- Authors: Peter W. Hawkes, Erwin Kasper
- Language: English
- Paperback ISBN:9 7 8 - 0 - 3 2 3 - 9 1 6 4 6 - 2
- eBook ISBN:9 7 8 - 0 - 3 2 3 - 9 1 6 4 7 - 9
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equati… Read more
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Request a sales quotePrinciples of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more.
- Includes authoritative coverage of many recent developments in wave electron optics
- Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques
- Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope
Materials scientists and engineers; Physicists
- Cover image
- Title page
- Table of Contents
- Copyright
- Dedication
- Preface to the Second Edition
- Preface to the First Edition
- Part XIV: Electron–Specimen Interactions
- Chapter 69. Electron–Specimen Interactions
- Abstract
- 69.1 Introduction
- 69.2 Electron Interactions in Amorphous Specimens
- 69.3 Electron Interactions in Crystalline Specimens
- 69.4 Simulation and Structure Retrieval
- 69.5 Multislice Electron Optics
- Part XV: Digital Image Processing
- Chapter 70. Introduction
- Abstract
- 70.1 Organization of the Subject
- 70.2 Image Algebra
- 70.3 Notation
- Chapter 71. Acquisition, Sampling and Coding
- Abstract
- 71.1 Acquisition
- 71.2 Sampling
- 71.3 Quantization
- 71.4 Coding
- 71.5 Electron Optical Considerations
- Chapter 72. Enhancement
- Abstract
- 72.1 Operations on Individual Pixels
- 72.2 Linear Filtering
- 72.3 Nonlinear Filters
- 72.4 Image Algebraic Representation of Enhancement
- 72.5 Enhancement in Electron Microscopy
- Chapter 73. Linear Restoration
- Abstract
- 73.1 Introduction
- 73.2 Extended Wiener Filters
- 73.3 Filtering With Constraints
- 73.4 Hoenders’ Procedure
- 73.5 Recursive Filtering
- 73.6 Other Approaches
- Chapter 74. Nonlinear Restoration – The Phase Problem
- Abstract
- 74.1 Introduction
- 74.2 Extended Linear Approximation
- 74.3 Multiple Recordings (Circular Symmetry)
- 74.4 Analyticity
- 74.5 Maximum Entropy and Related Probabilistic Methods
- 74.6 Exit-Wave Reconstruction
- Chapter 75. Three-Dimensional Reconstruction
- Abstract
- 75.1 Introduction
- 75.2 Methods
- 75.3 Preprocessing
- 75.4 Three-Dimensional Reconstruction in Materials Science
- 75.5 Deep Learning, Machine Learning
- 75.6 Concluding Remarks
- 75.7 Further Reading
- Chapter 76. Image Analysis
- Abstract
- 76.1 Introduction
- 76.2 Digital Geometry
- 76.3 Segmentation and Feature Extraction
- 76.4 Classification
- 76.5 Description
- 76.6 Further Reading
- Chapter 77. Microscope Parameter Measurement and Instrument Control
- Abstract
- 77.1 Introduction
- 77.2 Measurement of Microscope Operating Parameters
- 77.3 Control
- Part XVI: Coherence, Brightness and Spectral Functions
- Chapter 78. Coherence and the Brightness Functions
- Abstract
- 78.1 Introduction
- 78.2 Coherence
- 78.3 Radiometry
- 78.4 The Brightness of Partially Coherent Sources
- 78.5 Consequences for the van Cittert–Zernike Theorem
- 78.6 Eigenfunction Expansions of the Coherence Functions
- 78.7 The Quasi-homogeneous Source
- 78.8 Brightness, Coherence and Quasi-homogeneity
- 78.9 Temporal and Spatial Coherence
- 78.10 Related Work
- 78.11 The Propagation of Coherence Functions
- 78.12 Coherence and Illumination
- 78.13 Degeneracy and Brightness
- 78.14 Further Reading
- Chapter 79. Wigner Optics
- Abstract
- 79.1 Introduction
- 79.2 Image Formation Expressed in Terms of the Wigner Function
- 79.3 Holography
- 79.4 Further Reading
- Part XVII: Vortex Studies, the Quantum Electron Microscope
- Chapter 80. Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope
- Abstract
- 80.1 Introduction
- 80.2 Vortex Beams
- 80.3 Interaction With Magnetic Fields
- 80.4 Production of Vortex Beams
- 80.5 Measurement of Topological Charge
- 80.6 Interactions Between Vortex Beams and Specimens
- 80.7 Lensless Fourier Transform Holography
- 80.8 Further Reading
- 80.9 The Quantum Electron Microscope
- Appendix
- Appendix. Corrections and additions to volumes 1, 2 and 3
- A1 Volume 1
- A2 Volume 2
- A3 Volume 3
- A4 Addenda
- Round lens aberrations
- Combined focusing–deflection systems, deflection aberration coefficients
- Crossed toroidal electrostatic and inhomogeneous magnetic fields (Chapter 38 of volume 2)
- Canonical aberration theory (p. 39 of volume 1)
- Miscellaneous
- The following papers are relevant for the present volume:
- Notes and References
- Part XIV, Chapter 69
- References
- Part XV, Chapters 70–77
- Part XVI, Chapters 78–79
- Part XVII, Chapter 80
- Conference Proceedings
- 1. International Congresses on Electron Microscopy, later International Microscopy Congresses
- 2. European Regional Congresses on Electron Microscopy, later European Microscopy Congresses
- 3. Asia-Pacific Congresses on Electron Microscopy, later Asia–Pacific Microscopy Congresses
- 4. Charged Particle Optics Conferences
- 5. High-voltage Electron Microscopy Conferences
- 6. EMAG [Electron Microscopy and Analysis Group of the Institute of Physics] Meetings
- 7. Multinational Congresses on (Electron) Microscopy (MCEM, MCM)
- 8. The Dreiländertagungen (Germany, Austria, Switzerland) and related meetings
- 9. Recent Trends in Charged Particle Optics and Surface Physics Instrumentation (Skalský Dvůr)
- 10. SPIE Proceedings
- 11. Soviet All-Union Conferences on Electron Microscopy, later Russian Conferences on Electron Microscopy
- 12. Problems of Theoretical and Applied Electron Optics [Problemyi Teoreticheskoi i Prikladnoi Elektronnoi Optiki]
- 13. Mathematical Morphology and Its Applications to Signal and Image Processing
- 14. Related Meetings
- Notes and References
- Index
- No. of pages: 664
- Language: English
- Edition: 2
- Published: May 10, 2022
- Imprint: Academic Press
- Paperback ISBN: 9780323916462
- eBook ISBN: 9780323916479
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceEK
Erwin Kasper
Erwin Kasper studied physics at the Universities of Münster and Tübingen (Germany), where he obtained his PhD in 1965 and the habilitation to teach physics in 1969. After scientific spells in the University of Tucson, Arizona (1966) and in Munich (1970), he resumed his research and teaching in the Institute of Applied Physics, University of Tübingen, where he was later appointed professor. He lectured on general physics and especially on electron optics. The subject of his research was theoretical electron optics and related numerical methods on which he published numerous papers. After his retirement in 1997, he published a book on numerical field calculation (2001).
Affiliations and expertise
Institute of Applied Physics, University of Tuebingen, Tuebingen, Germany