Advances in Imaging and Electron Physics
- 1st Edition, Volume 218 - June 10, 2021
- Imprint: Academic Press
- Editors: Martin Hÿtch, Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 3 2 3 - 9 1 5 0 5 - 2
- eBook ISBN:9 7 8 - 0 - 3 2 3 - 9 1 5 0 6 - 9
Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microsc… Read more
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Request a sales quoteAdvances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Updated release includes the latest information on the Coulomb Interactions in Charged Particle Beams
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- Cover image
- Title page
- Table of Contents
- Copyright
- Contributors
- Preface
- Chapter One: Phase retrieval methods applied to coherent imaging
- Abstract
- 1. Introduction to the imaging of a non-crystalline object and the phase problem
- 2. Survey of interferometric/coherent imaging schemes
- 3. Development of in-line holography and CDI with low-energy electrons
- 4. Future directions
- References
- Chapter Two: X-ray phase-contrast imaging: a broad overview of some fundamentals
- Abstract
- 1. Introduction
- 2. X-ray imaging basics
- 3. The forward problem: modeling X-ray phase-contrast images
- 4. The inverse problem: retrieving sample information from X-ray phase-contrast images
- Acknowledgements
- References
- Chapter Three: Graphyne and borophene as nanoscopic materials for electronics — with review of the physics
- Abstract
- 1. Introduction
- 2. Formulation of the bandstructure equations in a tractable tight-binding format
- 3. Eigenenergies, Fermi velocities, overlap & hopping integrals
- 4. Eigenvectors based upon 2-spinors
- 5. Eigenvectors based upon 4-spinors
- 6. Conclusions and future outlook
- References
- Chapter Four: The ESAB effect and the physical meaning of the vector potential
- Abstract
- 1. Introduction
- 2. ESAB effect
- 3. Experimental tests
- 4. Analysis
- 5. Conclusion
- References
- Chapter Five: Electron image plane off-axis holography of atomic structures
- Abstract
- 1. Introduction
- 2. Principles of off-axis image plane electron holography
- 3. Performance of image plane electron holography
- 4. Influence of the lens aberrations in the high-resolution domain
- 5. Reconstruction of the image wave and correction of aberrations
- 6. Experimental realization of holography of atomic structures
- 7. Conclusion
- 8. List of symbols
- Acknowledgements
- References
- References
- Index
- Edition: 1
- Volume: 218
- Published: June 10, 2021
- No. of pages (Hardback): 276
- No. of pages (eBook): 276
- Imprint: Academic Press
- Language: English
- Hardback ISBN: 9780323915052
- eBook ISBN: 9780323915069
MH
Martin Hÿtch
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Affiliations and expertise
Senior Scientist, French National Centre for Research (CNRS), Toulouse, FrancePH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect