
Embedded Mechatronic Systems
Analysis of Failures, Predictive Reliability
- 2nd Edition - July 15, 2015
- Imprint: ISTE Press - Elsevier
- Editors: Abdelkhalak El Hami, Philippe Pougnet
- Language: English
- Hardback ISBN:9 7 8 - 1 - 7 8 5 4 8 - 1 8 9 - 5
- eBook ISBN:9 7 8 - 0 - 0 8 - 1 0 1 9 5 5 - 9
Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, vo… Read more

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Request a sales quoteMechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, volume, energy consumption and cost. Mechatronic equipment must operate without failure throughout ever-increasing service lives.The particularly severe conditions of use of embedded mechatronics cause failure mechanisms which are the source of breakdowns. Until now, these failure phenomena have not been looked at with enough depth to be able to be controlled.
- Provides a statistical approach to design optimization through reliability
- Presents an experimental approach for the characterization of the development of mechatronic systems in operating mode
- Analyzes new tools that effect thermal, vibratory, humidity, electric and electromagnetic stresses
Scientists, researchers and engineers interested in this subject area
1. Reliability-Based Design Optimization
Philippe Pougnet and Hichame Maanane
2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices
Pierre Richard Dahoo, Malika Khettab, Jorge Linares and Philippe Pougnet
3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities
Samh Khemiri, Abhishek Ramanujan, Moncef Kadi and Zouheir Riah
4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques
Ioana Nistea and Dan Borza
5. Characterization of Switching Transistors under Electrical Overvoltage Stresses
Patrick Martin, Ludovic Lacheze, Alain KamdeL and Philippe Descamps
6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress
Samh Khemiri and Moncef Kadi
7. Internal Temperature Measurement of Electronic Components
Eric Joubert, Olivier Latry, Pascal Dherbecourt, Maxime Fontaine, Christian Gautier, Hubert Polaert and Philippe Eudeline
8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide
Philippe Pougnet, Franck Bayle, Hichame Maanane and Pierre Richard Dahoo
9. Study of the Dynamic Contact Between Deformable Solids
Bouchaïb Radi and Abdelkhalak El Hami
Philippe Pougnet and Hichame Maanane
2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices
Pierre Richard Dahoo, Malika Khettab, Jorge Linares and Philippe Pougnet
3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities
Samh Khemiri, Abhishek Ramanujan, Moncef Kadi and Zouheir Riah
4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques
Ioana Nistea and Dan Borza
5. Characterization of Switching Transistors under Electrical Overvoltage Stresses
Patrick Martin, Ludovic Lacheze, Alain KamdeL and Philippe Descamps
6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress
Samh Khemiri and Moncef Kadi
7. Internal Temperature Measurement of Electronic Components
Eric Joubert, Olivier Latry, Pascal Dherbecourt, Maxime Fontaine, Christian Gautier, Hubert Polaert and Philippe Eudeline
8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide
Philippe Pougnet, Franck Bayle, Hichame Maanane and Pierre Richard Dahoo
9. Study of the Dynamic Contact Between Deformable Solids
Bouchaïb Radi and Abdelkhalak El Hami
- Edition: 2
- Published: July 15, 2015
- No. of pages (Hardback): 274
- No. of pages (eBook): 274
- Imprint: ISTE Press - Elsevier
- Language: English
- Hardback ISBN: 9781785481895
- eBook ISBN: 9780081019559
AE
Abdelkhalak El Hami
Abdelkhalak El Hami is Professeur des universités at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid–structure interaction studies, reliability and optimization.
Affiliations and expertise
Institut National des Sciences Appliquees (INSA-Rouen), FrancePP
Philippe Pougnet
Affiliations and expertise
Reliability Expert, Valeo, Paris, FranceRead Embedded Mechatronic Systems on ScienceDirect