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Advances in Imaging and Electron Physics
- 1st Edition, Volume 186 - October 31, 2014
- Editor: Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 8 0 0 2 6 4 - 3
- eBook ISBN:9 7 8 - 0 - 1 2 - 8 0 0 3 0 7 - 7
Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The… Read more
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Request a sales quoteAdvances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
- Editor-In-Chief
- Preface
- Future Contributions
- Chapter One. Practical Aspects of Transmission Electron Microscopy in Liquid
- 1. Introduction
- 2. Most Frequently Used Systems for Electron Microscopy of Liquid Specimens
- 3. System Design Specifications
- 4. Practical Aspects of Electron Microscopy in Liquid
- 5. Conclusions
- Chapter Two. Linear Canonical Transform
- 1. Introduction
- 2. Definitions of the Linear Canonical Transform
- 3. Properties and Physical Meanings of the Linear Canonical Transform
- 4. Operations Closely Related to the Linear Canonical Transform
- 5. Digital Implementation and Discrete Versions of the Linear Canonical Transform
- 6. Applications of the Linear Canonical Transform in Signal Processing
- 7. Linear Canonical Transform for Electromagnetic Wave Propagation Analysis
- 8. Two-Dimensional Versions of the Linear Canonical Transform
- 9. Conclusion
- Chapter Three. Mechanical, Electrostatic, and Electromagnetic Manipulation of Microobjects and Nanoobjects in Electron Microscopes
- 1. Introduction
- 2. Overview of Forces Acting on a Particle in an Electron Microscope
- 3. Mechanical Manipulation
- 4. Electrostatic Manipulation
- 5. Electromagnetic Manipulation
- 6. Conclusion
- Contents of Volumes 151–185
- Volume 151
- Volume 152
- Volume 153
- Volume 154
- Volume 155
- Volume 156
- Volume 157
- Volume 158
- Volume 159
- Volume 160
- Volume 161
- Volume 162
- Volume 163
- Volume 164
- Volume 165
- Volume 166
- Volume 167
- Volume 168
- Volume 169
- Volume 170
- Volume 171
- Volume 172
- Volume 173
- Volume 174
- Volume 175
- Volume 176
- Volume 177
- Volume 178
- Volume 179
- Volume 180
- Volume 181
- Volume 182
- Volume 183
- Volume 184
- Volume 185
- Index
- Color plate
- No. of pages: 182
- Language: English
- Edition: 1
- Volume: 186
- Published: October 31, 2014
- Imprint: Academic Press
- Hardback ISBN: 9780128002643
- eBook ISBN: 9780128003077
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect