Atomic Force Microscopy in Process Engineering
An Introduction to AFM for Improved Processes and Products
- 1st Edition - June 30, 2009
- Authors: W. Richard Bowen, Nidal Hilal
- Language: English
- Paperback ISBN:9 7 8 - 0 - 0 8 - 0 9 7 4 6 9 - 9
- Hardback ISBN:9 7 8 - 1 - 8 5 6 1 7 - 5 1 7 - 3
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 9 4 9 5 7 - 4
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to pr… Read more

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Request a sales quoteThis is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.
The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and products
- The only book dealing with the theory and practical applications of atomic force microscopy in process engineering
- Provides best-practice guidance and experience on using AFM for process and product improvement
1. Basic Principles of Atomic Force MicroscopyDaniel Johnson, Nidal Hilal, W. Richard Bowen2. Measurement of Particle and Surface Interactions Using Force MicroscopyNidal Hilal, Daniel Johnson, W. Richard Bowen, Paul M. Williams3. Quantification of Particle-Bubble Interactions Using Atomic Force MicroscopyNidal Hilal, Daniel Johnson
4. Investigating Membranes and Membrane Processes with Atomic Force MicroscopyW. Richard Bowen, Nidal Hilal5. AFM and Development of (Bio)Fouling Resistant MembranesNidal Hilal, W. Richard Bowen, Daniel Johnson, Huabing Yin6. Nanoscale Analysis of Pharmaceuticals by Scanning Probe MicroscopyClive J. Roberts7. Micro/Nanoengineering and AFM for Cellular SensingHuabing Yin, Gordon McPhee, Phil Dobson8. Atomic Force Microscopy and Polymers on SurfacesVasileios Koutsos9. Application of AFM for the Study of Tensile and Microrheological Properties of FluidsMatthew S. Barrow, P. Rhodri Williams10. Future ProspectsW. Richard Bowen and Nidal Hilal
- No. of pages: 304
- Language: English
- Edition: 1
- Published: June 30, 2009
- Imprint: Butterworth-Heinemann
- Paperback ISBN: 9780080974699
- Hardback ISBN: 9781856175173
- eBook ISBN: 9780080949574
WB
W. Richard Bowen
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