Ion Beams for Materials Analysis
- 1st Edition - November 28, 1989
- Latest edition
- Editors: R. Curtis Bird, J. S. Williams
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 0 9 9 7 4 0 - 4
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 9 1 6 8 9 - 7
The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A… Read more
The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.
Research scientists in chemistry, archaeology, and analytical techniques.
Concepts and Principles of Ion Beam Analysis. Techniques and Equipment. High Energy Ion Scattering Spectrometry. Nuclear Reactions. Ion Induced X-ray Emission. Channelling. Depth Profiling of Surface Layers during Ion Bombardment. Low Energy Ion Scattering from Surfaces. Ion Scattering from Surfaces and Interfaces. Microprobe Analysis. Critical Assessment of Analysis Capabilities. General Methods. Directory of Materials. Data Lists.
- Edition: 1
- Latest edition
- Published: November 28, 1989
- Language: English
RB
R. Curtis Bird
Affiliations and expertise
Auburn University, AlabamaJW
J. S. Williams
Affiliations and expertise
Microelectronics and Materials Technology Centre, RMITRead Ion Beams for Materials Analysis on ScienceDirect