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Materials Science in Microelectronics II
The Effects of Structure on Properties in Thin Films
- 2nd Edition - November 29, 2005
- Imprint: Elsevier Science
- Author: Eugene Machlin
- Language: English
- Paperback ISBN:9 7 8 - 0 - 0 8 - 0 9 7 3 2 6 - 5
- Hardback ISBN:9 7 8 - 0 - 0 8 - 0 4 4 6 3 9 - 4
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 4 6 0 4 0 - 6
The subject matter of thin-films – which play a key role in microelectronics – divides naturally into two headings: the processing / structure relationship, and the structure /… Read more
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The subject matter of thin-films – which play a key role in microelectronics – divides naturally into two headings: the processing / structure relationship, and the structure / properties relationship. Part II of 'Materials Science in Microelectronics' focuses on the latter of these relationships, examining the effect of structure on the following: • Electrical properties• Magnetic properties• Optical properties• Mechanical properties• Mass transport properties• Interface and junction properties• Defects and properties
- Captures the importance of thin films to microelectronic development
- Examines the cause / effect relationship of structure on thin film properties
An ideal reference for students and researchers in material science, who need to learn the basics of thin films.
- Edition: 2
- Published: November 29, 2005
- Imprint: Elsevier Science
- Language: English
EM
Eugene Machlin
Affiliations and expertise
Columbia University , New York, USARead Materials Science in Microelectronics II on ScienceDirect