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Concise Encyclopedia of Materials Characterization
2nd Edition - December 17, 2004
Editor: Robert Cahn
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To use materials effectively, their composition, physical and mechanical characteristics, and microstructure must be accurately determined. The second edition of Concise… Read more
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To use materials effectively, their composition, physical and mechanical characteristics, and microstructure must be accurately determined. The second edition of Concise Encyclopedia of Materials Characterization covers the wide range of characterization techniques necessary to achieve this.
With over 130 articles taken from the award-winning Encyclopedia of Materials: Science and Technology, containing revisions and updates not available in the original set, this concise encyclopedia is an ideal quick reference for materials scientists, chemists and engineers.
Extensive topical coverage, from traditional methods to the very latest in research
Includes ScienceDirect updates and revisions not available in the original Encyclopedia of Materials: Science and Technology
Over 500 illustrations, extensive cross-referencing, and a detailed index
All materials scientists, chemists and engineers involved in research into any aspect of the characterization of materials
Editor's Preface – newly written Alphabetical List of Articles An Introduction to Investigation and Characterization of Materials Acoustic Microscopy Adhesives: Tests for Mechanical Properties Amorphous Materials: Electron Spin Resonance Amorphous Materials: Nuclear Magnetic Resonance, Amorphous Materials: Nuclear Spin Relaxation Amorphous Materials: Small-Angle Scattering Amorphous Materials: Vibrational Spectroscopy Amorphous Materials: X-ray Absorption Spectroscopy Analytical Transmission Electron Microscopy Anodization Microscopy Art Forgeries: Scientific Detection Atomic Force Microscopy Auger Electron Microscopy Auger Microscopy: Angular Distribution Brittle Materials: Strength Testing Ceramics, Cathodoluminescence Analysis of Ceramics: Fracture Toughness Testing Ceramic Powders: Packing Characterization Channelling-Enhanced Microanalysis Chemical Analysis of Solid Surfaces Combinatorial Screening Composite Materials: Nondestructive Evaluation Compton Scattering Confocal Optical Microscopy Corrosion and Oxidation Study Techniques Corrosion: Test Methods Crack Growth Measurement Creep by Indentation Creep, Creep Rupture and Stress Relaxation Testing Creep-Fatigue Interaction Testing Dating Archaeological Materials Deep Level Transient Spectroscopy Depth Profiling Diffusion: Novel Measurement Methods *Diffusion Multiple Screening: Phase Diagram Mapping and Related Studies Dislocations: Experimental Observation Elastic Modulus Measurement Elastomers: Spectroscopic Characterization Elastomers: Tests for Mechanical Properties Electron Diffraction Electron Diffraction, Low-Energy Electron Energy Loss Spectrometry Electron Microscope Analysis of Defect Clusters, Voids and Bubbles Electron Microscopy, High-Voltage Electron Spectroscopy for Chemical Analysis Electron Spin Resonance Electron Tunnelling Spectroscopy Electronic Raman Spectroscopy Ellipsometry EMSAT, p. 2755 Fatigue(Multiaxial) Testing Fatigue Testing Fatigue Testing: Thermal and Thermomechanical Field-Ion Microscopy Field-Ion Microscopy: Atom Probe Microanalysis Field-Ion Microscopy: Observation of Radiation Effects Fractal Analysis Fracture of Polymeric Materials Fracture Toughness Testing of Metallic Materials Gamma Radiography Gamma-Ray Diffraction Gas and Liquid Chromatography Grain-Boundary Geometry: Measurement Grain-Size: Nondestructive Evaluation Hardness Testing High-Resolution Electron Micrsocopy High-Resolution Electron Microscopy of Interfaces Hydrogen as a Metallurgical Probe Infrared Spectroscopy Impact Testing In-Reactor Creep Testing: Techniques Ion Backscattering Analysis Ion Chromatography Junction Transient Spectroscopy Kerr Microscopy Laser Microprobe Mass Spectrometry Laser Sampling Inductively Coupled Mass Spectrometry Liquid Chromatography Mass Spectrometry Luminescence Imaging of Ceramics Low-Energy Electron Diffraction Magnetic Force Microscopy Magnetic Materials: Measurements Magnetic Materials: Transmission Electron Microscopy Magnetic Measurements: Pulse Field Magnetic Measurements: Quasistatic and AC Magnetic Recording Measurements Magnetic Systems: De Haas van Alphen Studies of Fermi Surface Magnetism: Applications of Synchrotron Radiation Mechanical Properties Microprobe Mechanical Testing at High Strain Rates