Modern Map Methods in Particle Beam Physics
- 1st Edition, Volume 108 - September 13, 1999
- Latest edition
- Editor: Peter W. Hawkes
- Language: English
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Micr… Read more
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Dynamics. Beams and Beam Physics. Differential Equations, Determinism, and Maps. Lagrangian Systems. Hamiltonian Systems. Electrodynamics. Differential Algebraic Techniques. Function Spaces and their Algebras. Taylor Differential Algebras. Advanced Methods. Fields. Analytic Field Representation. Practical Utilization of Field Information. Maps: Calculation. The Particle Optical Equations of Motion. Equations of Motion for Other Quantities. Maps: Properties. Manipulations. Symmetries. Representations. Spectrometers. Introduction. Momentum Spectrometers. Mass Spectrometers. Reconstructive Correction of Aberrations. Aberration Correction via Repetitive Symmetry. Repetitive Systems. Linear Theory. Parameter Dependent Linear Theory. Normal Forms. Syplectic Tracking.
Praise for the Series
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
- Edition: 1
- Latest edition
- Volume: 108
- Published: September 13, 1999
- Language: English
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Modern Map Methods in Particle Beam Physics on ScienceDirect