Skip to main content

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

  • 1st Edition, Volume 227 - August 15, 2023
  • Editors: Peter W. Hawkes, Martin Hÿtch
  • Language: English
  • Hardback ISBN:
    9 7 8 - 0 - 4 4 3 - 1 9 3 2 4 - 8
  • eBook ISBN:
    9 7 8 - 0 - 4 4 3 - 1 9 3 2 5 - 5

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running ser… Read more

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources

Purchase options

LIMITED OFFER

Save 50% on book bundles

Immediately download your ebook while waiting for your print delivery. No promo code needed.

Image of books

Institutional subscription on ScienceDirect

Request a sales quote

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more.

The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.