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Advances in Imaging and Electron Physics

  • 1st Edition, Volume 225 - March 27, 2023
  • Editors: Peter W. Hawkes, Martin Hÿtch
  • Language: English
  • Hardback ISBN:
    9 7 8 - 0 - 4 4 3 - 1 9 3 2 6 - 2
  • eBook ISBN:
    9 7 8 - 0 - 4 4 3 - 1 9 3 2 7 - 9

Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscop… Read more

Advances in Imaging and Electron Physics

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Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.