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Ion Beams for Materials Analysis
1st Edition - November 28, 1989
Editors: R. Curtis Bird, J. S. Williams
eBook ISBN:
9 7 8 - 0 - 0 8 - 0 9 1 6 8 9 - 7
The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A… Read more
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The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.
Research scientists in chemistry, archaeology, and analytical techniques.
Concepts and Principles of Ion Beam Analysis. Techniques and Equipment. High Energy Ion Scattering Spectrometry. Nuclear Reactions. Ion Induced X-ray Emission. Channelling. Depth Profiling of Surface Layers during Ion Bombardment. Low Energy Ion Scattering from Surfaces. Ion Scattering from Surfaces and Interfaces. Microprobe Analysis. Critical Assessment of Analysis Capabilities. General Methods. Directory of Materials. Data Lists.
- No. of pages: 719
- Language: English
- Published: November 28, 1989
- Imprint: Academic Press
- eBook ISBN: 9780080916897
RB
R. Curtis Bird
Affiliations and expertise
Auburn University, AlabamaJW
J. S. Williams
Affiliations and expertise
Microelectronics and Materials Technology Centre, RMIT