Skip to main content

Fundamentals of Microstructural Characterization of Materials

  • 1st Edition - November 14, 2025
  • Latest edition
  • Authors: Hamid Garmestani, Navid Nasajpour Esfahani
  • Language: English

Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This b… Read more

Black Friday Savings

Save up to 35% off books & Journals plus free shipping on all orders.

Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching.

Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail.

Related books