Advances in Imaging and Electron Physics
- 1st Edition, Volume 101 - September 8, 1997
- Latest edition
- Editors: Tom Mulvey, Peter W. Hawkes, Benjamin Kazan
- Language: English
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microsco… Read more
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Description
Description
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Readership
Readership
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Table of contents
Table of contents
P.E. Champness, Applications of Transmission Electron Microscopy in Mineralogy. K. Hiraga, High-Resolution Electron Microscopy of Quasicrystals. A. Imiya, Formal Polynomials for Image Processing. M. Molski, The Dual de Broglie Wave. Subject Index.
Review quotes
Review quotes
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."—J.A. Chapman in LABORATORY PRACTICE
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 101
- Published: October 3, 1997
- Language: English
About the editors
About the editors
TM
Tom Mulvey
Affiliations and expertise
Aston University, Department of Electronic Engineering and Applied Physics, U.K.PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceBK
Benjamin Kazan
Affiliations and expertise
Xerox Corporation, Palo Alto, California, U.S.A.View book on ScienceDirect
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