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Mathematical Challenges in Electron Microscopy

  • 1st Edition, Volume 231 - August 1, 2024
  • Editors: Peter W. Hawkes, Martin Hÿtch
  • Language: English
  • Hardback ISBN:
    9 7 8 - 0 - 4 4 3 - 3 1 4 6 2 - 9
  • eBook ISBN:
    9 7 8 - 0 - 4 4 3 - 3 1 4 6 3 - 6

Mathematical Challenges in Electron Microscopy, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron… Read more

Mathematical Challenges in Electron Microscopy

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Mathematical Challenges in Electron Microscopy, Volume 231 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.