Digital Circuit Testing
A Guide to DFT and Other Techniques
- 1st Edition - July 28, 1991
- Imprint: Academic Press
- Author: Francis C. Wong
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 7 3 4 5 8 0 - 2
- Paperback ISBN:9 7 8 - 0 - 1 2 - 3 9 5 9 1 2 - 6
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 5 0 4 3 4 - 6
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it… Read more
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Request a sales quoteRecent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Professional engineers involved in designing, testing, and manufacturing digital integrated circuits and printed circuit boards.
A Test Generation Method Using Testability Results. Circuit ATVG and DFT. PLD Design for Test. Built-In Self Test and Boundary Scan Techniques. ATE and the Testing Process. Special Testing Topics and Conclusions. Index.
- Edition: 1
- Published: July 28, 1991
- Imprint: Academic Press
- No. of pages: 228
- Language: English
- Hardback ISBN: 9780127345802
- Paperback ISBN: 9780123959126
- eBook ISBN: 9780080504346
FW
Francis C. Wong
Affiliations and expertise
Seattle University, WashingtonRead Digital Circuit Testing on ScienceDirect