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Handbook of Optical Constants of Solids
- 1st Edition - October 28, 1997
- Author: Edward D. Palik
- Editor: Edward D. Palik
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 5 4 4 4 2 3 - 1
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 5 3 3 7 8 - 0
This is the third volume of the very successful set. This updated volume will contain non-linear properties of some of the most useful materials as well as chapters on optical… Read more
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Request a sales quoteThis is the third volume of the very successful set. This updated volume will contain non-linear properties of some of the most useful materials as well as chapters on optical measurement techniques.
- Contributors have decided the best values for n and k
- References in each critique allow the reader to go back to the original data to examine and understand where the values have come from
- Allows the reader to determine if any data in a spectral region needs to be filled in
- Gives a wide and detailed view of experimental techniques for measuring the optical constants n and k
- Incorporates and describes crystal structure, space-group symmetry, unit-cell dimensions, number of optic and acoustic modes, frequencies of optic modes, the irreducible representation, band gap, plasma frequency, and static dielectric constant
This book has a broad market which includes professionals working with optics (applications, calculations, research, design), Optical Society of America members, and SPIE members.
List of Contributors. Preface. E.D. Palik, Introductory Remarks. T.J. Parker, K.A. Maslin, and G. Mirjalli, Determination of the Far Infrared Optical Constants of Solids by Dispersive Fourier Transform Spectroscopy.A. Mandelis, Photothermal/Photoacoustic Spectroscopic Measurements of Optical Absorption Coefficients in Semiconductors. M.E. Briggs, Photothermal Deflection Measurements of the Extinction Coefficient k. H. Boukari and N. Lagakos,Determination of Optical Constants by Brillouin Scattering. M. Auslender and S. Hava, Doped n-Type Silicon (n-Si). E.D. Palik, Optical Parameters for the Materials in HOC I, II, III. References. Critiques-Metals: Introduction to the Data for Several Metals. L. Ward, Optical Constants of Eight Rare Earth Elements. T. Inagaki and E.T. Arakawa, Cesium (Cs). C.G. Rinning and A. Roos, Zirconium Nitride (ZrN). C.G. Ribbing and A. Roos, Hafnium Nitride (HfN). Critiques--Semiconductors: Aluminum Nitride (AiN). E.D. Palik, Bismuth Silicon Oxide (Bi12siO20). E.D. Palik, Bismuth Germanium Oxide (Bi12GeO20). G.L. Doll, Boron Nitride (Bn). J.C. Riff, Cadmium Germanium Arsenide (CuGaS2). J.C. Riff, Copper Gallium Sulfide (CuGaS2). D.F. Edwards, Gallium Selenide (GaSe). D.F. Edwards, Gallium Telluride (GaTe). E.D Palik, Iron Pyrite (FeS2). J. Geist, Silicon (Si) Revisited.D.F. Edwards, Silicon (Si) Revisited. J. Humlicek, Silicon-Germanium Alloys (SixGe1-x). M. Tazawa and A, Handi, Silver Chloride (AgCl); Silver Bromide (AgBr); Silver Iodide (AgI). L. Artus, Silver Gallium Sulfide (AgGaS2). Silver Gallium Selenide (AgGaSe2). J. Misiewicz and K. Jezierski, Zinc Arsenide (Zn3As2). Zinc Phosphide (Zn3P2). J.C. Rife, Zinc Germanium Phosphide (ZnGeP2). Critiques--Insulators: M.E. Thomas and W.J. Thopf, Aluminum Oxide (Al2O3). Revisited. W.J. Tropf, Calcium Carbonate (CaCO3). W.J. Moore, Cesium Bromide (CsBr). J.E. Eldridge, Cesium Chloride (CsCl). J.E. Eldridge, Cesium Fluoride (CsF). D.F. Edwards,Gallium Oxide (Ca2O3). M.A.F. Destro and A. Damiao, Lead Fluoride (PbF2). F. Gervais and V. Fonseca, Lithium Tantalate (LiTaO3). M.E. Thomas, Potassium Iodide (KI). I. Biaggio, Potassium Niobate (KNbO3). I. Ohlidal and D. Franta, Rubidium Iodide (RbI). E.D. Palik and R. Khanna, Sodium Nitrate (NaNO3). M.E. Thomas, Stronium Fluoride (SrF2). K.A. Fuller, H.D. Downing, and M.R. Querry, Orthorhomic Sulfur (-S). W.J. Tropf, Cubic Thallium (I) Halides. W.J. Tropf, Yttrium Aluminum Garnet (Y3Al5O12). E.D. Palik and R. Khanna, Zircon (ZrSiO4).
- No. of pages: 2008
- Language: English
- Edition: 1
- Published: October 28, 1997
- Imprint: Academic Press
- Hardback ISBN: 9780125444231
- eBook ISBN: 9780080533780
EP
Edward D. Palik
Edward D. Palik received his B.S. in Physics 1950, his M.S. in 1952, and his Ph.D. in 1955 from Ohio State University. He specialized in far-infrared spectroscopy and was assistant professor at Ohio State University during 1955–1956. He was a NSF fellow at the University of Michigan in 1956 and 1957 and a General Motors Fellow at Ohio State University from 1957–1958. He became an NRC Fellow at the Naval Research Laboratory in 1958 and soon converted to a research physicist in 1959. During the rest of his career at NRL he worked in magnetooptics of semiconductors, for which he was awarded the Hulburt Award in 1964. This is the highest internal scientific award given at the Naval Research Laboratory. He also worked on the optical properties of semiconductors, total-internal-reflection spectroscopy studies of surface polaritons, cathodoluminescence studies of solids, and orientation-dependent etching of silicon in aqueous potassium-hydroxide solutions.He was editor for the first years of the newsletter of the Far Infrared and Submillimeter Wave Technical Group of the OSA. After his retirement in 1988, he joined the Institute for Physical Science and Technology at the University of Maryland as a part-time research associate. While there he carried out Brillouin-scattering studies of solids and studies of defects in Fabry Perot plates.
Affiliations and expertise
University of Maryland, College Park, U.S.A.EP
Edward D. Palik
Edward D. Palik received his B.S. in Physics 1950, his M.S. in 1952, and his Ph.D. in 1955 from Ohio State University. He specialized in far-infrared spectroscopy and was assistant professor at Ohio State University during 1955–1956. He was a NSF fellow at the University of Michigan in 1956 and 1957 and a General Motors Fellow at Ohio State University from 1957–1958. He became an NRC Fellow at the Naval Research Laboratory in 1958 and soon converted to a research physicist in 1959. During the rest of his career at NRL he worked in magnetooptics of semiconductors, for which he was awarded the Hulburt Award in 1964. This is the highest internal scientific award given at the Naval Research Laboratory. He also worked on the optical properties of semiconductors, total-internal-reflection spectroscopy studies of surface polaritons, cathodoluminescence studies of solids, and orientation-dependent etching of silicon in aqueous potassium-hydroxide solutions.He was editor for the first years of the newsletter of the Far Infrared and Submillimeter Wave Technical Group of the OSA. After his retirement in 1988, he joined the Institute for Physical Science and Technology at the University of Maryland as a part-time research associate. While there he carried out Brillouin-scattering studies of solids and studies of defects in Fabry Perot plates.
Affiliations and expertise
University of Maryland, College Park, U.S.A.