
Embedded Mechatronic Systems 2
Analysis of Failures, Modeling, Simulation and Optimization
- 2nd Edition - February 28, 2020
- Imprint: ISTE Press - Elsevier
- Editors: Abdelkhalak El Hami, Philippe Pougnet
- Language: English
- Hardback ISBN:9 7 8 - 1 - 7 8 5 4 8 - 1 9 0 - 1
- eBook ISBN:9 7 8 - 0 - 0 8 - 1 0 1 9 5 6 - 6
Embedded Mechatronic Systems 2: Analysis of Failures, Modeling, Simulation and Optimization presents advances in research within the field of mechatronic systems, which integrate… Read more

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Request a sales quoteEmbedded Mechatronic Systems 2: Analysis of Failures, Modeling, Simulation and Optimization presents advances in research within the field of mechatronic systems, which integrates reliability into the design process. Providing many detailed examples, this book develops a characterization methodology for faults in mechatronic systems. It analyzes the multi-physical modeling of faults, revealing weaknesses in design and failure mechanisms. This development of meta-models enables us to simulate effects on the reliability of conditions of use and manufacture.
- Provides many detailed examples
- Develops a characterization methodology for faults in mechatronic systems
- Analyzes the multi-physical modeling of faults, revealing weaknesses in design and failure mechanisms
1. Highly Accelerated Testing
Philippe Pougnet, Pierre Richard Dahoo and Jean-Loup Alvarez
2. Aging Power Transistors in Operational Conditions
Pascal Dherbecourt, Olivier Latry, Karine Dehais-Mourgues, Jean-Baptiste Fonder, Cédric Duperrier, Farid Temcamani, Hichame Maanane and Jean-Pierre Sipma
3. Physical Defects Analysis of Mechatronic Systems
Christian Gautier, Eric Pieraerts and Olivier Latry
4. Impact of Voids in Interconnection Materials
Pierre Richard Dahoo, Malika Khettab, Christian Chong, Armelle Girard and Philippe Pougnet.
5. Electro-Thermo-Mechanical Modeling
Abderahman Makhloufi, Younes Aoues and Abdelkhalak El Hami.
6. Meta-Model Development
Bouzid Ait-Amir, Philippe Pougnet and Abdelkhalak El Hami.
7. Optimizing Reliability of Electronic Systems
Younes Aoues, Abderahman Makhloufi and Abdelkhalak El Hami.
8. High-Efficiency Architecture for Power Amplifiers
Farid Temcamani, Jean-Baptiste Fonder, Cédric Duperrier and Olivier Latry
- Edition: 2
- Published: February 28, 2020
- No. of pages (Hardback): 300
- No. of pages (eBook): 300
- Imprint: ISTE Press - Elsevier
- Language: English
- Hardback ISBN: 9781785481901
- eBook ISBN: 9780081019566
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Abdelkhalak El Hami
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