Mechanical Testing Methods of Fibers and Composites Mechanical Testing of Ceramics Mechanical Testing: Overview Microengineering of Materials: Characterization Microstructural Evolution: Computer Simulation Microtextural Analysis Mössbauer Spectrometry Nanoindentation Techniques Nanometer-Scale Evaluation of Advanced Materials by Using Positrons Neutron Activation Analysis Neutron Diffraction Neutron Radiography Neutron Reflectometry for the Study of Absorption from Solution at Solid Surfaces, Nuclear Magnetic Resonance Spectroscopy Optical Calorimetry Optical Emission Spectroscopy Optical Microscopy Organic Mass Spectrometry Oxide Surfaces by STM, Study of Paper and Paperboard: Destructive Mechanical Testing Paper and Paperboard: Nondestructive Evaluation Paper Surfaces: Subjective Evaluation Particle-Induced X-Ray Emission Perturbed Angular Correlations (PAC) Phase Diagrams and Phase Stability: Calculations Photoelasticity Photoelectron Diffraction Pole Figures and Orientation Distribution Functions Polymer Dielectric Properties: Test Methods Polymers: Electron Micsocopy Polymers: Light Microscopy Polymers: Molecular Weight and its Distribution Polymers: Neutron Scattering Polymers: Raman Spectroscopy Polymers: Tests for Degradation and Stabilisation Polymers: Tests for Flammability Polymers: Tests for Mechanical Properties Polymers: Tests for Thermal Properties Polymers: Thermal Analysis Polymers: X-Ray Scattering Porosity: Characterization and Investigation Positron Annihilation Spectroscopy of Defects in Metals Positron-Annihilation Techniques, Advanced, for Materials Research Powder Characterization Powder Mechanics Raman Spectroscopy and Microscopy Reflection Electron Microscopy Concise, p. 409 Residual Stresses: Measurement by Diffraction Residual Stresses: Measurement by Raman Shift Residual Stresses: Measurement using Magnetoelastic Effects Residual Stresses: Measurement using Neutron Diffraction Scanning Electron Microscopy Scanning SQUID Microscope Scanning Tunneling Microscopy and Spectroscopy Secondary–Ion Mass Spectrometry Semiconductor Materials: Characterization by Etching Semiconducting Materials: Electron Microscopy Semiconductors, Electrical Evaluation of Semiconductors, Local Vibrational Mode Spectroscopy Semiconductors, Raman Spectroscopy of Semiconductors, Scanning Photoluminescence Semicrystalline Polymers: Lamellar Morphology by SAXS Single-Crystal X-Ray Diffraction Small-Specimen Mechanical Testing Solid-State Nuclear Track Detectors: Applications Solid State: Study Using Muon Beams Spark-Source Mass Spectrography SQUIDS: Magnetic Microscopy EMSAT, p. 8787 SQUIDS: The Instrument Stress Distribution: Analysis Using Thermoelastic Effect Superconducting Materials: Measurements Surface Chemistry: Electron Yield Spectroscopy Surface Chemistry: EXAFS Surface Evaluation by Atomic Force Microscopy Surface Photochemistry Thermal Transport Properties, Measurement of Texture: Nondestructive Characterization Thermal Analysis: An Overview Thermal Analysis: More Recent Developments Thermal Wave Imaging Thermally Contracting Materials: Characterisation Thermodynamic Activity: Measurement Thermoluminescence Thermophysical Measurements, Subsecond Thin Films: Characterization by X-Rays Thin Films: In-Situ Stress Measurement of Thin Films: Mechanical Testing Thin Films: Stress Measurement Techniques Transmission Electron Microscopy Vibrothermography Viscoelasticity/Anelasticity Wood: Acoustic Emission and Acousto-Ultrasonic Characteristics X-Ray Absorption Spectroscopy: EXAFS and XANES Techniques X-Ray and Neutron Diffraction Studies of Amorphous Solids X-Ray and Neutron Diffuse Scattering of Radiation-Induced Defects X-Ray Diffraction, Time-Resolved X-Ray Fluorescence Spectrometry X-Ray Microanalysis, Quantitative X-Ray Diffraction X-Ray Powder Diffraction X-Ray Topography
No. of pages: 1120
Published: December 17, 2004
Imprint: Elsevier Science
Hardback ISBN: 9780080445472
Robert S. Cahn received his B.S. from the University of Chicago in 1966 and his Ph.D. in Mathematics from Yale University in 1970. From 1970 until 1982, he was a member of the Department of Mathematics and Computer Science of the University of Miami and of the Mathematics Department of Lehman College from 1983-1985. In 1986 he joined the IBM Communications Department working on network design algorithms and network design tools. He has also designed a number of very large, high-speed networks for both IBM and IBM customers. He is the author or over 20 research articles spanning his various interests. He is adjunct professor of Computer Science at Polytechnic University and regularly teaches about network design.