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This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion… Read more
LIMITED OFFER
Immediately download your ebook while waiting for your print delivery. No promo code needed.
This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields.
The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths.
students, researchers in both academic and industrial settings dealing with semiconductor or semiconductor applications
Peter Pichler
Arne Nylandsted Larsen and Abdelmadjid Mesli
Enrico Napolitani and Giuliana Impellizzeri
Nicholas G. Rudawski, Aaron G. Lind and Thomas P. Martin
Mangalampalli S. R. N. Kiran, Bianca Haberl, Jodie E. Bradby and James S. Williams
Eddy Simoen, Johan Lauwaert and Henk Vrielinck
Daniela Cavalcoli, Beatrice Fraboni and Anna Cavallini
Matthew D. McCluskey
Michael A. Reshchikov
LR
She had a post-doc at the University of Florida, Department of Material Science and Engineering (www.mse.ufl.edu) and she is now visitor scientist at PSI and ETH Zurich in the TOMCAT group (www.psi.ch/sls/tomcat).
She was in the local organizers committee and editorial board of IBMM conference 2006 (Taormina, Italy), program chair of the international IEEE NMDC conference 2014 (Aci Castello, Italy). She was web designer and editor of the group web site http://www.matis.imm.cnr.it. She was responsible for many reach-out and divulgation activities, such as “Nanergame”, awarded at EMRS 2014 in the reach-out competition.
She taught Physics, Nanotechnology and Materials Science Lab., she did professional training for SEM, electrical characterization, ion beam analyses and ion implantation, she was tutor of about 20 students (master and PhD). Presenting authors and invited speakers in more than 20 international conferences about Ion Beam and Materials Science; co-author of more than 50 publications in international journals; Referee of papers in Nuclear Instruments and Methods B, Materials Science and Engineering B, Applied Physics Letters, Journal of Applied Physics, Physics Review B, Nanotechnology, Applied Physics A, Electrochemical and Solid-State Letters, Materials Science Letters, Japanese Applied Physics Express.
VP
He was a post-doc Marie Curie fellow in 1992-93 at IMEC, Belgium. He was a member of the project management committee of several European Projects (ENDEASD, FRENDTECH, IMPULSE) in the field of nanomaterials and nanoelectronics. He was the Coordinator of the European project “Fundamentals and applications of laser processing for highly innovative MOS technology” (FLASH) and of several national projects. He currently coordinates the European Coordination Action “Winning Applications of nano Technology for Resolutive hydropurification” (WATER), granted by the European Commission with 4 M€.
He is author of 200 publications in international scientific journals, delivered several invited talks at international conferences, won 4 awards at national and international conferences and holds one patent.
He chaired two international conferences (E-MRS Symposium 2001, IEEE-RTP 2007, IEEE-NMDC 2014) and is a member of the International Scientific Committee of several conferences. He is referee of the Journal of Applied Physics, Applied Physics Letters, Journal of the Electrochemical Society, Applied Physics A, IEEE Transactions on Electron Devices.
He was supervisor of several theses in the field of materials science at the University of Catania and member of the Doctoral Examination Committee at the University of Oslo (Norway) and at the Delft University of Technology (The Netherlands).
CJ