
Advances in Imaging and Electron Physics
- 1st Edition, Volume 183 - March 11, 2014
- Imprint: Academic Press
- Editor: Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 8 0 0 2 6 5 - 0
- eBook ISBN:9 7 8 - 0 - 1 2 - 8 0 0 3 1 0 - 7
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The… Read more

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Request a sales quoteAdvances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
- Editor-in-Chief
- Preface
- Future Contributions
- Contributors
- Chapter One. Toward Quantitative Scanning Electron Microscopy
- 1. Introduction
- 2. Low-Voltage Secondary Electron and Backscattered Electron Coefficients
- 3. Secondary Electron Emission
- 4. Monte Carlo Simulation of Backscattered Primary Electrons
- 5. Results of the BSE Coefficient Measurements and Simulations
- 6. Discussion of Backscattering Results
- 7. Results of the Measurements and Calculations of the Secondary Electron Emission Coefficient, δ
- 8. The Monte Carlo Simulation of Secondary Electron Emission
- 9. The Influence of Errors in the Elastic and Inelastic Properties on the Monte Carlo Calculations
- 10. Energy-Dispersive Spectroscopy
- 11. Auger Electron Spectroscopy Experiments in SEM
- 12. Doped Contrast
- 13. Conclusions
- Chapter Two. Logarithmic Wavelets
- 1. Introduction
- 2. Wavelet Origin and Basis
- 3. History of the Logarithmic Image Processing (LIP) Model
- 4. Logarithmic Wavelets
- 5. Logarithmic Wavelet Applications
- 6. Conclusion
- 7. Main Notations
- Chapter Three. 3-D Sparse Representations
- 1. Introduction
- 2. 3-D Wavelets
- 3. 3-D Ridgelets and Beamlets
- 4. First-Generation 3-D Curvelets
- 5. Fast Curvelets
- 6. Sparsity on the Sphere
- 7. 3-D Wavelets on the Ball
- Software
- Contents of Volumes 151-182
- Index
- Color plates
- Edition: 1
- Volume: 183
- Published: March 11, 2014
- No. of pages (Hardback): 254
- No. of pages (eBook): 254
- Imprint: Academic Press
- Language: English
- Hardback ISBN: 9780128002650
- eBook ISBN: 9780128003107
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect