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Hot-Carrier Effects in MOS Devices

1st Edition - November 20, 1995

Authors: Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada

Language: English
Hardback ISBN:
9 7 8 - 0 - 1 2 - 6 8 2 2 4 0 - 3
eBook ISBN:
9 7 8 - 0 - 0 8 - 0 9 2 6 2 2 - 3

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other te… Read more

Hot-Carrier Effects in MOS Devices

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The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.

This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.