Advances in Imaging and Electron Physics
- 1st Edition, Volume 191 - August 21, 2015
- Latest edition
- Editor: Peter W. Hawkes
- Language: English
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy… Read more
Advances in Imaging & Electron Physics
merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
- Preface
- Future Contributions
- Chapter One: Femtosecond Electron Imaging and Spectroscopy: Proceedings of the Conference on Femtosecond Electron Imaging and Spectroscopy, FEIS 2013, December 9–12, 2013, Key West, FL, USA
- Abstract
- 1 Introduction
- References
- Session 1: Current Status of Ultrafast Imaging and Spectroscopy
- Session 2: Emerging Opportunities
- Session 3: High-Brightness Technologies for the Next Generation Ultrafast Electron Microscopes
- Session 4: Beam Dynamics and Optics
- Session 5: Synergistic Development and Further Discussion
- Chapter Two: Imaging with Electrons, X-rays, and Microwaves: Some Scattered Thoughts
- Abstract
- 1 Overview of Career; Influences on Research Selection
- 2 From Elmiscope to STEM: Imaging with electrons
- 3 Binary Optical Filters for Bright-Field Electron Microscopy
- 4 Electron Scattering and Fourier Phase Retrieval
- 5 Imaging by X-rays
- 6 Imaging by Synthetic Aperture Radar
- 7 Final Comments
- Contents of Volumes 151-190
- Index
- Edition: 1
- Latest edition
- Volume: 191
- Published: August 21, 2015
- Language: English
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect