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Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources
- 1st Edition, Volume 227 - August 15, 2023
- Editors: Peter W. Hawkes, Martin Hÿtch
- Language: English
- Hardback ISBN:9 7 8 - 0 - 4 4 3 - 1 9 3 2 4 - 8
- eBook ISBN:9 7 8 - 0 - 4 4 3 - 1 9 3 2 5 - 5
Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running ser… Read more
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Request a sales quoteCoherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more.
The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
Physicists, electrical engineers, applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- Cover image
- Title page
- Table of Contents
- Series Page
- Copyright
- Dedication
- Acronyms
- Symbols
- Preface
- Chapter One: Characterization of nanomaterials properties using FE-TEM
- Abstract
- 1.1: Principles of physical characterization using a coherent electron beam
- 1.2: Structural analysis using FETEM
- 1.3: Improving coherent TEM
- Discussion
- References
- Chapter Two: Cold field emission electron source: From higher brightness to ultrafast beam
- Abstract
- 2.1: Introduction
- 2.2: Principle of cold field emission electron source technology
- 2.3: 200 keV CFEG of Hitachi: The HF2000
- 2.4: Improving brightness using new carbon nanocone cathode
- 2.5: Generation of ultrashort electron pulses using femtosecond laser pulses exciting a FE cathode
- 2.6: Discussion and introduction to the research project
- References
- Chapter Three: Every electron counts: Toward the development of aberration-optimized and aberration-corrected electron sources
- Abstract
- 3.1: Introduction
- 3.2: Computational strategy for the design of charged-particle optics system
- 3.3: Development of an aberration-optimized magnetic field superimposed cold field emission gun (MCFEG)
- 3.4: Improving an electrostatic gun lens by means of multipolar optics: From aberration optimization to aberration correction
- 3.5: Concepts behind a multisource optical system
- 3.6: Discussion and conclusion
- References
- References
- Index
- No. of pages: 250
- Language: English
- Edition: 1
- Volume: 227
- Published: August 15, 2023
- Imprint: Academic Press
- Hardback ISBN: 9780443193248
- eBook ISBN: 9780443193255
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceMH
Martin Hÿtch
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Affiliations and expertise
Senior Scientist, French National Centre for Research (CNRS), Toulouse, FranceRead Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources on ScienceDirect