Materials Characterization Using Nondestructive Evaluation (NDE) Methods

1. Atomic force microscopy (AFM) for materials characterization

• 1.1. Introduction
• 1.2. Comparison of AFM with other microscopy techniques
• 1.3. Principles of AFM technique
• 1.4. Construction and basic components of AFM
• 1.5. Working modes of AFM
• 1.6. Application of AFM for material characterization
• 1.7. Conclusions

2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization

• 2.1. Introduction
• 2.2. Why electron microscopy?
• 2.3. Types of microscopes
• 2.4. Interaction of electrons with materials
• 2.5. What material features can we analyze using electron microscopy?
• 2.6. Scanning electron microscopy
• 2.7. Key microstructural features analyzed by SEM
• 2.8. Transmission electron microscopy
• 2.9. TEM imaging modes
• 2.10. TEM spectroscopy
• 2.11. Key applications of TEM
• 2.12. Is electron microscopy a nondestructive technique?
• 2.13. Outlook for SEM and TEM

3. X-ray microtomography for materials characterization

• 3.1. Introduction
• 3.2. Imaging physics
• 3.3. Principles of microcomputed tomography
• 3.4. Geometrical considerations and data acquisition
• 3.5. System design (CT methods)
• 3.6. Image reconstruction
• 3.7. Image quality
• 3.8. Radiation exposure
• 3.9. Examples of important and/or frequent applications for materials characterization
• 3.10. Conclusions and future trends
• 3.11. Further literature

4. X-ray diffraction (XRD) techniques for materials characterization

• 4.1. Introduction
• 4.2. Principles of X-ray diffraction techniques
• 4.3. Applications
• 4.4. Conclusions and future trends

5. Microwave, millimeter wave and terahertz (MMT) techniques for materials characterization

• 5.1. Introduction
• 5.2. Principles of MMT techniques
• 5.3. Applications
• 5.4. Conclusions
• 5.5. Future trends

6. Acoustic microscopy for materials characterization

• 6.1. Introduction
• 6.2. Basic principles
• 6.3. Resolution and contrast mechanisms
• 6.4. Tessonics AM1103 acoustical microscope
• 6.5. Materials characterization for industrial applications
• 6.6. Scanning acoustic microscopy inspection of spot welds
• 6.7. Real-time imaging of seam welds
• 6.8. Imaging of adhesive bonding between various metals
• 6.9. Adhesive bonding of composite and biocomposite materials
• 6.10. Conclusions

7. Ultrasonic techniques for materials characterization

• 7.1. Introduction
• 7.2. Principles of ultrasonic technique
• 7.3. Applications
• 7.4. Conclusions
• 7.5. Future trends

8. Electromagnetic techniques for materials characterization

• 8.1. Introduction
• 8.2. Principles of electromagnetic techniques
• 8.3. Applications
• 8.4. Conclusions
• 8.5. Future trends

9. Hybrid methods for materials characterization

• 9.1. Introduction
• 9.2. Signal processing and analysis on the way toward software-defined nondestructive testing devices
• 9.3. Calibration procedure
• 9.4. Applications
• 9.5. Conclusions
• 9.6. Future trends