Microscopy Methods in Nanomaterials Characterization
- 1st Edition, Volume 1 - May 17, 2017
- Latest edition
- Editors: Sabu Thomas, Raju Thomas, Ajesh K Zachariah, Raghvendra Kumar Mishra
- Language: English
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomater… Read more
Data Mining & ML
Unlock the cutting edge
Up to 20% on trusted resources. Build expertise with data mining, ML methods.
Description
Description
Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials.
This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes.
Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization.
Key features
Key features
- Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique
- Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques
- Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each
Readership
Readership
Materials scientists, materials engineers, materials chemists and researchers in related disciplines including chemistry and physics
Table of contents
Table of contents
1. Scanning Electron Microscopy, ESEM, and X-Ray Microanalysis
Sven Henning
2. Synthesis of Scanning Electron Microscopy Images of Nanostructures by High-Performance Monte Carlo Modeling
Mauro Ciappa
3. Scanning electron microscopy under gaseous environment
Zahava Barkay
4. TRANSMISSION ELECTRON MICROSCOPY OF NANOSTRUCTURES
Thomas Walther
5. PLASMONIC AND NON-PLASMONIC CHARACTERIZATION OF NANOMATERIALS
Darshan B. Desai
6. Characterization of Materials, Nanomaterials, and Thin-Films by Nanoindentation
Zhong Hu
7. Super Resolution Optical Microscopy
Cuifang Kuang, Yue Fang, Yujia Huang, Shaocong Liu, Xu Liu
8. X-ray Microanalysis and Electron Energy Loss Spectroscopy (EELS)
Gurram Giridhar, Gudimalla Appa Rao, RKNR Manepalli
9. WIDE ANGLE X-RAY DIFFRACTION (WXRD)
Anjali Bishnoi, Sunil Kumar, Nirav Joshi
10. Small Angle Neutron Scattering (SANS)
Aristeidis Papagiannopoulos
11. Auger Electron Spectroscopy
Arkady M. Ilyin
12. Energy Dispersive X-ray Spectroscopy Techniques for Nanomaterials
Raghvendra Mishra, Ajesh K. Zachariah, Sabu Thomas
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 1
- Published: May 23, 2017
- Language: English
About the editors
About the editors
ST
Sabu Thomas
RT
Raju Thomas
AZ
Ajesh K Zachariah
RM
Raghvendra Kumar Mishra
Raghvendra Kumar Mishra is a Materials Scientist in the Chemical Engineering Department at IIT Delhi, India, and he has previously held research positions at Cranfield University (United Kingdom), Madrid Institute of Advanced Studies (Spain), and Mahatma Gandhi University (India). His research interests focus on nanomaterials and polymer composites, including new applications of nanomaterials, developing nanomaterials-based systems for diverse functionalities, creating biopolymer-based composites, and utilizing advanced fabrication techniques such as electrospinning and 3D printing.