Electronics Reliability–Calculation and Design
Electrical Engineering Division
- 1st Edition - January 1, 1966
- Latest edition
- Authors: Geoffrey W. A. Dummer, Norman B. Griffin
- Editor: N. Hiller
- Language: English
Electronics Reliability–Calculation and Design provides an introduction to the fundamental concepts of reliability. The increasing complexity of electronic equipment has made… Read more
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Description
Description
Electronics Reliability–Calculation and Design provides an introduction to the fundamental concepts of reliability. The increasing complexity of electronic equipment has made problems in designing and manufacturing a reliable product more and more difficult. Specific techniques have been developed that enable designers to integrate reliability into their products, and reliability has become a science in its own right. The book begins with a discussion of basic mathematical and statistical concepts, including arithmetic mean, frequency distribution, median and mode, scatter or dispersion of measurements, and the normal and binomial distributions. Separate chapters deal with techniques for calculating equipment and system reliability; safety and derating factors; and the effects of constructional methods on reliability. Subsequent chapters cover environmental effects on reliability; improved reliability through microelectronics or integrated circuits; and failure rates for electronic components. Each chapter concludes with questions to enable students to test their understanding of the topics discussed. This book offers students an introduction to the subject of reliability in a form that is easily assimilated. It also serves as a reference to the various aspects contributing towards increased reliability of both electronic equipment and complete systems.
Table of contents
Table of contents
Preface
Acknowledgment
1 Basic Reliability Theory
Means and Frequency Distributions
Probability Theory, the Gaussian, Binomial, Exponential, Gamma and Weibull Distributions
Confidence Limits, Goodness of Fit, the Chi-Square Distribution, Precision of Measurement
Student's t Variance Ratio
2 Calculating Equipment and System Reliability
The Exponential Law of Reliability
Prediction of Reliability, Product Law of Reliability
System Prediction from Failure Rates
Calculation of Life Tests
Determination of Confidence Limits
3 Safety and Derating Factors
Reliability through Redundancy, Standby Redundancy, Parallel Redundancy, Group Redundancy
Weight and Reliability Factors
Reliability through Derating, Thermionic Valves, Semiconductors, Resistors, Capacitors, Transformers, Inductors, Relays
4 Reliability in Construction
Inadequate design features
Poor Performance under Adverse Conditions
Constructional Techniques, Printed Wiring, Encapsulation, Connections
Eliminating Mechanical Stress
Cooling Techniques
Sealing Problems
Filling Gases
5 Environmental Effects Reliability
Climatic Conditions in the World, Arctic, Tropical, Desert, Maritime, Upper Atmosphere
Environmental Stresses, Vibration, Shock, Noise, Pressure, Radiation, Acceleration
The Environment and it Effect on Electronics, High Temperature, Solar Radiation, Heat Dissipation, Low Temperature, Components, Humidity, Materials, Corrosion, Effects on Plastics
6 Reliabilty Through Microelectronics
Subdivisions of Microelectronics
Thin Film Integrated Circuits, Materials, Resistors and Capacitors, Transistors
Photolithographic Techniques
Connections; Semiconductor Integrated Circuits, Materials, Epitaxy, Masking and Diffusion Techniques; Hybrid Circuits; Reliability Evaluation of Thin Film and Semiconductor Integrated Circuits
7 Failure Rates for Electronic Components
Distribution of Failure Rates, Lowest Recorded Failure Rates, Failure Rate Figures for Transistors, Diodes, Rectifiers, Tubes, Lamps, Fixed Resistors, Variable Resistors, Fixed Capacitors, Variable Capacitors, Transformers, Coils and Chokes, Relays, Switches, Crystals, Rotary Devices, Connectors, Joints, Miscellaneous Items
Index
Product details
Product details
- Edition: 1
- Latest edition
- Published: October 2, 2013
- Language: English
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