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Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy… Read more
LIMITED OFFER
Immediately download your ebook while waiting for your print delivery. No promo code needed.
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
1. First principles
Henk J.A.M. Heijmans
2.
Complete latticesHenk J.A.M. Heijmans
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Operators on complete latticesHenk J.A.M. Heijmans
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Operators which are translation invariantHenk J.A.M. Heijmans
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Adjunctions, dilations, and erosionsHenk J.A.M. Heijmans
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Openings and closingsHenk J.A.M. Heijmans
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Hit-or-miss topology and semi-continuityHenk J.A.M. Heijmans
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DiscretizationHenk J.A.M. Heijmans
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Convexity, distance, and connectivityHenk J.A.M. Heijmans
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Lattice representations of functionsHenk J.A.M. Heijmans
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Morphology for grey-scale imagesHenk J.A.M. Heijmans
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Morphological filtersHenk J.A.M. Heijmans
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Filtering and iterationHenk J.A.M. Heijmans
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