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Nanocharacterization Techniques
- 1st Edition - March 18, 2017
- Editors: Osvaldo de Oliveira Jr, Ferreira LG Marystela, Fábio de Lima Leite, Alessandra Luzia Da Róz
- Language: English
- Hardback ISBN:9 7 8 - 0 - 3 2 3 - 4 9 7 7 8 - 7
- eBook ISBN:9 7 8 - 0 - 3 2 3 - 4 9 7 7 9 - 4
Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of character… Read more
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Request a sales quoteNanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs.
- Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs
- Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used
- Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered
- Serves as an important, go-to reference for materials scientists and engineers
Materials scientists and engineers, as well as those working in the natural and life sciences seeking a reference work outlining the essential principles of nanostructures and nanomaterials. Scientists working in related disciplines who may be relatively new to nanotechnology, and graduate students
1: Scanning Electron Microscopy
- Abstract
- 1. Introduction
- 2. Scanning Electron Microscope
- 3. Using the SEM
- 4. Developments in Scanning Electron Microscopy
- 5. Low-Voltage Scanning Electron Microscopy
- 6. Environmental Scanning Electron Microscopy
- 7. Electron Backscatter Diffraction
- 8. Energy-Dispersive X-Ray Spectroscopy in Scanning Electron Microscopy
- 9. Electron Beam Lithography
- 10. Nanomanipulation
- List of Symbols
2: Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
- Abstract
- 1. Introduction
- 2. Operating Principles
- 3. Operating Modes
- 4. Image Processing and Analysis
- 5. Electrical Nanocharacterization
- List of Symbols
3: Spectroscopic Techniques for Characterization of Nanomaterials
- Abstract
- 1. Ultraviolet–Visible Absorption
- 2. Fourier Transform Infrared Spectroscopy
- 3. Raman Scattering
- 4. Surface-Enhanced Raman Scattering
- List of Symbols
4: Dynamic Light Scattering Applied to Nanoparticle Characterization
- Abstract
- 1. Theory
- 2. Applications
- List of Abbreviations and Symbols
5: X-Ray Diffraction and Scattering by Nanomaterials
- Abstract
- 1. X-Ray Diffraction Applied to the Study of Nanocrystalline Powders
- 2. Small-Angle X-Ray Scattering
- 3. GISAXS and ASAXS
6: Surface Plasmon Resonance (SPR) for Sensors and Biosensors
- Abstract
- 1. Introduction
- 2. Surface Plasmons
- 3. Surface Plasmon Resonance–Based Sensors
- 4. SPR Applications
- 5. Final Remarks
- List of Symbols and Abbreviations
- No. of pages: 222
- Language: English
- Edition: 1
- Published: March 18, 2017
- Imprint: William Andrew
- Hardback ISBN: 9780323497787
- eBook ISBN: 9780323497794
Od
Osvaldo de Oliveira Jr
.
FM
Ferreira LG Marystela
Fd
Fábio de Lima Leite
AL